Search results for "Srikanth Venkataraman"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
1	Srikanth Venkataraman, Nagesh Tamarapalli	Tutorial T3: DFM, DFT, Silicon Debug and Diagnosis - The Loop to Ensure Product Yield.	VLSI Design	2012	DBLP DOI BibTeX RDF
1	Enamul Amyeen, Andal Jayalakshmi, Srikanth Venkataraman, Sundar V. Pathy, Ewe C. Tan	Logic BIST silicon debug and volume diagnosis methodology.	ITC	2011	DBLP DOI BibTeX RDF
1	Dongok Kim, Irith Pomeranz, Enamul Amyeen, Srikanth Venkataraman	Defect diagnosis based on DFM guidelines.	VTS	2010	DBLP DOI BibTeX RDF
1	Enamul Amyeen, Srikanth Venkataraman, Mun Wai Mak	Microprocessor system failures debug and fault isolation methodology.	ITC	2009	DBLP DOI BibTeX RDF
1	Richard McLaughlin, Srikanth Venkataraman, Carlston Lim	Automated Debug of Speed Path Failures Using Functional Tests.	VTS	2009	DBLP DOI BibTeX RDF
1	King Leong Lee, Nadir Z. Basturkmen, Srikanth Venkataraman	Diagnosis of Scan Clock Failures.	VTS	2008	DBLP DOI BibTeX RDF	scan clock, diagnosis, scan chain
1	Srikanth Venkataraman, Nagesh Tamarapalli	DFM / DFT / SiliconDebug / Diagnosis.	VLSI Design	2008	DBLP DOI BibTeX RDF
1	Irith Pomeranz, Sudhakar M. Reddy, Srikanth Venkataraman	z-Diagnosis: A Framework for Diagnostic Fault Simulation and Test Generation Utilizing Subsets of Outputs.	IEEE Trans. on CAD of Integrated Circuits and Systems	2007	DBLP DOI BibTeX RDF
1	Srikanth Venkataraman, Nagesh Nagapalli, Lech Józwiak	Quality Driven Manufacturing and SOC Designs.	ISQED	2007	DBLP DOI BibTeX RDF
1	Srikanth Venkataraman	DFM, DFY, Debug and Diagnosis: The Loop to Ensure Yield.	ISQED	2007	DBLP DOI BibTeX RDF
1	Dongok Kim, Enamul Amyeen, Srikanth Venkataraman, Irith Pomeranz, Swagato Basumallick, Berni Landau	Testing for systematic defects based on DFM guidelines.	ITC	2007	DBLP DOI BibTeX RDF
1	Srikanth Venkataraman, Ruchir Puri, Steve Griffith, Ankush Oberai, Robert Madge, Greg Yeric, Walter Ng, Yervant Zorian	Making Manufacturing Work For You.	DAC	2007	DBLP DOI BibTeX RDF
1	Vishnu C. Vimjam, Enamul Amyeen, Ruifeng Guo, Srikanth Venkataraman, Michael S. Hsiao, Kai Yang	Using Scan-Dump Values to Improve Functional-Diagnosis Methodology.	VTS	2007	DBLP DOI BibTeX RDF
1	Ruifeng Guo, Srikanth Venkataraman	An algorithmic technique for diagnosis of faulty scan chains.	IEEE Trans. on CAD of Integrated Circuits and Systems	2006	DBLP DOI BibTeX RDF
1	Yu-Shen Yang, Andreas G. Veneris, Paul J. Thadikaran, Srikanth Venkataraman	Extraction error modeling and automated model debugging in high-performance custom designs.	IEEE Trans. VLSI Syst.	2006	DBLP DOI BibTeX RDF
1	Enamul Amyeen, Debashis Nayak, Srikanth Venkataraman	Improving Precision Using Mixed-level Fault Diagnosis.	ITC	2006	DBLP DOI BibTeX RDF
1	Bharath Seshadri, Irith Pomeranz, Srikanth Venkataraman, Enamul Amyeen, Sudhakar M. Reddy	Dominance Based Analysis for Large Volume Production Fail Diagnosis.	VTS	2006	DBLP DOI BibTeX RDF
1	Bharath Seshadri, Xiaoming Yu, Srikanth Venkataraman	Accelerating Diagnostic Fault Simulation Using Z-diagnosis and Concurrent Equivalence Identification.	VTS	2006	DBLP DOI BibTeX RDF
1	Ruifeng Guo, Subhasish Mitra, Enamul Amyeen, Jinkyu Lee, Srihari Sivaraj, Srikanth Venkataraman	Evaluation of Test Metrics: Stuck-at, Bridge Coverage Estimate and Gate Exhaustive.	VTS	2006	DBLP DOI BibTeX RDF
1	David Abercrombie, Bernd Koenemann, Nagesh Tamarapalli, Srikanth Venkataraman	DFM, DFT, Silicon Debug and Diagnosis - The Loop to Ensure Product Yield.	VLSI Design	2006	DBLP DOI BibTeX RDF
1	Srikanth Venkataraman	Achieving higher yield through diagnosis?	ITC	2005	DBLP DOI BibTeX RDF
1	Zoran Stanojevic, Ruifeng Guo, Subhasish Mitra, Srikanth Venkataraman	Enabling yield analysis with X-compact.	ITC	2005	DBLP DOI BibTeX RDF
1	Irith Pomeranz, Srikanth Venkataraman, Sudhakar M. Reddy	Fault Diagnosis and Fault Model Aliasing.	ISVLSI	2005	DBLP DOI BibTeX RDF
1	Yu-Shen Yang, Andreas G. Veneris, Paul J. Thadikaran, Srikanth Venkataraman	Extraction Error Modeling and Automated Model Debugging in High-Performance Low Power Custom Designs.	DATE	2005	DBLP DOI BibTeX RDF
1	Enamul Amyeen, Srikanth Venkataraman, Ajay Ojha, Sangbong Lee	Evaluation of the Quality of N-Detect Scan ATPG Patterns on a Processor.	ITC	2004	DBLP DOI BibTeX RDF
1	Irith Pomeranz, Srikanth Venkataraman, Sudhakar M. Reddy	Z-DFD: Design-for-Diagnosability Based on the Concept of Z-Detection.	ITC	2004	DBLP DOI BibTeX RDF
1	Srikanth Venkataraman	Diagnosis meets Physical Failure Analysis: What is needed to succeed?.	ITC	2004	DBLP DOI BibTeX RDF
1	Srikanth Venkataraman, Srihari Sivaraj, Enamul Amyeen, Sangbong Lee, Ajay Ojha, Ruifeng Guo	An Experimental Study of N-Detect Scan ATPG Patterns on a Processor.	VTS	2004	DBLP DOI BibTeX RDF
1	Debashis Nayak, Srikanth Venkataraman, Paul J. Thadikaran	Razor: A Tool for Post-Silicon Scan ATPG Pattern Debug and Its Application.	VTS	2004	DBLP DOI BibTeX RDF
1	Irith Pomeranz, Srikanth Venkataraman, Sudhakar M. Reddy, Enamul Amyeen	Defect Diagnosis Based on Pattern-Dependent Stuck-At Faults.	VLSI Design	2004	DBLP DOI BibTeX RDF
1	Irith Pomeranz, Srikanth Venkataraman, Sudhakar M. Reddy, Bharath Seshadri	Z-Sets and Z-Detections: Circuit Characteristics that Simplify Fault Diagnosis.	DATE	2004	DBLP DOI BibTeX RDF
1	Xiaoming Yu, Enamul Amyeen, Srikanth Venkataraman, Ruifeng Guo, Irith Pomeranz	Concurrent Execution of Diagnostic Fault Simulation and Equivalence Identification During Diagnostic Test Generation.	VTS	2003	DBLP DOI BibTeX RDF
1	Ismed Hartanto, Srikanth Venkataraman, W. Kent Fuchs, Elizabeth M. Rudnick, Janak H. Patel, Sreejit Chakravarty	Diagnostic simulation of stuck-at faults in sequential circuits using compact lists.	ACM Trans. Design Autom. Electr. Syst.	2001	DBLP DOI BibTeX RDF	stuck-at fault diagnosis, Fault simulation
1	Srikanth Venkataraman, Scott Brady Drummonds	Poirot: Applications of a Logic Fault Diagnosis Tool.	IEEE Design & Test of Computers	2001	DBLP DOI BibTeX RDF
1	Ruifeng Guo, Srikanth Venkataraman	A technique for fault diagnosis of defects in scan chains.	ITC	2001	DBLP DOI BibTeX RDF
1	Ramesh C. Tekumalla, Srikanth Venkataraman, Jayabrata Ghosh-Dastidar	On Diagnosing Path Delay Faults in an At-Speed Environment.	VTS	2001	DBLP DOI BibTeX RDF
1	Srikanth Venkataraman, Scott Brady Drummonds	POIROT: a logic fault diagnosis tool and its applications.	ITC	2000	DBLP DOI BibTeX RDF
1	Srikanth Venkataraman, Scott Brady Drummonds	A Technique for Logic Fault Diagnosis of Interconnect Open Defects.	VTS	2000	DBLP DOI BibTeX RDF	Diagnosis and Debugging, Logic Fault Diagnosis, Interconnect Open Defects, Fault Modeling and Simulation, Dynamic Diagnosis
1	Andreas G. Veneris, Ibrahim N. Hajj, Srikanth Venkataraman, W. Kent Fuchs	Multiple Design Error Diagnosis and Correction in Digital VLSI Circuits.	VTS	1999	DBLP DOI BibTeX RDF
1	Srikanth Venkataraman, W. Kent Fuchs, Janak H. Patel	Diagnostic Simulation of Sequential Circuits Using Fault Sampling.	VLSI Design	1998	DBLP DOI BibTeX RDF	Diagnostic fault simulation, Sampling, Diagnosis, Sequential circuits
1	Srikanth Venkataraman, W. Kent Fuchs	Diagnosis of Bridging Faults in Sequential Circuits Using Adaptive Simulation, State Storage, and Path-Tracing.	ITC	1997	DBLP DOI BibTeX RDF
1	Srikanth Venkataraman, W. Kent Fuchs	Distributed Diagnostic Simulation of Stuck-At Faults in Sequential Circuits.	VLSI Design	1997	DBLP DOI BibTeX RDF
1	Srikanth Venkataraman, W. Kent Fuchs	A deductive technique for diagnosis of bridging faults.	ICCAD	1997	DBLP DOI BibTeX RDF	Diagnosis, Bridging faults, Deduction
1	Sreejit Chakravarty, Yiming Gong, Srikanth Venkataraman	Diagnostic simulation of stuck-at faults in combinational circuits.	J. Electronic Testing	1996	DBLP DOI BibTeX RDF	diagnostic power, diagnostic simulation, diagnosis, equivalence classes, diagnostic resolution
1	Dong Xiang, Srikanth Venkataraman, W. Kent Fuchs, Janak H. Patel	Partial Scan Design Based on Circuit State Information.	DAC	1996	DBLP DOI BibTeX RDF
1	Srikanth Venkataraman, Ismed Hartanto, W. Kent Fuchs	Dynamic diagnosis of sequential circuits based on stuck-at faults.	VTS	1996	DBLP DOI BibTeX RDF	dynamic diagnosis, stuck-at fault simulation, cause-effect analysis, effect-cause analysis, error propagation back-trace, fault diagnosis, logic testing, sequential circuits, synchronous sequential circuit, matching algorithm
1	Sybille Hellebrand, Janusz Rajski, Steffen Tarnick, Srikanth Venkataraman, Bernard Courtois	Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers.	IEEE Trans. Computers	1995	DBLP DOI BibTeX RDF
1	Srikanth Venkataraman, Ismed Hartanto, W. Kent Fuchs, Elizabeth M. Rudnick, Sreejit Chakravarty, Janak H. Patel	Rapid Diagnostic Fault Simulation of Stuck-at Faults in Sequential Circuits Using Compact Lists.	DAC	1995	DBLP DOI BibTeX RDF

Publications of "Srikanth Venkataraman" ( http://dblp.L3S.de/Authors/Srikanth_Venkataraman )