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Publications of "Takeo Hattori" ( http://dblp.L3S.de/Authors/Takeo_Hattori )

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Publication years (Num. hits)
2007 (1) 2008 (1) 2010 (2) 2011 (1) 2012 (1)
Publication types (Num. hits)
article(6)
Venues (Conferences, Journals, ...)
Microelectronics Reliability(6)
Authors
Takeo Hattori(6) Hiroshi Iwai(5) Kazuo Tsutsui(5) Kuniyuki Kakushima(5) Nobuyuki Sugii(5) Parhat Ahmet(5) Hiroshi Nohira(3) A. Nishiyama(2) Kenji Natori(2) Kiichi Tachi(2) A. Srivastava(1) C. Dou(1) Chandan Kumar Sarkar(1) D. Zade(1) J. Song(1) K. Okamoto(1) More (+10 of total 25)
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Found 6 publication records. Showing 6 according to the selection in the facets
Hits ?▲ Authors Title Venue Year Link Author keywords
1C. Dou, Kuniyuki Kakushima, Parhat Ahmet, Kazuo Tsutsui, A. Nishiyama, Nobuyuki Sugii, Kenji Natori, Takeo Hattori, Hiroshi Iwai Resistive switching behavior of a CeO2 based ReRAM cell incorporated with Si buffer layer. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1D. Zade, Soshi Sato, Kuniyuki Kakushima, A. Srivastava, Parhat Ahmet, Kazuo Tsutsui, A. Nishiyama, Nobuyuki Sugii, Kenji Natori, Takeo Hattori, Chandan Kumar Sarkar, Hiroshi Iwai Effects of La2O3 incorporation in HfO2 gated nMOSFETs on low-frequency noise. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Kuniyuki Kakushima, Kiichi Tachi, Parhat Ahmet, Kazuo Tsutsui, Nobuyuki Sugii, Takeo Hattori, Hiroshi Iwai Advantage of further scaling in gate dielectrics below 0.5 nm of equivalent oxide thickness with La2O3 gate dielectrics. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Kuniyuki Kakushima, K. Okamoto, T. Koyanagi, M. Kouda, Kiichi Tachi, T. Kawanago, J. Song, Parhat Ahmet, Hiroshi Nohira, Kazuo Tsutsui, Nobuyuki Sugii, Takeo Hattori, Hiroshi Iwai SrO capping effect for La2O3/Ce-silicate gate dielectrics. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Parhat Ahmet, Kentaro Nakagawa, Kuniyuki Kakushima, Hiroshi Nohira, Kazuo Tsutsui, Nobuyuki Sugii, Takeo Hattori, Hiroshi Iwai Electrical characteristics of MOSFETs with La2O3/Y2O3 gate stack. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Takeo Hattori, Hiroshi Nohira, S. Shinagawa, M. Hori, M. Kase, T. Maruizumi Angle-resolved photoelectron spectroscopy on gate insulators. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
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