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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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Results
Found 7 publication records. Showing 7 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Santiago Remersaro, Janusz Rajski, Thomas Rinderknecht, Sudhakar M. Reddy, Irith Pomeranz |
ATPG Heuristics Dependant Observation Point Insertion for Enhanced Compaction and Data Volume Reduction.  |
DFT  |
2008 |
DBLP DOI BibTeX RDF |
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| 1 | Wu-Tung Cheng, Manish Sharma, Thomas Rinderknecht, Liyang Lai, Chris Hill |
Signature Based Diagnosis for Logic BIST. |
ITC |
2006 |
DBLP DOI BibTeX RDF |
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| 1 | Liyang Lai, Janak H. Patel, Thomas Rinderknecht, Wu-Tung Cheng |
Hardware Ef.cient LBISTWith Complementary Weights. |
ICCD |
2005 |
DBLP DOI BibTeX RDF |
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| 1 | Liyang Lai, Janak H. Patel, Thomas Rinderknecht, Wu-Tung Cheng |
Logic BIST with Scan Chain Segmentation. |
ITC |
2004 |
DBLP DOI BibTeX RDF |
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| 1 | Liyang Lai, Thomas Rinderknecht, Wu-Tung Cheng, Janak H. Patel |
Logic BIST Using Constrained Scan Cells. |
VTS |
2004 |
DBLP DOI BibTeX RDF |
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| 1 | Janusz Rajski, Nilanjan Mukherjee, Jerzy Tyszer, Thomas Rinderknecht |
Embedded Test for Low Cost Manufacturing. (PDF / PS) |
VLSI Design |
2004 |
DBLP DOI BibTeX RDF |
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| 1 | Xijiang Lin, Ron Press, Janusz Rajski, Paul Reuter, Thomas Rinderknecht, Bruce Swanson, Nagesh Tamarapalli |
High-Frequency, At-Speed Scan Testing. |
IEEE Design & Test of Computers |
2003 |
DBLP DOI BibTeX RDF |
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Displaying result #1 - #7 of 7 (100 per page; Change: )
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