Search results for "Shiyi Xu"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
1	Yi Jin, Yunfu Shen, Junjie Peng, Shiyi Xu, Guangtai Ding, Dongjian Yue, Haihang You	Principles and construction of MSD adder in ternary optical computer.	SCIENCE CHINA Information Sciences	2010	DBLP DOI BibTeX RDF
1	Peng Xu, Shiyi Xu	A Reliability Model for Object-Oriented Software.	Asian Test Symposium	2010	DBLP DOI BibTeX RDF
1	Shiyi Xu, Peng Xu	A Quasi-best Random Testing.	Asian Test Symposium	2010	DBLP DOI BibTeX RDF
1	Xiaoying Hu, Shiyi Xu	A Synthesis Software Reliability Model.	PRDC	2009	DBLP DOI BibTeX RDF
1	Shiyi Xu	Orderly Random Testing for Both Hardware and Software.	PRDC	2008	DBLP DOI BibTeX RDF
1	Shiyi Xu	An Accurate Model of Software Reliability.	PRDC	2007	DBLP DOI BibTeX RDF
1	Shiyi Xu	A New Approach to Improving the Test Effectiveness in Software Testing Using Fault Collapsing.	PRDC	2006	DBLP DOI BibTeX RDF	Software Testing, Mutation Testing, Testing Effectiveness, Fault Equivalence, Fault Dominance
1	Shiyi Xu	High-Order Syndrome Testing for VLSI Circuits.	PRDC	2005	DBLP DOI BibTeX RDF	Syndrome Testing Minterms, Syndrome, Exhaustive Testing
1	Shiyi Xu	Pseudo-Parity Testing with Testable Design.	Asian Test Symposium	2005	DBLP DOI BibTeX RDF
1	Debesh K. Das, Hideo Fujiwara, Yungang Li, Yinghua Min, Shiyi Xu, Yervant Zorian	Design & Test Education in Asia.	IEEE Design & Test of Computers	2004	DBLP BibTeX RDF
1	Shiyi Xu	A Systematic Way of Functional Testing for VLSI Chips.	Asian Test Symposium	2004	DBLP DOI BibTeX RDF	Functional behavior, Standard Input Matrix, Stuck-at-fault, Bridging fault
1	Shiyi Xu	Build-In-Self-Test for Software.	Asian Test Symposium	2003	DBLP DOI BibTeX RDF	Software Testing, Design for Testability, Build-In-Self-Test (BIST)
1	Shiyi Xu, Jianwen Chen	Maximum Distance Testing.	Asian Test Symposium	2002	DBLP DOI BibTeX RDF
1	Shiyi Xu	Non-exhaustive Parity Testing.	Asian Test Symposium	2001	DBLP DOI BibTeX RDF
1	Shiyi Xu, Tukwasibwe Justaf Frank	Forecasting the Efficiency of Test Generation Algorithms for Combinational Circuits.	J. Comput. Sci. Technol.	2000	DBLP DOI BibTeX RDF
1	Shiyi Xu, Wei Cen	Forecasting the efficiency of test generation algorithms for digital circuits.	Asian Test Symposium	2000	DBLP DOI BibTeX RDF	efficiency forecasting, testability parameters, genetic algorithms, genetic algorithms, VLSI, logic testing, integrated circuit testing, sequential circuits, sequential circuits, automatic test pattern generation, ATPG, combinational circuits, combinational circuits, digital circuits, VLSI circuits, digital integrated circuits, test generation algorithms
1	Shiyi Xu	On dependability of computing systems.	J. Comput. Sci. Technol.	1999	DBLP DOI BibTeX RDF
1	Shiyi Xu, Tukwasibwe Justaf Frank	An Evaluation of Test Generation Algorithms for combinational Circuits.	Asian Test Symposium	1999	DBLP DOI BibTeX RDF	Genetic Algorithm, Test Generation, Forecasting, Testability
1	Shiyi Xu, Jianhua Gao	An Efficient Random-like Testing.	Asian Test Symposium	1998	DBLP DOI BibTeX RDF
1	Shiyi Xu, Peter Waignjo, Percy G. Dias, Bole Shi	Testability Prediction for Sequential Circuits Using Neural Network.	Asian Test Symposium	1997	DBLP DOI BibTeX RDF
1	Shiyi Xu, Gercy P. Dias	The methodology of testability prediction for sequential circuits.	J. Comput. Sci. Technol.	1996	DBLP DOI BibTeX RDF
1	Shiyi Xu, Gercy P. Dias	Testability forecasting for sequential circuits.	Asian Test Symposium	1995	DBLP DOI BibTeX RDF	testability forecasting, transitive closure algorithm, number of test patterns, computational complexity, fault diagnosis, logic testing, logic testing, statistical analysis, design for testability, sequential circuits, sequential circuits, logic CAD, fault coverage, regression models, automatic test software, CPU time, test generation algorithms
1	Shiyi Xu, Stephen Y. H. Su	Detecting I/O and Internal Feedback Bridging Faults.	IEEE Trans. Computers	1985	DBLP DOI BibTeX RDF

Publications of "Shiyi Xu" ( http://dblp.L3S.de/Authors/Shiyi_Xu )