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Found 11 publication records. Showing 11 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | M. Bagatin, Simone Gerardin, Alessandro Paccagnella, C. Andreani, G. Gorini, C. D. Frost |
Temperature dependence of neutron-induced soft errors in SRAMs.  |
Microelectronics Reliability  |
2012 |
DBLP DOI BibTeX RDF |
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| 1 | Simone Gerardin, M. Bagatin, Alessandro Paccagnella, G. Cellere, A. Visconti, M. Bonanomi |
Impact of total dose on heavy-ion upsets in floating gate arrays. |
Microelectronics Reliability |
2010 |
DBLP DOI BibTeX RDF |
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| 1 | M. Bagatin, Simone Gerardin, Alessandro Paccagnella, G. Cellere, F. Irom, D. N. Nguyen |
Destructive events in NAND Flash memories irradiated with heavy ions. |
Microelectronics Reliability |
2010 |
DBLP DOI BibTeX RDF |
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| 1 | Davide Appello, Paolo Bernardi, Simone Gerardin, Michelangelo Grosso, Alessandro Paccagnella, Paolo Rech, Matteo Sonza Reorda |
DfT Reuse for Low-Cost Radiation Testing of SoCs: A Case Study. |
VTS |
2009 |
DBLP DOI BibTeX RDF |
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| 1 | Paolo Rech, Simone Gerardin, Alessandro Paccagnella, Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda, Davide Appello |
Evaluating Alpha-induced soft errors in embedded microprocessors. |
IOLTS |
2009 |
DBLP DOI BibTeX RDF |
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| 1 | Niccolò Battezzati, Simone Gerardin, Andrea Manuzzato, Alessandro Paccagnella, Sana Rezgui, Luca Sterpone, Massimo Violante |
On the Evaluation of Radiation-Induced Transient Faults in Flash-Based FPGAs. |
IOLTS |
2008 |
DBLP DOI BibTeX RDF |
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| 1 | J. Martín-Martínez, Simone Gerardin, R. Rodríguez, M. Nafría, X. Aymerich, A. Cester, Alessandro Paccagnella, G. Ghidini |
Lifetime estimation of analog circuits from the electrical characteristics of stressed MOSFETs. |
Microelectronics Reliability |
2007 |
DBLP DOI BibTeX RDF |
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| 1 | Andrea Manuzzato, Paolo Rech, Simone Gerardin, Alessandro Paccagnella, Luca Sterpone, Massimo Violante |
Sensitivity Evaluation of TMR-Hardened Circuits to Multiple SEUs Induced by Alpha Particles in Commercial SRAM-Based FPGAs. |
DFT |
2007 |
DBLP DOI BibTeX RDF |
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| 1 | M. Bagatin, G. Cellere, Simone Gerardin, Alessandro Paccagnella, A. Visconti, S. Beltrami, M. Maccarrone |
Single Event Effects in 1Gbit 90nm NAND Flash Memories under Operating Conditions. |
IOLTS |
2007 |
DBLP DOI BibTeX RDF |
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| 1 | Simone Gerardin, A. Griffoni, A. Cester, Alessandro Paccagnella, G. Ghidini |
Degradation of static and dynamic behavior of CMOS inverters during constant and pulsed voltage stress. |
Microelectronics Reliability |
2006 |
DBLP DOI BibTeX RDF |
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| 1 | Francesca Danesin, Franco Zanon, Simone Gerardin, F. Rampazzo, Gaudenzio Meneghesso, Enrico Zanoni, Alessandro Paccagnella |
Degradation induced by 2-MeV alpha particles on AlGaN/GaN high electron mobility transistors. |
Microelectronics Reliability |
2006 |
DBLP DOI BibTeX RDF |
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