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Venues (Conferences, Journals, ...)
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Found 2 publication records. Showing 2 according to the selection in the facets
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| 1 | E. A. Douglas, C. Y. Chang, B. P. Gila, M. R. Holzworth, K. S. Jones, L. Liu, Jinhyung Kim, Soohwan Jang, G. D. Via, Fan Ren, S. J. Pearton |
Investigation of the effect of temperature during off-state degradation of AlGaN/GaN High Electron Mobility Transistors.  |
Microelectronics Reliability  |
2012 |
DBLP DOI BibTeX RDF |
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| 1 | E. A. Douglas, C. Y. Chang, D. J. Cheney, B. P. Gila, C. F. Lo, Liu Lu, M. R. Holzworth, P. Whiting, K. S. Jones, G. D. Via, Jinhyung Kim, Soohwan Jang, Fan Ren, S. J. Pearton |
AlGaN/GaN High Electron Mobility Transistor degradation under on- and off-state stress.  |
Microelectronics Reliability  |
2011 |
DBLP DOI BibTeX RDF |
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