Search results for "Test data"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
5	Hamidreza Hashempour, Fabrizio Lombardi	Two dimensional reordering of functional test data for compression by ATE.	ACM Great Lakes Symposium on VLSI	2005	DBLP DOI BibTeX RDF	2D reordering, column reordering, functional test data, scan test data, ATE, test data compression
4	Paulo Marcos Siqueira Bueno, W. Eric Wong, Mario Jino	Automatic test data generation using particle systems.	SAC	2008	DBLP DOI BibTeX RDF	diversity oriented test data generation, simulated repulsion, genetic algorithms, software testing, simulated annealing, self-organization, random testing, test data generation
4	Takahiro J. Yamaguchi, Dong Sam Ha, Masahiro Ishida, Tadahiro Ohmi	A Method for Compressing Test Data Based on Burrows-Wheeler Transformation.	IEEE Trans. Computers	2002	DBLP DOI BibTeX RDF	compression, Data compression, test data compression, Burrows-Wheeler transformation, test data, run-length coding
4	Tsong Yueh Chen, Man Fai Lau	Two test data selection strategies towards testing of Boolean specifications. (PDF / PS)	COMPSAC	1997	DBLP DOI BibTeX RDF	test data selection strategies, Boolean specification testing, Boolean testing, fault based approach, program testing, test data generation, test case selection, Boolean formulae, Boolean expression
4	Bogdan Korel, Ali M. Al-Yami	Assertion-Oriented Automated Test Data Generation.	ICSE	1996	DBLP BibTeX RDF	assertion oriented automated test data generation, automatic run time detection, program input, software engineering, program testing, automatic programming, white box testing, automated test data generation, software errors
3	Andreas Windisch	Search-based test data generation from stateflow statecharts.	GECCO	2010	DBLP DOI BibTeX RDF	signal generation, optimization, coverage, automation, test data generation, structural testing, simulink, search-based testing, stateflow, model testing
3	Klaus Haller	The test data challenge for database-driven applications.	DBTest	2010	DBLP DOI BibTeX RDF	testing, databases, information systems, test coverage, test data
3	Yannis Smaragdakis, Christoph Csallner, Ranjith Subramanian	Scalable satisfiability checking and test data generation from modeling diagrams.	Autom. Softw. Eng.	2009	DBLP DOI BibTeX RDF	Modeling, Testing, Databases, NP-hardness, Test data generation, ORM, ORM-
3	Dan Hao, Lu Zhang 0023, Ming-Hao Liu, He Li, Jiasu Sun	Test-Data Generation Guided by Static Defect Detection.	J. Comput. Sci. Technol.	2009	DBLP DOI BibTeX RDF	suspicious statements, software testing, constraint satisfaction problem, test-data generation
3	Praveen Ranjan Srivastava, Priyanka Gupta, Yogita Arrawatia, Suman Yadav	Use of genetic algorithm in generation of feasible test data.	ACM SIGSOFT Software Engineering Notes	2009	DBLP DOI BibTeX RDF	feasible path, genetic algorithm (GA), test data
3	Mark Harman, Fayezin Islam, Tao Xie, Stefan Wappler	Automated test data generation for aspect-oriented programs.	AOSD	2009	DBLP DOI BibTeX RDF	aspect-oriented software development, test data generation, evolutionary testing, search-based software engineering
3	Nabil Badereddine, Zhanglei Wang, Patrick Girard, Krishnendu Chakrabarty, Arnaud Virazel, Serge Pravossoudovitch, Christian Landrault	A Selective Scan Slice Encoding Technique for Test Data Volume and Test Power Reduction.	J. Electronic Testing	2008	DBLP DOI BibTeX RDF	DfT, Scan, Test data compression, Low power testing
3	Armin Beer, Stefan Mohacsi	Efficient Test Data Generation for Variables with Complex Dependencies.	ICST	2008	DBLP DOI BibTeX RDF	Multi-dimensional equivalence partitions, Cause-effect analysis, CECIL method, Test Data Generation
3	Sebastian Wieczorek, Alin Stefanescu, Ina Schieferdecker	Test Data Provision for ERP Systems.	ICST	2008	DBLP DOI BibTeX RDF	data constraints, testing, ERP, test data
3	Jianhua Feng, Guoliang Li	A Test Data Compression Method for System-on-a-Chip.	DELTA	2008	DBLP DOI BibTeX RDF	FDR code, Hybrid Run-length code, MFDR code, Test data compression
3	Kanad Basu, Prabhat Mishra	A novel test-data compression technique using application-aware bitmask and dictionary selection methods.	ACM Great Lakes Symposium on VLSI	2008	DBLP DOI BibTeX RDF	compression, test data, decompression
3	Yongsuk Lee, Xingquan Zhu, Abhijit S. Pandya, Sam Hsu	iVESTA: an interactive visualization and evaluation system for drive test data.	SAC	2008	DBLP DOI BibTeX RDF	iDEN, mobile handset drive test, test data evaluation, visualization, mobility
3	Rajesh Tiwari, Abhijeet Shrivastava, Mahit Warhadpande, Srivaths Ravi, Rubin A. Parekhji	A Regression Based Technique for ATE-Aware Test Data Volume Estimation of System-on-Chips.	VTS	2008	DBLP DOI BibTeX RDF	Tester, ATPG, Estimation, ATE, Test Time, Test Data Volume
3	Sounil Biswas, R. D. (Shawn) Blanton	Test Compaction for Mixed-Signal Circuits Using Pass-Fail Test Data.	VTS	2008	DBLP DOI BibTeX RDF	pass-fail test data, boolean minimization, minimum constrained subset cover, Mixed-signal test, test compaction
3	Hui Ruan, Jian Zhang 0001, Jun Yan	Test Data Generation for C Programs with String-Handling Functions.	TASE	2008	DBLP DOI BibTeX RDF	program testing, test data generation, character string
3	Florin Pinte, Norbert Oster, Francesca Saglietti	Techniques and tools for the automatic generation of optimal test data at code, model and interface level.	ICSE Companion	2008	DBLP DOI BibTeX RDF	optimal test data generation, genetic algorithms
3	Man Xiao, Mohamed El-Attar, Marek Reformat, James Miller	Empirical evaluation of optimization algorithms when used in goal-oriented automated test data generation techniques.	Empirical Software Engineering	2007	DBLP DOI BibTeX RDF	Empirical results, Empirical software engineering, Test-data generation, Optimization techniques
3	Xrysovalantis Kavousianos, Emmanouil Kalligeros, Dimitris Nikolos	Optimal Selective Huffman Coding for Test-Data Compression.	IEEE Trans. Computers	2007	DBLP DOI BibTeX RDF	Embedded Testing Techniques, Selective Huffman Coding, Test-Data Compression, IP Cores
3	Dong Xiang, Kaiwei Li, Jiaguang Sun, Hideo Fujiwara	Reconfigured Scan Forest for Test Application Cost, Test Data Volume, and Test Power Reduction.	IEEE Trans. Computers	2007	DBLP DOI BibTeX RDF	Scan forest, test application cost, test data volume, test power
3	Kiran Lakhotia, Mark Harman, Phil McMinn	A multi-objective approach to search-based test data generation.	GECCO	2007	DBLP DOI BibTeX RDF	multi-objective genetic algorithms, evolutionary testing, automated test data generation
3	Chartchai Doungsa-ard, Keshav P. Dahal, M. Alamgir Hossain, Taratip Suwannasart	Test Data Generation from UML State Machine Diagrams using GAs.	ICSEA	2007	DBLP DOI BibTeX RDF	UML state machine diagram, Genetic algorithm, Test data generation
3	Mark Harman, Youssef Hassoun, Kiran Lakhotia, Phil McMinn, Joachim Wegener	The impact of input domain reduction on search-based test data generation.	ESEC/SIGSOFT FSE	2007	DBLP DOI BibTeX RDF	input domain reduction, genetic algorithms, hill climbing, evolutionary testing, automated test data generation, search space reduction
3	Phil McMinn, Mark Harman, David Binkley, Paolo Tonella	The species per path approach to SearchBased test data generation.	ISSTA	2006	DBLP DOI BibTeX RDF	testability transformation, evolutionary testing, search-based software engineering, automated test data generation
3	Norbert Oster, Francesca Saglietti	Automatic Test Data Generation by Multi-objective Optimisation.	SAFECOMP	2006	DBLP DOI BibTeX RDF	testing, evolutionary algorithms, data flow, mutation testing, object-oriented software, automated test data generation
3	Ming-Hao Liu, You-Feng Gao, Jinhui Shan, Jiang-Hong Liu, Lu Zhang 0023, Jiasu Sun	An Approach to Test Data Generation for Killing Multiple Mutants.	ICSM	2006	DBLP DOI BibTeX RDF	adequacy criterion, unit testing, test data generation, mutation testing
3	Du Zhang	Machine Learning in Value-Based Software Test Data Generation.	ICTAI	2006	DBLP DOI BibTeX RDF	value-based software test data generation, genetic algorithms, value-based software engineering
3	Zhongxing Xu, Jian Zhang 0001	A Test Data Generation Tool for Unit Testing of C Programs.	QSIC	2006	DBLP DOI BibTeX RDF	pointer operation, unit testing, symbolic execution, Test data generation
3	Terumine Hayashi, Haruna Yoshioka, Tsuyoshi Shinogi, Hidehiko Kita, Haruhiko Takase	On Test Data Compression Using Selective Don't-Care Identification.	J. Comput. Sci. Technol.	2005	DBLP DOI BibTeX RDF	multiple scan structure, dont-care identification, test data compression, test cost reduction
3	Arnaud Gotlieb, Tristan Denmat, Bernard Botella	Constraint-based test data generation in the presence of stack-directed pointers.	ASE	2005	DBLP DOI BibTeX RDF	constraint-based test data generation, stack-directed pointers, constraint satisfaction
3	Hamidreza Hashempour, Luca Schiano, Fabrizio Lombardi	Enhancing error resilience for reliable compression of VLSI test data.	ACM Great Lakes Symposium on VLSI	2005	DBLP DOI BibTeX RDF	reliable compression, ATE, test data compression
3	Norbert Oster	Automated Generation and Evaluation of Dataflow-Based Test Data for Object-Oriented Software.	QoSA/SOQUA	2005	DBLP DOI BibTeX RDF	testing, evolutionary algorithms, dataflow, mutation testing, object-oriented software, automated test data generation
3	Lei Li, Krishnendu Chakrabarty	On Using Exponential-Golomb Codes and Subexponential Codes for System-on-a-Chip Test Data Compression.	J. Electronic Testing	2004	DBLP DOI BibTeX RDF	compression codes, SOC testing, embedded core testing, test data volume
3	Sudhakar M. Reddy, Kohei Miyase, Seiji Kajihara, Irith Pomeranz	On test data volume reduction for multiple scan chain designs.	ACM Trans. Design Autom. Electr. Syst.	2003	DBLP DOI BibTeX RDF	Decompressor, Don't care identification, Encoding techniques, Design for testability, Test data compression
3	Lei Li, Krishnendu Chakrabarty, Nur A. Touba	Test data compression using dictionaries with selective entries and fixed-length indices.	ACM Trans. Design Autom. Electr. Syst.	2003	DBLP DOI BibTeX RDF	reduced pin-count testing, SoC testing, test application time, Embedded core testing, test data volume
3	Irith Pomeranz, Sudhakar M. Reddy	On test data compression and n-detection test sets.	DAC	2003	DBLP DOI BibTeX RDF	test generation, test data compression, n-detection test sets
3	Nguyen Tran Sy, Yves Deville	Consistency techniques for interprocedural test data generation.	ESEC / SIGSOFT FSE	2003	DBLP DOI BibTeX RDF	software testing, consistency, constraint satisfaction, arrays, test data generation, procedures
3	Huaguo Liang, Sybille Hellebrand, Hans-Joachim Wunderlich	Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST.	J. Electronic Testing	2002	DBLP DOI BibTeX RDF	store and generate schemes, BIST, test data compression, deterministic BIST
3	Seiji Kajihara, Kenjiro Taniguchi, Irith Pomeranz, Sudhakar M. Reddy	Test Data Compression Using Don't-Care Identification and Statistical Encoding.	DELTA	2002	DBLP DOI BibTeX RDF	Statistical Encoding, Don't Care Identification, Huffman's algorithm, Test Data Compression
3	Srinivas Visvanathan, Neelam Gupta	Generating Test Data for Functions with Pointer Inputs.	ASE	2002	DBLP DOI BibTeX RDF	iterative relaxation methods, Test data generation, dynamic data structures, path testing
3	Nguyen Tran Sy, Yves Deville	Automatic Test Data Generation for Programs with Integer and Float Variables.	ASE	2001	DBLP DOI BibTeX RDF	software testing, consistency, constraint satisfaction, test data generation
3	Paulo Marcos Siqueira Bueno, Mario Jino	Identification of Potentially Infeasible Program Paths by Monitoring the Search for Test Data. (PDF / PS)	ASE	2000	DBLP DOI BibTeX RDF	dynamic technique, path unfeasibility, genetic algorithms, test data generation
3	Sébastien Lapierre, Ettore Merlo, Gilles Savard, Giuliano Antoniol, Roberto Fiutem, Paolo Tonella	Automatic Unit Test Data Generation Using Mixed-Integer Linear Programming and Execution Trees. (PDF / PS)	ICSM	1999	DBLP DOI BibTeX RDF	execution tree, extended path constraint (EPC), path infeasibility, symbolic execution, mixed-integer linear programming, Automatic test data generation
3	Arnaud Gotlieb, Bernard Botella, Michel Rueher	Automatic Test Data Generation Using Constraint Solving Techniques.	ISSTA	1998	DBLP DOI BibTeX RDF	constraint solving techniques, structural testing, global constraints, automatic test data generation
3	Ákos Hajnal, István Forgács	An Applicable Test Data Generation Algorithm for Domain Errors.	ISSTA	1998	DBLP DOI BibTeX RDF	border testing, domain testing, testing criterion, software testing, automated test data generation
3	Neelam Gupta, Aditya P. Mathur, Mary Lou Soffa	Automated Test Data Generation Using an Iterative Relaxation Method.	SIGSOFT FSE	1998	DBLP DOI BibTeX RDF	dynamic test data generation, input dependency set, predicate residuals, predicate sliccs, path testing, relaxation methods
3	Matthew J. Gallagher, V. Lakshmi Narasimhan	ADTEST: A Test Data Generation Suite for Ada Software Systems.	IEEE Trans. Software Eng.	1997	DBLP DOI BibTeX RDF	Software test data generation, software testing, symbolic execution, program instrumentation
3	Christoph C. Michael, Gary McGraw, Michael Schatz, C. C. Walton	Genetic Algorithms for Dynamic Test Data Generation. (PDF / PS)	ASE	1997	DBLP DOI BibTeX RDF	program features, random test generation, genetic algorithms, genetic algorithms, software testing, combinatorial optimization, test generation, test data generation, test adequacy criteria
3	Silvia Regina Vergilio, José Carlos Maldonado, Mario Jino	Constraint Based Selection of Test Sets to Satisfy Structural Software Testing Criteria. (PDF / PS)	SCCC	1997	DBLP DOI BibTeX RDF	constraint based selection, structural software testing criteria, Constraint Based Criteria, distinct fundamentals, test data generation strategies, test data set adequacy, program testing
3	Ghassan Al Hayek, Chantal Robach	On the Adequacy of Deriving Hardware Test Data from the Behavioral Specification.	EUROMICRO	1996	DBLP DOI BibTeX RDF	hardware test data, behavioral fault modeling, gate-level strategies, high-level fault detection, gate-level fault detection, design automation tools, generated test set, gate-level fault coverage, hardware description languages, hardware description languages, behavioral specification
3	Elaine J. Weyuker, Tarak Goradia, Ashutosh Singh	Automatically Generating Test Data from a Boolean Specification.	IEEE Trans. Software Eng.	1994	DBLP DOI BibTeX RDF	formal specification, software testing, program testing, costs, Boolean algebra, test data generation, black-box testing, automatic test case generation, Boolean specification, test set size, fault detection effectiveness
3	Debra J. Richardson, Margaret C. Thompson	An Analysis of Test Data Selection Criteria Using the RELAY Model of Fault Detection.	IEEE Trans. Software Eng.	1993	DBLP DOI BibTeX RDF	test data selection criteria, failure conditions, erroneous behavior, software reliability, fault detection, program testing, information flow, program debugging, RELAY
3	Allen S. Parrish, Stuart H. Zweben	Analysis and Refinement of Software Test Data Adequacy Properties.	IEEE Trans. Software Eng.	1991	DBLP DOI BibTeX RDF	software test data adequacy properties, weak existential properties, formal specification, software testing, specification, data integrity, standards, standards, consistency, program testing, program structure
3	Richard A. DeMillo, A. Jefferson Offutt	Constraint-Based Automatic Test Data Generation.	IEEE Trans. Software Eng.	1991	DBLP DOI BibTeX RDF	constraint-based data generation, relative adequacy, fault-based technique, algebraic constraints, Godzilla, module testing, Mothra testing system, computational complexity, program testing, mutation analysis, automatic test data generation
3	A. Jefferson Offutt	An integrated automatic test data generation system.	Journal of Systems Integration	1991	DBLP DOI BibTeX RDF	software testing, constraints, unit testing, test data generation, mutation testing, fault-based testing
3	Bogdan Korel	Automated Software Test Data Generation.	IEEE Trans. Software Eng.	1990	DBLP DOI BibTeX RDF	automated software test data generation, function-minimization methods, input variables, program execution flow, function-minimization search algorithms, input variables, array indexes, data structures, program testing, search problems, automatic programming, minimisation, backtracking, pointers, dynamic data structures, program behavior, dynamic data-flow analysis
2	Dongsoo Lee, Kaushik Roy	Viterbi-Based Efficient Test Data Compression.	European Test Symposium	2011	DBLP DOI BibTeX RDF	On-Chip Decompressor, Scalability, Logic Test, Test Data Compression, Low-Power Test
2	Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer	Reduced ATE Interface for High Test Data Compression.	European Test Symposium	2011	DBLP DOI BibTeX RDF	channel bandwidth management, embedded deterministic test, test interface, tri-modal compression, test data compression, scan-based designs
2	Usha S. Mehla, Kankar S. Dasgupta, Nirnjan M. Devashrayee	Hamming Distance Based Reordering and Columnwise Bit Stuffing with Difference Vector: A Better Scheme for Test Data Compression with Run Length Based Codes.	VLSI Design	2010	DBLP DOI BibTeX RDF	Golomb Codes, Bit Stuffing, Difference Vector, Hamming Distance, Test Data Compression, Run Length Codes
2	Xinzhong Liu, Gaochao Xu, Xiaodong Fu, Yushuang Dong	Test Data Generation Considering Data Dependence.	FCST	2010	DBLP DOI BibTeX RDF	test data generation, mutation testing, constraint system, automated software testing
2	Yang Cao, Chunhua Hu, Luming Li	Search-based multi-paths test data generation for structure-oriented testing.	GEC Summit	2009	DBLP DOI BibTeX RDF	structure-oriented, genetic algorithms, software testing, automation test, path testing
2	Sion Ll Rhys, Simon M. Poulding, John A. Clark	Using automated search to generate test data for matlab.	GECCO	2009	DBLP DOI BibTeX RDF	genetic algorithms, matlab, search-based software engineering
2	Maoxiang Yi, Huaguo Liang, Kaihua Zhan, Cuiyun Jiang	Optimal LFSR-Coding Test Data Compression Based on Test Cube Dividing.	CSE	2009	DBLP DOI BibTeX RDF
2	Zheng Wang, Xiao Yu, Tao Sun, Geguang Pu, Zuohua Ding, Jueliang Hu	Test Data Generation for Derived Types in C Program.	TASE	2009	DBLP DOI BibTeX RDF
2	Lian Yu, Wei Zhao, Xiangdong Fan, Jun Zhu	Exploring Topological Structure of Boolean Expressions for Test Data Selection.	TASE	2009	DBLP DOI BibTeX RDF
2	Ying Jiang, Ying-Na Li, Shan-Shan Hou, Lu Zhang 0023	Test-Data Generation for Web Services Based on Contract Mutation.	SSIRI	2009	DBLP DOI BibTeX RDF	Contract Mutation, Web Services, Test-Data Generation
2	Prasad Bokil, Priyanka Darke, Ulka Shrotri, R. Venkatesh	Automatic Test Data Generation for C Programs.	SSIRI	2009	DBLP DOI BibTeX RDF	Modified Condition/Decision coverage (MCDC), Automatic Test data generation
2	X. B. Tan, Longxin Cheng, Xiumei Xu	Test Data Generation Using Annealing Immune Genetic Algorithm.	NCM	2009	DBLP DOI BibTeX RDF	expectation of reproduction, genetic algorithm, Software testing, test data generation
2	Phil McMinn, David Binkley, Mark Harman	Empirical evaluation of a nesting testability transformation for evolutionary testing.	ACM Trans. Softw. Eng. Methodol.	2009	DBLP DOI BibTeX RDF	testability transformation, test data generation, Evolutionary testing, search-based software engineering
2	Aiman Hanna, Hai Zhou Ling, Xiaochun Yang, Mourad Debbabi	A Synergy between Static and Dynamic Analysis for the Detection of Software Security Vulnerabilities.	OTM Conferences	2009	DBLP DOI BibTeX RDF	Static Analysis, Dynamic Analysis, Test-Data Generation, Security Testing, Security Automata
2	Xrysovalantis Kavousianos, Emmanouil Kalligeros, Dimitris Nikolos	Test Data Compression Based on Variable-to-Variable Huffman Encoding With Codeword Reusability.	IEEE Trans. on CAD of Integrated Circuits and Systems	2008	DBLP DOI BibTeX RDF
2	Zhanglei Wang, Krishnendu Chakrabarty	Test Data Compression Using Selective Encoding of Scan Slices.	IEEE Trans. VLSI Syst.	2008	DBLP DOI BibTeX RDF
2	Xrysovalantis Kavousianos, Emmanouil Kalligeros, Dimitris Nikolos	Multilevel-Huffman Test-Data Compression for IP Cores With Multiple Scan Chains.	IEEE Trans. VLSI Syst.	2008	DBLP DOI BibTeX RDF
2	Mohammad F. J. Klaib, Kamal Zuhairi Zamli, Nor Ashidi Mat Isa, Mohammed I. Younis, Rusli Abdullah	G2Way A Backtracking Strategy for Pairwise Test Data Generation.	APSEC	2008	DBLP DOI BibTeX RDF
2	Jun Ma	A Test Data Compression Scheme for Reducing Power Based on OLELC and NBET.	ICIC	2008	DBLP DOI BibTeX RDF	OLEL, Neighboring Bit-Wise Exclusive-or Transform(OCNBET), Data Compression
2	Po-Han Wu, Tsung-Tang Chen, Wei-Lin Li, Jiann-Chyi Rau	An efficient test-data compaction for low power VLSI testing.	EIT	2008	DBLP DOI BibTeX RDF
2	Mohammed I. Younis, Kamal Zuhairi Zamli, Nor Ashidi Mat Isa	IRPS - An Efficient Test Data Generation Strategy for Pairwise Testing.	KES	2008	DBLP DOI BibTeX RDF
2	Diana Vega, George Din, Stefan Taranu, Ina Schieferdecker	Application of Clustering Methods for Analysing of TTCN-3 Test Data Quality.	ICSEA	2008	DBLP DOI BibTeX RDF
2	Chunyan Ma, Chenglie Du, Tao Zhang, Fei Hu, Xiaobin Cai	WSDL-Based Automated Test Data Generation for Web Service.	CSSE	2008	DBLP DOI BibTeX RDF
2	Jan Christiansen, Sebastian Fischer	EasyCheck - Test Data for Free.	FLOPS	2008	DBLP DOI BibTeX RDF	Encapsulated Search, Testing, Nondeterminism, Curry
2	Hang Zhou, Zhiqiu Huang, Yi Zhu	Polymorphism Sequence Diagrams Test Data Automatic Generation Based on OCL.	ICYCS	2008	DBLP DOI BibTeX RDF
2	Ozgur Sinanoglu, Erik Jan Marinissen	Analysis of The Test Data Volume Reduction Benefit of Modular SOC Testing.	DATE	2008	DBLP DOI BibTeX RDF
2	Vasileios Tenentes, Xrysovalantis Kavousianos, Emmanouil Kalligeros	State Skip LFSRs: Bridging the Gap between Test Data Compression and Test Set Embedding for IP Cores.	DATE	2008	DBLP DOI BibTeX RDF
2	Anshuman Chandra, Felix Ng, Rohit Kapur	Low Power Illinois Scan Architecture for Simultaneous Power and Test Data Volume Reduction.	DATE	2008	DBLP DOI BibTeX RDF
2	Paolo Bernardi, Matteo Sonza Reorda	An novel Methodology for Reducing SoC Test Data Volume on FPGA-based Testers.	DATE	2008	DBLP DOI BibTeX RDF
2	Sying-Jyan Wang, Shih-Cheng Chen, Katherine Shu-Min Li	Design and analysis of skewed-distribution scan chain partition for improved test data compression.	ISCAS	2008	DBLP DOI BibTeX RDF
2	M. V. Arkhipova, Sergey V. Zelenov	Directed Generation of Test Data for Static Semantics Checker.	ISoLA	2008	DBLP DOI BibTeX RDF	context condition, grammar, specification based testing, static semantics, Automated test data generation
2	Jia Li, Xiao Liu, Yubin Zhang, Yu Hu, Xiaowei Li, Qiang Xu	On capture power-aware test data compression for scan-based testing.	ICCAD	2008	DBLP DOI BibTeX RDF
2	Kiran Lakhotia, Mark Harman, Phil McMinn	Handling dynamic data structures in search based testing.	GECCO	2008	DBLP DOI BibTeX RDF	symbolic execution, automated test data generation, concolic testing
2	Da Wang, Rui Li, Yu Hu, Huawei Li, Xiaowei Li	A Case Study on At-Speed Testing for a Gigahertz Microprocessor.	DELTA	2008	DBLP DOI BibTeX RDF	test power consumption, test coverage, at-speed testing, test time, test data volume
2	Sébastien Bardin, Philippe Herrmann	Structural Testing of Executables.	ICST	2008	DBLP DOI BibTeX RDF	structural testing, executable, automatic test data generation
2	Aiman Hanna, Hai Zhou Ling, Jason Furlong, Zhenrong Yang, Mourad Debbabi	Targeting Security Vulnerabilities: From Specification to Detection (Short Paper).	QSIC	2008	DBLP DOI BibTeX RDF	Dynamic Analysis, Data Dependency, Test-Data Generation, Control Flow Analysis, Security Testing, Security Automata
2	Scott Davidson, Nur A. Touba	Guest Editors' Introduction: Progress in Test Compression.	IEEE Design & Test of Computers	2008	DBLP DOI BibTeX RDF	tester memory, don't-care bits, X values, test compression, test vectors, test data volume
2	Rohit Kapur, Subhasish Mitra, Thomas W. Williams	Historical Perspective on Scan Compression.	IEEE Design & Test of Computers	2008	DBLP DOI BibTeX RDF	scan compression, test data volume reduction, IC testing, test application time reduction
2	Aiman Hanna, Hai Zhou Ling, Jason Furlong, Mourad Debbabi	Towards Automation of Testing High-Level Security Properties.	DBSec	2008	DBLP DOI BibTeX RDF	Dynamic Analysis, Data Dependency, Test Data Generation, Control Flow Analysis, Security Testing
2	Ozgur Sinanoglu	Improving the Effectiveness of Combinational Decompressors Through Judicious Partitioning of Scan Cells.	J. Electronic Testing	2008	DBLP DOI BibTeX RDF	Combinational decompressors, Scan cell partitioning, Test data compression, Scan-based testing