Search results for "Test Data Compression"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
3	Jianhua Feng, Guoliang Li	A Test Data Compression Method for System-on-a-Chip.	DELTA	2008	DBLP DOI BibTeX RDF	FDR code, Hybrid Run-length code, MFDR code, Test data compression
3	Xrysovalantis Kavousianos, Emmanouil Kalligeros, Dimitris Nikolos	Optimal Selective Huffman Coding for Test-Data Compression.	IEEE Trans. Computers	2007	DBLP DOI BibTeX RDF	Embedded Testing Techniques, Selective Huffman Coding, Test-Data Compression, IP Cores
3	Irith Pomeranz, Sudhakar M. Reddy	On test data compression and n-detection test sets.	DAC	2003	DBLP DOI BibTeX RDF	test generation, test data compression, n-detection test sets
3	Seiji Kajihara, Kenjiro Taniguchi, Irith Pomeranz, Sudhakar M. Reddy	Test Data Compression Using Don't-Care Identification and Statistical Encoding.	DELTA	2002	DBLP DOI BibTeX RDF	Statistical Encoding, Don't Care Identification, Huffman's algorithm, Test Data Compression
2	Dongsoo Lee, Kaushik Roy	Viterbi-Based Efficient Test Data Compression.	European Test Symposium	2011	DBLP DOI BibTeX RDF	On-Chip Decompressor, Scalability, Logic Test, Test Data Compression, Low-Power Test
2	Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer	Reduced ATE Interface for High Test Data Compression.	European Test Symposium	2011	DBLP DOI BibTeX RDF	channel bandwidth management, embedded deterministic test, test interface, tri-modal compression, test data compression, scan-based designs
2	Usha S. Mehla, Kankar S. Dasgupta, Nirnjan M. Devashrayee	Hamming Distance Based Reordering and Columnwise Bit Stuffing with Difference Vector: A Better Scheme for Test Data Compression with Run Length Based Codes.	VLSI Design	2010	DBLP DOI BibTeX RDF	Golomb Codes, Bit Stuffing, Difference Vector, Hamming Distance, Test Data Compression, Run Length Codes
2	Maoxiang Yi, Huaguo Liang, Kaihua Zhan, Cuiyun Jiang	Optimal LFSR-Coding Test Data Compression Based on Test Cube Dividing.	CSE	2009	DBLP DOI BibTeX RDF
2	Xrysovalantis Kavousianos, Emmanouil Kalligeros, Dimitris Nikolos	Test Data Compression Based on Variable-to-Variable Huffman Encoding With Codeword Reusability.	IEEE Trans. on CAD of Integrated Circuits and Systems	2008	DBLP DOI BibTeX RDF
2	Jun Ma	A Test Data Compression Scheme for Reducing Power Based on OLELC and NBET.	ICIC	2008	DBLP DOI BibTeX RDF	OLEL, Neighboring Bit-Wise Exclusive-or Transform(OCNBET), Data Compression
2	Kanad Basu, Prabhat Mishra	A novel test-data compression technique using application-aware bitmask and dictionary selection methods.	ACM Great Lakes Symposium on VLSI	2008	DBLP DOI BibTeX RDF	compression, test data, decompression
2	Vasileios Tenentes, Xrysovalantis Kavousianos, Emmanouil Kalligeros	State Skip LFSRs: Bridging the Gap between Test Data Compression and Test Set Embedding for IP Cores.	DATE	2008	DBLP DOI BibTeX RDF
2	Sying-Jyan Wang, Shih-Cheng Chen, Katherine Shu-Min Li	Design and analysis of skewed-distribution scan chain partition for improved test data compression.	ISCAS	2008	DBLP DOI BibTeX RDF
2	Jia Li, Xiao Liu, Yubin Zhang, Yu Hu, Xiaowei Li, Qiang Xu	On capture power-aware test data compression for scan-based testing.	ICCAD	2008	DBLP DOI BibTeX RDF
2	Nabil Badereddine, Zhanglei Wang, Patrick Girard, Krishnendu Chakrabarty, Arnaud Virazel, Serge Pravossoudovitch, Christian Landrault	A Selective Scan Slice Encoding Technique for Test Data Volume and Test Power Reduction.	J. Electronic Testing	2008	DBLP DOI BibTeX RDF	DfT, Scan, Test data compression, Low power testing
2	Ozgur Sinanoglu	Improving the Effectiveness of Combinational Decompressors Through Judicious Partitioning of Scan Cells.	J. Electronic Testing	2008	DBLP DOI BibTeX RDF	Combinational decompressors, Scan cell partitioning, Test data compression, Scan-based testing
2	Xrysovalantis Kavousianos, Emmanouil Kalligeros, Dimitris Nikolos	Multilevel Huffman Coding: An Efficient Test-Data Compression Method for IP Cores.	IEEE Trans. on CAD of Integrated Circuits and Systems	2007	DBLP DOI BibTeX RDF
2	Kedarnath J. Balakrishnan, Nur A. Touba	Relationship Between Entropy and Test Data Compression.	IEEE Trans. on CAD of Integrated Circuits and Systems	2007	DBLP DOI BibTeX RDF
2	S.-P. Lin, C.-L. Lee, J.-E. Chen, J.-J. Chen, K.-L. Luo, W.-C. Wu	A Multilayer Data Copy Test Data Compression Scheme for Reducing Shifting-in Power for Multiple Scan Design.	IEEE Trans. VLSI Syst.	2007	DBLP DOI BibTeX RDF
2	Teng Lin, Jianhua Feng, Yangyuan Wang	A New Test Data Compression Scheme for Multi-scan Designs.	ISVLSI	2007	DBLP DOI BibTeX RDF
2	Julien Dalmasso, Marie-Lise Flottes, Bruno Rouzeyre	Test data compression and TAM design.	VLSI-SoC	2007	DBLP DOI BibTeX RDF
2	Wenfa Zhan, Huaguo Liang, Feng Shi, Zhengfeng Huang	A Novel Collaborative Scheme of Test Data Compression Based on Fixed-Plus-variable-Length Coding.	CSCWD	2007	DBLP DOI BibTeX RDF
2	Chandan Giri, B. Mallikarjuna Rao, Santanu Chattopadhyay	Test Data Compression by Spilt-VIHC (SVIHC).	ICCTA	2007	DBLP DOI BibTeX RDF
2	Erik Larsson, Jon Persson	An Architecture for Combined Test Data Compression and Abort-on-Fail Test.	ASP-DAC	2007	DBLP DOI BibTeX RDF
2	Hao Fang, Chenguang Tong, Xu Cheng	RunBasedReordering: A Novel Approach for Test Data Compression and Scan Power.	ASP-DAC	2007	DBLP DOI BibTeX RDF
2	Chandan Giri, Santanu Chattopadhyay	Reducing Test-bus Power Consumption in Huffman Coding Based Test Data Compression for SOCs.	ISCAS	2007	DBLP DOI BibTeX RDF
2	Hao Fang, Chenguang Tong, Bo Yao, Xiaodi Song, Xu Cheng	CacheCompress: a novel approach for test data compression with cache for IP embedded cores.	ICCAD	2007	DBLP DOI BibTeX RDF
2	Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Arun Gunda	Systematic Scan Reconfiguration.	ASP-DAC	2007	DBLP DOI BibTeX RDF	systematic scan reconfiguration, test data compression technique, single-stuck fault test sets, transition fault test sets, scan chains
2	Sunghoon Chun, YongJoon Kim, Jung-Been Im, Sungho Kang	MICRO: a new hybrid test data compression/decompression scheme.	IEEE Trans. VLSI Syst.	2006	DBLP DOI BibTeX RDF
2	Julien Dalmasso, Marie-Lise Flottes, Bruno Rouzeyre	Fitting ATE Channels with Scan Chains: a Comparison between a Test Data Compression Technique and Serial Loading of Scan Chains.	DELTA	2006	DBLP DOI BibTeX RDF
2	Xrysovalantis Kavousianos, Emmanouil Kalligeros, Dimitris Nikolos	Efficient test-data compression for IP cores using multilevel Huffman coding.	DATE	2006	DBLP DOI BibTeX RDF
2	Terumine Hayashi, Haruna Yoshioka, Tsuyoshi Shinogi, Hidehiko Kita, Haruhiko Takase	On Test Data Compression Using Selective Don't-Care Identification.	J. Comput. Sci. Technol.	2005	DBLP DOI BibTeX RDF	multiple scan structure, dont-care identification, test data compression, test cost reduction
2	Nilanjan Mukherjee	Improving Test Quality Using Test Data Compression.	Asian Test Symposium	2005	DBLP DOI BibTeX RDF
2	Anshuman Chandra, Krishnendu Chakrabarty	Analysis of Test Application Time for Test Data Compression Methods Based on Compression Codes.	J. Electronic Testing	2004	DBLP DOI BibTeX RDF	decompression architecture, precomputed test sets, system-on-a-chip testing, test set encoding, variable-to-variable-length codes, automatic test equipment (ATE), testing time, embedded core testing
2	Xiaoyun Sun, Larry L. Kinney, Bapiraju Vinnakota	Combining dictionary coding and LFSR reseeding for test data compression.	DAC	2004	DBLP DOI BibTeX RDF	built-In self test, VLSI test
2	Jinkyu Lee, Nur A. Touba	Low Power Test Data Compression Based on LFSR Reseeding.	ICCD	2004	DBLP DOI BibTeX RDF
2	Lei Li, Krishnendu Chakrabarty, Nur A. Touba	Test data compression using dictionaries with selective entries and fixed-length indices.	ACM Trans. Design Autom. Electr. Syst.	2003	DBLP DOI BibTeX RDF	reduced pin-count testing, SoC testing, test application time, Embedded core testing, test data volume
2	Anshuman Chandra, Krishnendu Chakrabarty	Test Data Compression and Test Resource Partitioning for System-on-a-Chip Using Frequency-Directed Run-Length (FDR) Codes.	IEEE Trans. Computers	2003	DBLP DOI BibTeX RDF	decompression architecture, precomputed test sets, test set encoding, system-on-a-chip test, variable-to-variable-length codes, Automatic test equipment (ATE), embedded core testing
2	Irith Pomeranz, Sudhakar M. Reddy	Test data compression based on input-output dependence.	IEEE Trans. on CAD of Integrated Circuits and Systems	2003	DBLP DOI BibTeX RDF
2	Sungbae Hwang, Jacob A. Abraham	Test data compression and test time reduction using an embedded microprocessor.	IEEE Trans. VLSI Syst.	2003	DBLP DOI BibTeX RDF
2	Lei Li, Krishnendu Chakrabarty	Test Data Compression Using Dictionaries with Fixed-Length Indices.	VTS	2003	DBLP DOI BibTeX RDF
2	Paul Theo Gonciari, Bashir M. Al-Hashimi, Nicola Nicolici	Test Data Compression: The System Integrator's Perspective.	DATE	2003	DBLP DOI BibTeX RDF
2	Vikram Iyengar, Anshuman Chandra, Sharon Schweizer, Krishnendu Chakrabarty	A Unified Approach for SOC Testing Using Test Data Compression and TAM Optimization.	DATE	2003	DBLP DOI BibTeX RDF
2	Vikram Iyengar, Anshuman Chandra	A Uni.ed SOC Test Approach Based on Test Data Compression and TAM Design.	DFT	2003	DBLP DOI BibTeX RDF
2	Anshuman Chandra, Krishnendu Chakrabarty	Low-power scan testing and test data compression forsystem-on-a-chip.	IEEE Trans. on CAD of Integrated Circuits and Systems	2002	DBLP DOI BibTeX RDF
2	Huaguo Liang, Sybille Hellebrand, Hans-Joachim Wunderlich	Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST.	J. Electronic Testing	2002	DBLP DOI BibTeX RDF	store and generate schemes, BIST, test data compression, deterministic BIST
2	Seiji Kajihara, Kenjiro Taniguchi, Kohei Miyase, Irith Pomeranz, Sudhakar M. Reddy	Test Data Compression Using Don?t-Care Identification and Statistical Encoding.	Asian Test Symposium	2002	DBLP DOI BibTeX RDF	don´t care identification, Huffman´s algorithm, test generation, test compression
2	Paul Theo Gonciari, Bashir M. Al-Hashimi, Nicola Nicolici	Improving Compression Ratio, Area Overhead, and Test Application Time for System-on-a-Chip Test Data Compression/Decompression.	DATE	2002	DBLP DOI BibTeX RDF
2	Anshuman Chandra, Krishnendu Chakrabarty	Test Resource Partitioning and Reduced Pin-Count Testing Based on Test Data Compression.	DATE	2002	DBLP DOI BibTeX RDF
2	Takahiro J. Yamaguchi, Dong Sam Ha, Masahiro Ishida, Tadahiro Ohmi	A Method for Compressing Test Data Based on Burrows-Wheeler Transformation.	IEEE Trans. Computers	2002	DBLP DOI BibTeX RDF	compression, Data compression, test data compression, Burrows-Wheeler transformation, test data, run-length coding
2	Anshuman Chandra, Krishnendu Chakrabarty	System-on-a-chip test-data compression and decompressionarchitectures based on Golomb codes.	IEEE Trans. on CAD of Integrated Circuits and Systems	2001	DBLP DOI BibTeX RDF
2	Anshuman Chandra, Krishnendu Chakrabarty	Frequency-Directed Run-Length (FDR) Codes with Application to System-on-a-Chip Test Data Compression.	VTS	2001	DBLP DOI BibTeX RDF
2	Anshuman Chandra, Krishnendu Chakrabarty	Test Data Compression for System-on-a-Chip Using Golomb Codes.	VTS	2000	DBLP DOI BibTeX RDF	decompression architecture, difference vector, precomputed test sets, test set encoding, variable-to-variable-length codes, Automatic Test Equipment (ATE), testing time, embedded core testing
1	Dongsoo Lee, Kaushik Roy	Viterbi-Based Efficient Test Data Compression.	IEEE Trans. on CAD of Integrated Circuits and Systems	2012	DBLP DOI BibTeX RDF
1	Lung-Jen Lee, Wang-Dauh Tseng, Rung-Bin Lin, Cheng-Ho Chang	$2^{n}$ Pattern Run-Length for Test Data Compression.	IEEE Trans. on CAD of Integrated Circuits and Systems	2012	DBLP DOI BibTeX RDF
1	Shyue-Kung Lu, Ya-Chen Huang	Improving Reusability of Test Symbols for Test Data Compression.	J. Inf. Sci. Eng.	2012	DBLP BibTeX RDF
1	Wenfa Zhan, Aiman El-Maleh	A new scheme of test data compression based on equal-run-length coding (ERLC).	Integration	2012	DBLP DOI BibTeX RDF
1	Usha Sandeep Mehta, Kankar S. Dasgupta, Nirnjan M. Devashrayee	Weighted Transition Based Reordering, Columnwise Bit Filling, and Difference Vector: A Power-Aware Test Data Compression Method.	VLSI Design	2011	DBLP DOI BibTeX RDF
1	Ling Zhang, Jishun Kuang, Zhiqiang You	Test data compression using interval broadcast scan for embedded cores.	Microelectronics Journal	2011	DBLP DOI BibTeX RDF
1	Adam B. Kinsman, Nicola Nicolici	Trade-Offs in Test Data Compression and Deterministic X-Masking of Responses.	IEEE Trans. Computers	2011	DBLP DOI BibTeX RDF
1	Ling Zhang, Jishun Kuang	A New Test Data Compression Scheme.	JCP	2011	DBLP DOI BibTeX RDF
1	Aiman El-Maleh, Saif al Zahir, Esam Khan	Test data compression based on geometric shapes.	Computers & Electrical Engineering	2011	DBLP DOI BibTeX RDF
1	Ling Zhang, Jishun Kuang, Zhiqiang You	Test Data Compression Using Selective Sparse Storage.	J. Electronic Testing	2011	DBLP DOI BibTeX RDF
1	Min-yong Wan, Yong Ding, Yun Pan, Xiaolang Yan	An Efficient Compatibility-Based Test Data Compression and Its Decoder Architecture.	J. Electronic Testing	2011	DBLP DOI BibTeX RDF
1	Jia Li, Xiao Liu, Yubin Zhang, Yu Hu, Xiaowei Li, Qiang Xu	Capture-power-aware test data compression using selective encoding.	Integration	2011	DBLP DOI BibTeX RDF
1	Bo Ye, Qian Zhao, Duo Zhou, Xiaohua Wang, Min Luo	Test data compression using alternating variable run-length code.	Integration	2011	DBLP DOI BibTeX RDF
1	Yang Yu, Gang Xi, Liyan Qiao	Multiscan-based Test Data Compression Using UBI Dictionary and Bitmask.	Asian Test Symposium	2011	DBLP DOI BibTeX RDF
1	K. A. Bhavsar, U. S. Mehta	Analysis of test data compression techniques emphasizing statistical coding schemes.	ICWET	2011	DBLP DOI BibTeX RDF
1	P. Sismanoglou, D. Nikolos	Test data compression based on the reuse of parts of the dictionary entries.	ICECS	2011	DBLP DOI BibTeX RDF
1	Usha Sandeep Mehta, Kankar S. Dasgupta, Niranjan M. Devashrayee	Run-Length-Based Test Data Compression Techniques: How Far from Entropy and Power Bounds? - A Survey.	VLSI Design	2010	DBLP DOI BibTeX RDF
1	YongJoon Kim, Jaeseok Park, Sungho Kang	Selective Scan Slice Grouping Technique for Efficient Test Data Compression.	IEICE Transactions	2010	DBLP BibTeX RDF
1	Vasileios Tenentes, Xrysovalantis Kavousianos, Emmanouil Kalligeros	Single and Variable-State-Skip LFSRs: Bridging the Gap Between Test Data Compression and Test Set Embedding for IP Cores.	IEEE Trans. on CAD of Integrated Circuits and Systems	2010	DBLP DOI BibTeX RDF
1	Kanad Basu, Prabhat Mishra	Test Data Compression Using Efficient Bitmask and Dictionary Selection Methods.	IEEE Trans. VLSI Syst.	2010	DBLP DOI BibTeX RDF
1	Maoxiang Yi, Huaguo Liang, Lei Zhang, Wenfa Zhan	A Novel x -ploiting Strategy for Improving Performance of Test Data Compression.	IEEE Trans. VLSI Syst.	2010	DBLP DOI BibTeX RDF
1	Wenfa Zhan, Huaguo Liang, Cuiyun Jiang, Zhengfeng Huang, Aiman H. El-Maleh	A scheme of test data compression based on coding of even bits marking and selective output inversion.	Computers & Electrical Engineering	2010	DBLP DOI BibTeX RDF
1	Wang-Dauh Tseng, Lung-Jen Lee	Test Data Compression Using Multi-dimensional Pattern Run-length Codes.	J. Electronic Testing	2010	DBLP BibTeX RDF
1	Usha Sandeep Mehta, Kankar S. Dasgupta, Nirnjan M. Devashrayee	Modified Selective Huffman Coding for Optimization of Test Data Compression, Test Application Time and Area Overhead.	J. Electronic Testing	2010	DBLP DOI BibTeX RDF
1	Sara Karamati, Zainalabedin Navabi	Using context based methods for test data compression.	ITC	2010	DBLP DOI BibTeX RDF
1	Viktor Froese, Rüdiger Ibers, Sybille Hellebrand	Reusing NoC-infrastructure for test data compression.	VTS	2010	DBLP DOI BibTeX RDF
1	Ling Zhang, Jishun Kuang, Zhiqiang You	Test Data Compression Using Four-Coded and Sparse Storage for Testing Embedded Core.	ICA3PP	2010	DBLP DOI BibTeX RDF
1	Dong Xiang, Dianwei Hu, Qiang Xu, Alex Orailoglu	Low-Power Scan Testing for Test Data Compression Using a Routing-Driven Scan Architecture.	IEEE Trans. on CAD of Integrated Circuits and Systems	2009	DBLP DOI BibTeX RDF
1	Zhanglei Wang, Hongxia Fang, Krishnendu Chakrabarty, Michael Bienek	Deviation-Based LFSR Reseeding for Test-Data Compression.	IEEE Trans. on CAD of Integrated Circuits and Systems	2009	DBLP DOI BibTeX RDF
1	Lung-Jen Lee, Wang-Dauh Tseng, Rung-Bin Lin, Chen-Lun Lee	A Multi-dimensional Pattern Run-Length Method for Test Data Compression.	Asian Test Symposium	2009	DBLP DOI BibTeX RDF
1	Usha Sandeep Mehta, Kankar S. Dasgupta, Nirnjan M. Devashrayee	Survey of Test Data Compression Technique Emphasizing Code Based Schemes.	DSD	2009	DBLP DOI BibTeX RDF
1	M. Koutsoupia, Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Nikolos	LFSR-based test-data compression with self-stoppable seeds.	DATE	2009	DBLP BibTeX RDF
1	Lyl M. Ciganda, Francesco Abate, Paolo Bernardi, M. Bruno, Matteo Sonza Reorda	An enhanced FPGA-based low-cost tester platform exploiting effective test data compression for SoCs.	DDECS	2009	DBLP DOI BibTeX RDF
1	Mingjing Chen, Alex Orailoglu	Scan power reduction in linear test data compression scheme.	ICCAD	2009	DBLP BibTeX RDF
1	Wenfa Zhan, Aiman El-Maleh	A new collaborative scheme of test vector compression based on equal-run-length coding (ERLC).	CSCWD	2009	DBLP DOI BibTeX RDF
1	Irith Pomeranz, Sudhakar M. Reddy	The Effect of Filling the Unspecified Values of a Test Set on the Test Set Quality.	VLSI Design	2009	DBLP DOI BibTeX RDF
1	Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki, Tatsuru Matsuo, Takahisa Hiraide, Hideaki Konishi, Michiaki Emori, Takashi Aikyo	Test Data Compression for Scan-Based BIST Aiming at 100x Compression Rate.	IEICE Transactions	2008	DBLP DOI BibTeX RDF
1	Erik Larsson	Architecture for integrated test data compression and abort-on-fail testing in a multi-site environment.	IET Computers & Digital Techniques	2008	DBLP DOI BibTeX RDF
1	Aiman H. El-Maleh	Test data compression for system-on-a-chip using extended frequency-directed run-length code.	IET Computers & Digital Techniques	2008	DBLP DOI BibTeX RDF
1	Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Arun Gunda	Comparative study of centralised and distributed compatibility-based test data compression.	IET Computers & Digital Techniques	2008	DBLP DOI BibTeX RDF
1	Zhanglei Wang, Krishnendu Chakrabarty	Test Data Compression Using Selective Encoding of Scan Slices.	IEEE Trans. VLSI Syst.	2008	DBLP DOI BibTeX RDF
1	Xrysovalantis Kavousianos, Emmanouil Kalligeros, Dimitris Nikolos	Multilevel-Huffman Test-Data Compression for IP Cores With Multiple Scan Chains.	IEEE Trans. VLSI Syst.	2008	DBLP DOI BibTeX RDF
1	Meng-Fan Wu, Jiun-Lang Huang, Xiaoqing Wen, Kohei Miyase	Reducing Power Supply Noise in Linear-Decompressor-Based Test Data Compression Environment for At-Speed Scan Testing.	ITC	2008	DBLP DOI BibTeX RDF
1	Wenfa Zhan	An efficient collaborative test data compression scheme based on OLEL coding.	CSCWD	2008	DBLP DOI BibTeX RDF
1	Youhua Shi, Nozomu Togawa, Masao Yanagisawa, Tatsuo Ohtsuki	GECOM: Test data compression combined with all unknown response masking.	ASP-DAC	2008	DBLP DOI BibTeX RDF
1	Adam B. Kinsman, Nicola Nicolici	Embedded Deterministic Test Exploiting Care Bit Clustering and Seed Borrowing.	ISQED	2008	DBLP DOI BibTeX RDF	design-for-testability, test data compression
1	Emil Gizdarski	Constructing Augmented Multimode Compactors.	VTS	2008	DBLP DOI BibTeX RDF	on-chip compression, array codes, linear codes, test data compression