| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Junxia Ma, Nisar Ahmed, Mohammad Tehranipoor |
Low-cost diagnostic pattern generation and evaluation procedures for noise-related failures.  |
VTS  |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Suriyaprakash Natarajan, Arani Sinha |
The buck stops with wafer test: Dream or reality? |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Yu-Jen Huang, Jin-Fu Li, Ji-Jan Chen, Ding-Ming Kwai, Yung-Fa Chou, Cheng-Wen Wu |
A built-in self-test scheme for the post-bond test of TSVs in 3D ICs. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Eun Jung Jang, Anne E. Gattiker, Sani R. Nassif, Jacob A. Abraham |
Efficient and product-representative timing model validation. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Arani Sinha, Suriyaprakash Natarajan |
The bang for the buck with resiliency: Yield or field? |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Amit Sanghani, Bo Yang, Karthikeyan Natarajan, Chunsheng Liu |
Design and implementation of a time-division multiplexing scan architecture using serializer and deserializer in GPU chips. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Shobha Vasudevan |
Coverage closure in SoC verification: Are we chasing a mirage? |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Ender Yilmaz, Anne Meixner, Sule Ozev |
An industrial case study of analog fault modeling. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Wing Chiu Tam, Ronald D. Blanton |
SLIDER: A fast and accurate defect simulation framework. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Siddharth Garg, Diana Marculescu |
Special session 4A: New topics parametric yield and reliability of 3D integrated circuits: New challenges and solutions. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Mike Laisne |
Advanced methods for leveraging new test standards. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Ujjwal Guin, Chen-Huan Chiang |
Design for Bit Error Rate estimation of high speed serial links. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Dilip K. Bhavsar |
Harmony Widget for X-free scan testing. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Nuno Alves, Yiwen Shi, Jennifer Dworak, R. Iris Bahar, Kundan Nepal |
Enhancing online error detection through area-efficient multi-site implications. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Valentin Gherman, Samuel Evain, Fabrice Auzanneau, Yannick Bonhomme |
Programmable extended SEC-DED codes for memory errors. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Rudrajit Datta, Nur A. Touba |
Designing a fast and adaptive error correction scheme for increasing the lifetime of phase change memories. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Yasuhiro Takahashi, Akinori Maeda |
Multi Domain Test: Novel test strategy to reduce the Cost of Test. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Aritra Banerjee, Shreyas Sen, Shyam Kumar Devarakond, Abhijit Chatterjee |
Automatic test stimulus generation for accurate diagnosis of RF systems using transient response signatures. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Michail Maniatakos, Yiorgos Makris, Prabhakar Kudva, Bruce M. Fleischer |
Exponent monitoring for low-cost concurrent error detection in FPU control logic. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Wei Zhao, Mohammad Tehranipoor, Sreejit Chakravarty |
Power-safe test application using an effective gating approach considering current limits. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | C. V. Martins, Jorge Semião, Julio César Vázquez, VÃctor H. Champac, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira |
Adaptive Error-Prediction Flip-flop for performance failure prediction with aging sensors. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Ke Peng, Fang Bao, Geoff Shofner, LeRoy Winemberg, Mohammad Tehranipoor |
Case Study: Efficient SDD test generation for very large integrated circuits. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Takushi Hashida, Yuuki Araga, Makoto Nagata |
A diagnosis testbench of analog IP cores against on-chip environmental disturbances. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Xiaoqing Wen, Mohammad Tehranipoor, Rohit Kapur, Anand Bhat, Amitava Majumdar, LeRoy Winemberg |
Special session 5B: Panel How much toggle activity should we be testing with? |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | |
29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011, Dana Point, California, USA |
VTS |
2011 |
DBLP BibTeX RDF |
|
| 1 | Shreepad Panth, Sung Kyu Lim |
Scan chain and power delivery network synthesis for pre-bond test of 3D ICs. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Priyadharshini Shanmugasundaram, Vishwani D. Agrawal |
Dynamic scan clock control for test time reduction maintaining peak power limit. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Rajamani Sethuram, Karim Arabi, Mohamed H. Abu-Rahma |
Leakage power profiling and leakage power reduction using DFT hardware. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Yasuo Sato |
Special session: Multifaceted approaches for field reliability. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Jeyavijayan Rajendran, Vinayaka Jyothi, Ozgur Sinanoglu, Ramesh Karri |
Design and analysis of ring oscillator based Design-for-Trust technique. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Prakash Narayanan, Rajesh Mittal, Sumanth Poddutur, Vivek Singhal, Puneet Sabbarwal |
Modified flip-flop architecture to reduce hold buffers and peak power during scan shift operation. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Eshan Singh |
Exploiting rotational symmetries for improved stacked yields in W2W 3D-SICs. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Zhongwei Jiang, Zheng Wang, Jing Wang 0006, D. M. H. Walker |
Levelized low cost delay test compaction considering IR-drop induced power supply noise. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Saghir Shaikh |
Test and characterization of high-speed circuits. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Cheng-Wen Wu |
Special session: Hot topic design and test of 3D and emerging memories. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | W.-A. Lin, C.-C. Lee, J.-L. Huang |
Sigma-delta modulation based wafer-level testing for TFT-LCD source driver ICs. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Mohammad Hossein Neishaburi, Zeljko Zilic |
A distributed AXI-based platform for post-silicon validation. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Kurt Rosenfeld, Ramesh Karri |
Security-aware SoC test access mechanisms. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Srinivasulu Alampally, R. T. Venkatesh, P. Shanmugasundaram, Rubin A. Parekhji, V. D. Agrawal |
An efficient test data reduction technique through dynamic pattern mixing across multiple fault models. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Dongsoo Lee, Sang Phill Park, Ashish Goel, Kaushik Roy |
Memory-based embedded digital ATE. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Baosheng Wang, Jayalakshmi Rajaraman, Kanwaldeep Sobti, Derrick Losli, Jeff Rearick |
Structural tests of slave clock gating in low-power flip-flop. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Zhen Zhang, Dimitri Refauvelet, Alain Greiner, Mounir Benabdenbi, François Pêcheux |
Localization of damaged resources in NoC based shared-memory MP2SOC, using a Distributed Cooperative Configuration Infrastructure. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Songwei Pei, Huawei Li, Xiaowei Li |
A unified test architecture for on-line and off-line delay fault detections. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Julien Guilhemsang, Olivier Héron, Nicolas Ventroux, Olivier Goncalves, Alain Giulieri |
Impact of the application activity on intermittent faults in embedded systems. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | LeRoy Winemberg, Mohammad Tehranipoor |
Special session: Hot topic: Smart silicon. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Xiaoqing Wen, Kazunari Enokimoto, Kohei Miyase, Yuta Yamato, Michael A. Kochte, Seiji Kajihara, Patrick Girard, Mohammad Tehranipoor |
Power-aware test generation with guaranteed launch safety for at-speed scan testing. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Hsiu-Chuan Shih, Ching-Yi Chen, Cheng-Wen Wu, Chih-He Lin, Shyh-Shyuan Sheu |
Training-based forming process for RRAM yield improvement. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Irith Pomeranz |
On clustering of undetectable transition faults in standard-scan circuits. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Amitava Majumdar, Arani Sinha, Nehal Patel, Ramamurthy Setty, Yan Dong, Shu-Hsuan Chou |
A Novel mechanism for speed characterization during delay test. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Jia Li, Yu Huang, Dong Xiang |
Prediction of compression bound and optimization of compression architecture for linear decompression-based schemes. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Jeffrey F. Wheeldon |
Calibrated high-efficiency testing and modelling methodologies for concentrated multi-junction solar cells. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Anne Gattiker |
Invited paper: Yin and Yang of embedded sensors for post-scaling-era. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Nader Alawadhi, Ozgur Sinanoglu |
Revival of partial scan: Test cube analysis driven conversion of flip-flops. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Irith Pomeranz |
Static test compaction for delay fault test sets consisting of broadside and skewed-load tests. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Kameshwar Chandrasekar, Surendra Bommu, Sanjay Sengupta |
Low Coverage Analysis using dynamic un-testability debug in ATPG. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Sreenivas Gangadhar, Spyros Tragoudas |
An analytical method for estimating SET propagation. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Hideo Okawara |
Practical signal processing at mixed signal test venues - Trend removal, noise reduction, wideband signal capturing -. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Kanad Basu, Prabhat Mishra |
Efficient trace data compression using statically selected dictionary. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Jesus Moreno, VÃctor H. Champac, Michel Renovell |
A new methodology for realistic open defect detection probability evaluation under process variations. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Samah Mohamed Saeed, Ozgur Sinanoglu |
Expedited response compaction for scan power reduction. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Nik Sumikawa, Dragoljub Gagi Drmanac, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir |
Understanding customer returns from a test perspective. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Kyoung Youn Cho, Rajagopalan Srinivasan |
A scan cell architecture for inter-clock at-speed delay testing. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Suraj Sindia, Vishwani D. Agrawal, Virendra Singh |
Non-linear analog circuit test and diagnosis under process variation using V-Transform coefficients. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Seongmoon Wang |
An efficient method to screen resistive opens under presence of process variation. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Kee Sup Kim, Rob Roy |
Apprentice - VTS edition: Season 4. |
VTS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Tomokazu Yoneda, Michiko Inoue, Yasuo Sato, Hideo Fujiwara |
Thermal-uniformity-aware X-filling to reduce temperature-induced delay variation for accurate at-speed testing. |
VTS |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Sandeep Bhatia |
Low power compression architecture. |
VTS |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Takumi Uezono, Tomoyuki Takahashi, Michihiro Shintani, Kazumi Hatayama, Kazuya Masu, Hiroyuki Ochi, Takashi Sato |
Path clustering for adaptive test. |
VTS |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Cihan Tunc, Mehdi Baradaran Tahoori |
On-the-fly variation tolerant mapping in crossbar nano-architectures. |
VTS |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Haralampos-G. D. Stratigopoulos |
Special session 12A: Panel adaptive analog test: Feasibility and opportunities ahead. |
VTS |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Zhen Chen, Sharad C. Seth, Dong Xiang |
A novel hybrid delay testing scheme with low test power, volume, and time. |
VTS |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Amit Sabne, Rajesh Tiwari, Abhijeet Shrivastava, Srivaths Ravi, Rubin A. Parekhji |
A generic low power scan chain wrapper for designs using scan compression. |
VTS |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Mingjing Chen, Alex Orailoglu |
VDDmin test optimization for overscreening minimization through adaptive scan chain masking. |
VTS |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Kee Sup Kim |
Panel 4A: Apprentice - VTS edition: Season 3. |
VTS |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Jaeyong Chung, Joonsung Park, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo |
Reducing test time and area overhead of an embedded memory array built-in repair analyzer with optimal repair rate. |
VTS |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Wing Chiu Tam, R. D. (Shawn) Blanton, Wojciech Maly |
Evaluating yield and testing impact of sub-wavelength lithography. |
VTS |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Karim Arabi |
Special session 6C: New topic mixed-signal test impact to SoC commercialization. |
VTS |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Irith Pomeranz, Sudhakar M. Reddy |
On multiple bridging faults. |
VTS |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Bozena Kaminska, I. L. McWalter |
Special session 9B: New topic test facilities and infrastructure in Canada. |
VTS |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | K. Arnold |
Adaptive test delivers wide range of sophisticated test solutions. |
VTS |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Marcello Coppola |
3D self testing with Spidergon STNoC. |
VTS |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | |
28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA |
VTS |
2010 |
DBLP BibTeX RDF |
|
| 1 | Ilia Polian |
Special session 4B: Panel low-power test and noise-aware test: Foes or friends? |
VTS |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Chien-Chih Yu, John P. Hayes |
Scalable and accurate estimation of probabilistic behavior in sequential circuits. |
VTS |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Swarup Bhunia, Anand Raghunathan |
Special session 11B: Hot topic hardware security: Design, test and verification issues. |
VTS |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Laung-Terng Wang, Nur A. Touba, Zhigang Jiang, Shianling Wu, Jiun-Lang Huang, James Chien-Mo Li |
CSER: BISER-based concurrent soft-error resilience. |
VTS |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Rubin A. Parekhji |
Innovative practices session 1C: Innovative practices in RF test. |
VTS |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Pierre Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine |
Detecting NBTI induced failures in SRAM core-cells. |
VTS |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Ke Peng, Jason Thibodeau, Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor |
A novel hybrid method for SDD pattern grading and selection. |
VTS |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Smriti Gupta |
Innovative practices session 5C: Post-silicon debug. |
VTS |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Zhen Chen, Dong Xiang |
Low-capture-power at-speed testing using partial launch-on-capture test scheme. |
VTS |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Xuan-Lun Huang, Jiun-Lang Huang |
An ADC/DAC loopback testing methodology by DAC output offsetting and scaling. |
VTS |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Po-Yuan Chen, Cheng-Wen Wu, Ding-Ming Kwai |
On-chip testing of blind and open-sleeve TSVs for 3D IC before bonding. |
VTS |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Irith Pomeranz, Sudhakar M. Reddy |
Forming multi-cycle tests for delay faults by concatenating broadside tests. |
VTS |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | J. Hu |
Overview of flexible electronics from ITRI's viewpoint. |
VTS |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Sandip Ray, Jayanta Bhadra |
Innovative practices session 7C: Verification and testing challenges in high-level synthesis. |
VTS |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Rajesh Mittal, Adesh Sontakke, Rubin A. Parekhji |
Test time reduction using parallel RF test techniques. |
VTS |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Haralampos-G. D. Stratigopoulos |
Special session 4C: Thesis research poster session. |
VTS |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Karim Arabi |
Power noise and its impact on production test and validation of SoC devices. |
VTS |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Janine Chen, Jing Zeng, Li-C. Wang, Jeff Rearick, Michael Mateja |
Selecting the most relevant structural Fmax for system Fmax correlation. |
VTS |
2010 |
DBLP DOI BibTeX RDF |
|
![[Valid RSS]](Pics/valid-rss.png "Validate my RSS feed")