Search results for "Soumendu Bhattacharya"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
1	Shyam Kumar Devarakond, Shreyas Sen, Soumendu Bhattacharya, Abhijit Chatterjee	Concurrent Device/Specification Cause-Effect Monitoring for Yield Diagnosis Using Alternate Diagnostic Signatures.	IEEE Design & Test of Computers	2012	DBLP DOI BibTeX RDF
1	Aritra Banerjee, Vishwanath Natarajan, Shreyas Sen, Abhijit Chatterjee, Ganesh Srinivasan, Soumendu Bhattacharya	Optimized Multitone Test Stimulus Driven Diagnosis of RF Transceivers Using Model Parameter Estimation.	VLSI Design	2011	DBLP DOI BibTeX RDF
1	Shyam Kumar Devarakond, Shreyas Sen, Soumendu Bhattacharya, Abhijit Chatterjee	Concurrent process model and specification cause-effect monitoring using alternate diagnostic signatures.	VTS	2010	DBLP DOI BibTeX RDF
1	Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhijit Chatterjee	Efficient EVM Testing of Wireless OFDM Transceivers Using Null Carriers.	IEEE Trans. VLSI Syst.	2009	DBLP DOI BibTeX RDF
1	Abhijit Chatterjee, Donghoon Han, Vishwanath Natarajan, Shyam Kumar Devarakond, Shreyas Sen, Hyun Choi, Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhilash Goyal, Deuk Lee, Madhavan Swaminathan	Iterative built-in testing and tuning of mixed-signal/RF systems.	ICCD	2009	DBLP DOI BibTeX RDF
1	Achintya Halder, Soumendu Bhattacharya, Abhijit Chatterjee	System-Level Specification Testing Of Wireless Transceivers.	IEEE Trans. VLSI Syst.	2008	DBLP DOI BibTeX RDF
1	Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhijit Chatterjee	Fast Accurate Tests for Multi-Carrier Transceiver Specifications: EVM and Noise.	VTS	2008	DBLP DOI BibTeX RDF	communication systems, test time, manufacturing testing
1	Donghoon Han, Soumendu Bhattacharya, Abhijit Chatterjee	Low-cost parametric test and diagnosis of RF systems using multi-tone response envelope detection.	IET Computers & Digital Techniques	2007	DBLP BibTeX RDF
1	Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee	Probabilistic Compensation for Digital Filters Using Pervasive Noise-Induced Operator Errors.	VTS	2007	DBLP DOI BibTeX RDF
1	Soumendu Bhattacharya, Abhijit Chatterjee	A DFT Approach for Testing Embedded Systems Using DC Sensors.	IEEE Design & Test of Computers	2006	DBLP DOI BibTeX RDF	computer-aided design, test generation, built-in tests, reliability and testing
1	Donghoon Han, Shalabh Goyal, Soumendu Bhattacharya, Abhijit Chatterjee	Low Cost Parametric Failure Diagnosis of RF Transceivers.	European Test Symposium	2006	DBLP DOI BibTeX RDF
1	Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee	Improving SNR for DSM Linear Systems Using Probabilistic Error Correction and State Restoration: A Comparative Study.	European Test Symposium	2006	DBLP DOI BibTeX RDF
1	Vishwanath Natarajan, Soumendu Bhattacharya, Abhijit Chatterjee	Alternate Electrical Tests for Extracting Mechanical Parameters of MEMS Accelerometer Sensors.	VTS	2006	DBLP DOI BibTeX RDF
1	Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee	Design of Soft Error Resilient Linear Digital Filters Using Checksum-Based Probabilistic Error Correction.	VTS	2006	DBLP DOI BibTeX RDF
1	Soumendu Bhattacharya, Vishwanath Natarajan, Abhijit Chatterjee, Sankar Nair	Efficient DNA Sensing with Fabricated Silicon Nanopores: Diagnosis Methodology and Algorithms.	VLSI Design	2006	DBLP DOI BibTeX RDF
1	Soumendu Bhattacharya, Abhijit Chatterjee	Optimized wafer-probe and assembled package test design for analog circuits.	ACM Trans. Design Autom. Electr. Syst.	2005	DBLP DOI BibTeX RDF	Assembled package, co-optimization, test cost minimization, test generation and co-optimization, wafer-probe, simulation, test, prototype, analog and mixed-signal test
1	Soumendu Bhattacharya, Achintya Halder, Ganesh Srinivasan, Abhijit Chatterjee	Alternate Testing of RF Transceivers Using Optimized Test Stimulus for Accurate Prediction of System Specifications.	J. Electronic Testing	2005	DBLP DOI BibTeX RDF	RF transceivers, alternate test, periodic bitstreams, optimization, behavioral modeling
1	Soumendu Bhattacharya, Rajarajan Senguttuvan, Abhijit Chatterjee	Production test enhancement techniques for MB-OFDM ultra-wide band (UWB) devices: EVM and CCDF.	ITC	2005	DBLP DOI BibTeX RDF
1	Soumendu Bhattacharya, Abhijit Chatterjee	Production Test Methods for Measuring 'Out-of-Band' Interference of Ultra Wide Band (UWB) Devices.	VTS	2005	DBLP DOI BibTeX RDF
1	Achintya Halder, Soumendu Bhattacharya, Ganesh Srinivasan, Abhijit Chatterjee	A System-Level Alternate Test Approach for Specification Test of RF Transceivers in Loopback Mode.	VLSI Design	2005	DBLP DOI BibTeX RDF	System-level test, Loop-back test, wireless transceiver test, Analog and mixed-signal test, RF test, Specification test
1	Donghoon Han, Selim Sermet Akbay, Soumendu Bhattacharya, Abhijit Chatterjee, William R. Eisenstadt	On-Chip Self-Calibration of RF Circuits Using Specification-Driven Built-In Self Test (S-BIST).	IOLTS	2005	DBLP DOI BibTeX RDF
1	Soumendu Bhattacharya, Abhijit Chatterjee	Use of Embedded Sensors for Built-In-Test of RF Circuits.	ITC	2004	DBLP DOI BibTeX RDF
1	Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Abhijit Chatterjee	Test Time Reduction for ACPR Measurement of Wireless Transceivers Using Periodic Bit-Stream Sequences.	DELTA	2004	DBLP DOI BibTeX RDF
1	Soumendu Bhattacharya, Abhijit Chatterjee	A Built-In Loopback Test Methodology for RF Transceiver Circuits Using Embedded Sensor Circuits.	Asian Test Symposium	2004	DBLP DOI BibTeX RDF
1	Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Achintya Halder, Abhijit Chatterjee	System-level Testing of RF Transmitter Specifications Using Optimized Periodic Bitstreams.	VTS	2004	DBLP DOI BibTeX RDF
1	Ganesh Srinivasan, Soumendu Bhattacharya, Sasikumar Cherubal, Abhijit Chatterjee	Efficient Test Strategy for TDMA Power Amplifiers Using Transient Current Measurements: Uses and Benefit.	DATE	2004	DBLP DOI BibTeX RDF
1	Achintya Halder, Soumendu Bhattacharya, Abhijit Chatterjee	Automatic Multitone Alternate Test Generation For RF Circuits Using Behavioral Models.	ITC	2003	DBLP DOI BibTeX RDF
1	Soumendu Bhattacharya, Abhijit Chatterjee	High Coverage Analog Wafer-Probe Test Design and Co-optimization with Assembled-Package Test to Minimize Overall Test Cost.	VTS	2003	DBLP DOI BibTeX RDF
1	Soumendu Bhattacharya, Abhijit Chatterjee	Constrained Specification-Based Test Stimulus Generation for Analog Circuits Using Nonlinear Performance Prediction Models.	DELTA	2002	DBLP DOI BibTeX RDF	Wafer-probe Test, Assembled Package Test, Multivariate Adaptive Regression Splines, Genetic Algorithm
1	Abhijit Chatterjee, P. P. Das, Soumendu Bhattacharya	Visualization in linear programming using parallel coordinates.	Pattern Recognition	1993	DBLP DOI BibTeX RDF

Publications of "Soumendu Bhattacharya" ( http://dblp.L3S.de/Authors/Soumendu_Bhattacharya )