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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 6 occurrences of 6 keywords
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Results
Found 6 publication records. Showing 6 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Hideyuki Ichihara, Toshimasa Kuchii, Masaaki Yamadate, Hideaki Sakaguchi, Hiroshi Uemura, Kozo Kinoshita |
A statistical error model for image sensors and its testing.  |
Systems and Computers in Japan  |
2007 |
DBLP DOI BibTeX RDF |
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| 1 | Hiroyuki Yotsuyanagi, Toshimasa Kuchii, Shigeki Nishikawa, Masaki Hashizume, Kozo Kinoshita |
Reducing Scan Shifts Using Configurations of Compatible and Folding Scan Trees. |
J. Electronic Testing |
2005 |
DBLP DOI BibTeX RDF |
scan tree, logic testing, design for testability, sequential circuit |
| 1 | Hiroyuki Yotsuyanagi, Toshimasa Kuchii, Shigeki Nishikawa, Masaki Hashizume, Kozo Kinoshita |
On Configuring Scan Trees to Reduce Scan Shifts based on a Circuit Structure. |
DELTA |
2004 |
DBLP DOI BibTeX RDF |
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| 1 | Hiroyuki Yotsuyanagi, Toshimasa Kuchii, Shigeki Nishikawa, Masaki Hashizume, Kozo Kinoshita |
Reducing Scan Shifts Using Folding Scan Trees. |
Asian Test Symposium |
2003 |
DBLP DOI BibTeX RDF |
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| 1 | Masaki Hashizume, Toshimasa Kuchii, Takeomi Tamesada |
Supply Current Test for Unit-to-unit Variations of Electrical Characteristics in Gates. |
Asian Test Symposium |
1997 |
DBLP DOI BibTeX RDF |
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| 1 | Toshimasa Kuchii, Masaki Hashizume, Takeomi Tamesada |
Algorithmic Test Generation for Supply Current Testing of TTL Combinational Circuits. |
Asian Test Symposium |
1996 |
DBLP DOI BibTeX RDF |
supply current testing, D-frontier, test generation, IDDQ testing, PODEM |
Displaying result #1 - #6 of 6 (100 per page; Change: )
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