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Publications of "Theo Smedes" ( http://dblp.L3S.de/Authors/Theo_Smedes )

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Publication years (Num. hits)
2002-2011 (7)
Publication types (Num. hits)
article(7)
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Found 7 publication records. Showing 7 according to the selection in the facets
Hits ? Authors Title Venue Year Link Author keywords
1Guido Notermans, Dejan M. Maksimovic, Gerd Vermont, Michiel van Maasakkers, Fredrik Pusa, Theo Smedes On-chip system level protection of FM antenna pin with improved linearity. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Guido Notermans, Theo Smedes, Zeljko Mrcarica, Peter C. de Jong, Ralph Stephan, Hans van Zwol, Dejan M. Maksimovic ESD protection for thin gate oxides in 65 nm. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Guido Notermans, Olivier Quittard, Anco Heringa, Zeljko Mrcarica, Fabrice Blanc, Hans van Zwol, Theo Smedes, Thomas Keller, Peter C. de Jong ESD robust high-voltage active clamps. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Dejan M. Maksimovic, Fabrice Blanc, Guido Notermans, Theo Smedes, Thomas Keller An ESD test reduction method for complex devices. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1M. S. B. Sowariraj, Theo Smedes, Peter C. de Jong, Cora Salm, Ton J. Mouthaan, Fred G. Kuper A 3-D Circuit Model to evaluate CDM performance of ICs. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
1M. S. B. Sowariraj, Theo Smedes, Cora Salm, Ton J. Mouthaan, Fred G. Kuper Role of package parasitics and substrate resistance on the Charged Device Model (CDM) failure levels -An explanation and die protection strategy. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
1M. S. B. Sowariraj, Theo Smedes, Cora Salm, Ton J. Mouthaan, Fred G. Kuper The influence of technology variation on ggNMOSTs and SCRs against CDM BSD stress. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
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