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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 2 occurrences of 2 keywords
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Results
Found 18 publication records. Showing 18 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Tibor Grasser |
Stochastic charge trapping in oxides: From random telegraph noise to bias temperature instabilities.  |
Microelectronics Reliability  |
2012 |
DBLP DOI BibTeX RDF |
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| 1 | Stanislav Tyaginov, Ivan Starkov, Hubert Enichlmair, C. Jungemann, J. M. Park, E. Seebacher, R. L. de Orio, Hajdin Ceric, Tibor Grasser |
An analytical approach for physical modeling of hot-carrier induced degradation. |
Microelectronics Reliability |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | Gregor Pobegen, Thomas Aichinger, Tibor Grasser, Michael Nelhiebel |
Impact of gate poly doping and oxide thickness on the N- and PBTI in MOSFETs. |
Microelectronics Reliability |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | K. Rupp, Ansgar Jüngel, Tibor Grasser |
Matrix compression for spherical harmonics expansions of the Boltzmann transport equation for semiconductors. |
J. Comput. Physics |
2010 |
DBLP DOI BibTeX RDF |
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| 1 | Stanislav Tyaginov, Ivan Starkov, Oliver Triebl, Johann Cervenka, C. Jungemann, S. Carniello, J. M. Park, Hubert Enichlmair, Markus Karner, Ch. Kernstock, E. Seebacher, Rainer Minixhofer, Hajdin Ceric, Tibor Grasser |
Interface traps density-of-states as a vital component for hot-carrier degradation modeling. |
Microelectronics Reliability |
2010 |
DBLP DOI BibTeX RDF |
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| 1 | Stanislav Tyaginov, Viktor Sverdlov, Ivan Starkov, Wolfgang Gös, Tibor Grasser |
Impact of O-Si-O bond angle fluctuations on the Si-O bond-breakage rate. |
Microelectronics Reliability |
2009 |
DBLP DOI BibTeX RDF |
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| 1 | Ph. Hehenberger, P.-J. Wagner, H. Reisinger, Tibor Grasser |
On the temperature and voltage dependence of short-term negative bias temperature stress. |
Microelectronics Reliability |
2009 |
DBLP DOI BibTeX RDF |
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| 1 | M. Vasicek, Viktor Sverdlov, Johann Cervenka, Tibor Grasser, Hans Kosina, Siegfried Selberherr |
Transport in Nanostructures: A Comparative Analysis Using Monte Carlo Simulation, the Spherical Harmonic Method, and Higher Moments Models. |
LSSC |
2009 |
DBLP DOI BibTeX RDF |
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| 1 | Thomas Aichinger, Michael Nelhiebel, Tibor Grasser |
On the temperature dependence of NBTI recovery. |
Microelectronics Reliability |
2008 |
DBLP DOI BibTeX RDF |
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| 1 | Michael Spevak, Tibor Grasser |
Discretization of Macroscopic Transport Equations on Non-Cartesian Coordinate Systems. |
IEEE Trans. on CAD of Integrated Circuits and Systems |
2007 |
DBLP DOI BibTeX RDF |
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| 1 | Robert Entner, Tibor Grasser, Oliver Triebl, Hubert Enichlmair, Rainer Minixhofer |
Negative bias temperature instability modeling for high-voltage oxides at different stress temperatures. |
Microelectronics Reliability |
2007 |
DBLP DOI BibTeX RDF |
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| 1 | Tibor Grasser, Siegfried Selberherr |
Editorial. |
Microelectronics Reliability |
2007 |
DBLP DOI BibTeX RDF |
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| 1 | Stefan Holzer, Alireza Sheikholeslami, Markus Karner, Tibor Grasser, Siegfried Selberherr |
Comparison of deposition models for a TEOS LPCVD process. |
Microelectronics Reliability |
2007 |
DBLP DOI BibTeX RDF |
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| 1 | Markus Karner, Andreas Gehring, M. Wagner, R. Entner, Stefan Holzer, Wolfgang Gös, M. Vasicek, Tibor Grasser, Hans Kosina, Siegfried Selberherr |
VSP - A gate stack analyzer. |
Microelectronics Reliability |
2007 |
DBLP DOI BibTeX RDF |
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| 1 | Johann Cervenka, W. Wessner, E. Al-Ani, Tibor Grasser, Siegfried Selberherr |
Generation of Unstructured Meshes for Process and Device Simulation by Means of Partial Differential Equations. |
IEEE Trans. on CAD of Integrated Circuits and Systems |
2006 |
DBLP DOI BibTeX RDF |
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| 1 | Stephan Wagner, Tibor Grasser, Claus Fischer, Siegfried Selberherr |
An advanced equation assembly module. |
Eng. Comput. (Lond.) |
2005 |
DBLP DOI BibTeX RDF |
Finite Boxes, Linear equation systems, Interface conditions, Device simulation, Circuit simulation, Boundary conditions |
| 1 | Stefan Holzer, Rainer Minixhofer, Clemens Heitzinger, Johannes Fellner, Tibor Grasser, Siegfried Selberherr |
Extraction of material parameters based on inverse modeling of three-dimensional interconnect fusing structures. |
Microelectronics Journal |
2004 |
DBLP DOI BibTeX RDF |
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| 1 | T. Ayalew, Andreas Gehring, J. M. Park, Tibor Grasser, Siegfried Selberherr |
Improving SiC lateral DMOSFET reliability under high field stress. |
Microelectronics Reliability |
2003 |
DBLP DOI BibTeX RDF |
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