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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
The graphs summarize 32 occurrences of 28 keywords
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Results
Found 31 publication records. Showing 31 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Tung-Hua Yeh, Sying-Jyan Wang |
Power-Aware High-Level Synthesis With Clock Skew Management.  |
IEEE Trans. VLSI Syst.  |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Tung-Hua Yeh, Sying-Jyan Wang |
Thermal Safe High Level Test Synthesis for Hierarchical Testability.  |
Asian Test Symposium  |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Sying-Jyan Wang, Tung-Hua Yeh |
High-Level Test Synthesis With Hierarchical Test Generation for Delay-Fault Testability.  |
IEEE Trans. on CAD of Integrated Circuits and Systems  |
2009 |
DBLP DOI BibTeX RDF |
|
| 1 | Sying-Jyan Wang, Katherine Shu-Min Li, Shih-Cheng Chen, Huai-Yan Shiu, Yun-Lung Chu |
Scan-Chain Partition for High Test-Data Compressibility and Low Shift Power Under Routing Constraint.  |
IEEE Trans. on CAD of Integrated Circuits and Systems  |
2009 |
DBLP DOI BibTeX RDF |
|
| 1 | Sying-Jyan Wang, Kuo-Lin Fu, Katherine Shu-Min Li |
Low Peak Power ATPG for n-Detection Test.  |
ISCAS  |
2009 |
DBLP DOI BibTeX RDF |
|
| 1 | Katherine Shu-Min Li, Ming-Hua Hsieh, Sying-Jyan Wang |
Level Converting Scan Flip-flops.  |
ISCAS  |
2009 |
DBLP DOI BibTeX RDF |
|
| 1 | Sying-Jyan Wang, Kuo-Lin Peng, Kuang-Cyun Hsiao, Katherine Shu-Min Li |
Layout-aware scan chain reorder for launch-off-shift transition test coverage.  |
ACM Trans. Design Autom. Electr. Syst.  |
2008 |
DBLP DOI BibTeX RDF |
scan chain ordering, test generation, transition faults, Scan test |
| 1 | Po-Chang Tsai, Sying-Jyan Wang |
Multi-mode-segmented scan architecture with layout-aware scan chain routing for test data and test time reduction.  |
IET Computers & Digital Techniques  |
2008 |
DBLP DOI BibTeX RDF |
|
| 1 | Sying-Jyan Wang, Shih-Cheng Chen, Katherine Shu-Min Li |
Design and analysis of skewed-distribution scan chain partition for improved test data compression.  |
ISCAS  |
2008 |
DBLP DOI BibTeX RDF |
|
| 1 | Po-Chang Tsai, Sying-Jyan Wang, Ching-Hung Lin, Tung-Hua Yeh |
Test Data Compression for Minimum Test Application Time.  |
J. Inf. Sci. Eng.  |
2007 |
DBLP BibTeX RDF |
|
| 1 | Sying-Jyan Wang, Tung-Hua Yeh |
High-level test synthesis for delay fault testability.  |
DATE  |
2007 |
DBLP DOI BibTeX RDF |
|
| 1 | Sying-Jyan Wang, Yan-Ting Chen, Katherine Shu-Min Li |
Low Capture Power Test Generation for Launch-off-Capture Transition Test Based on Don't-Care Filling.  |
ISCAS  |
2007 |
DBLP DOI BibTeX RDF |
|
| 1 | Yu-Hsuan Fu, Sying-Jyan Wang |
Test Data Compression with Partial LFSR-Reseeding.  |
Asian Test Symposium  |
2005 |
DBLP DOI BibTeX RDF |
|
| 1 | Mingchen Wen, Sying-Jyan Wang, Yen-Nan Lin |
Low power parallel multiplier with column bypassing.  |
ISCAS  |
2005 |
DBLP DOI BibTeX RDF |
|
| 1 | Nan-Cheng Lai, Sying-Jyan Wang, Yu-Hsuan Fu |
Low Power BIST with Smoother and Scan-Chain Reorder .  |
Asian Test Symposium  |
2004 |
DBLP DOI BibTeX RDF |
|
| 1 | Yu-Lung Hsu, Sying-Jyan Wang |
Retiming-based logic synthesis for low-power.  |
ISLPED  |
2002 |
DBLP DOI BibTeX RDF |
switching actvity, low-power, logic design, retiming |
| 1 | Nan-Cheng Li, Sying-Jyan Wang |
A Reseeding Technique for LFSR-Based BIST Applications.  |
Asian Test Symposium  |
2002 |
DBLP DOI BibTeX RDF |
Reseedling, LFST, BIST, Test Pattern Generator, Pseudo-Random Testing |
| 1 | Sying-Jyan Wang |
Distributed Diagnosis in Multistage Interconnection Networks.  |
J. Parallel Distrib. Comput.  |
2001 |
DBLP DOI BibTeX RDF |
|
| 1 | Sying-Jyan Wang, Sheng-Nan Chiou |
Generating Efficient Tests for Continuous Scan.  |
DAC  |
2001 |
DBLP DOI BibTeX RDF |
|
| 1 | Sying-Jyan Wang, Chia-Chun Lien |
Testability Improvement by Branch Point Control for Conditional Staements With Multiple Branches.  |
J. Inf. Sci. Eng.  |
2000 |
DBLP BibTeX RDF |
|
| 1 | Sying-Jyan Wang, Chen-Jung Wei |
Efficient built-in self-test algorithm for memory.  |
Asian Test Symposium  |
2000 |
DBLP DOI BibTeX RDF |
built-in self-test algorithm, built-in self test, BIST, DRAM, test patterns, pseudorandom testing, coupling faults, DRAM chips |
| 1 | Sying-Jyan Wang, Chao-Neng Huang |
Testing and Diagnosis of Interconnect Structures in FPGAs.  |
Asian Test Symposium  |
1998 |
DBLP DOI BibTeX RDF |
|
| 1 | Sying-Jyan Wang |
Distributed Routing in a Fault-Tolerant Multistage Interconnection Network.  |
Inf. Process. Lett.  |
1997 |
DBLP DOI BibTeX RDF |
|
| 1 | Sying-Jyan Wang, Tsi-Ming Tsai |
Test and diagnosis of fault logic blocks in FPGAs.  |
ICCAD  |
1997 |
DBLP DOI BibTeX RDF |
FPGA, Test, Diagnosis, BIST |
| 1 | Sying-Jyan Wang |
Load-Balancing in Multistage Interconnection Networks under Multiple-Pass Routing.  |
J. Parallel Distrib. Comput.  |
1996 |
DBLP DOI BibTeX RDF |
|
| 1 | Po-Ching Hsu, Sying-Jyan Wang |
Testing And Diagnosis Of Board Interconnects In Microprocessor-Based Systems.  |
Asian Test Symposium  |
1996 |
DBLP DOI BibTeX RDF |
multiple-board system, bus emulator, wiring interconnect, testing, fault detection, diagnosis, microprocessor, printed circuit board, printed circuit testing, hierarchical testing |
| 1 | Sying-Jyan Wang, Niraj K. Jha |
Algorithm-Based Fault Tolerance for FFT Networks.  |
IEEE Trans. Computers  |
1994 |
DBLP DOI BibTeX RDF |
FFT networks, system-level fault tolerance technique, reliability, fault tolerant computing, fast Fourier transforms, high throughput, algorithm-based fault tolerance |
| 1 | Sying-Jyan Wang |
Synthesis of Sequential Machines with Reduced Testing Cost.  |
EDAC-ETC-EUROASIC  |
1994 |
DBLP BibTeX RDF |
|
| 1 | Niraj K. Jha, Sying-Jyan Wang |
Design and synthesis of self-checking VLSI circuits.  |
IEEE Trans. on CAD of Integrated Circuits and Systems  |
1993 |
DBLP DOI BibTeX RDF |
|
| 1 | Niraj K. Jha, Sying-Jyan Wang, Phillip C. Gripka |
Multiple Input Bridging Fault Detection in CMOS Sequential Circuits.  |
ICCD  |
1992 |
DBLP BibTeX RDF |
|
| 1 | Niraj K. Jha, Sying-Jyan Wang |
Design and Synthesis of Self-Checking VLSI Circuits and Systems.  |
ICCD  |
1991 |
DBLP BibTeX RDF |
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