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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
The graphs summarize 3 occurrences of 3 keywords
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Results
Found 5 publication records. Showing 5 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Yuhai Ma, Wanchun Shi |
Intelligent Analysis and Off-Line Debugging of VLSI Device Test Programs.  |
J. Electronic Testing  |
1999 |
DBLP DOI BibTeX RDF |
error type, off-line debugging environment, FCE (Fuzzy Comprehensive Evaluation), reference set, evaluation space, evaluation factor, evaluation remark, test entity, relevance coefficient, fuzzy set, fuzzy relation, test program |
| 1 | Yuhai Ma, Wanchun Shi |
OLDEVDTP: A Novel Environment for Off-Line Debugging of VLSI Device Test Programs. |
ITC |
1997 |
DBLP DOI BibTeX RDF |
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| 1 | Yuhai Ma, Wanchun Shi |
A Novel Approach to the Analysis of VLSI Device Test Programs. |
ITC |
1996 |
DBLP DOI BibTeX RDF |
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| 1 | Yuning Sun, Xiaoming Wang, Wanchun Shi |
ICTSSE: An object-oriented IC test software supporting environment. |
J. Comput. Sci. Technol. |
1995 |
DBLP DOI BibTeX RDF |
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| 1 | Yuning Sun, Xiaoming Wang, Wanchun Shi |
An Intelligent Software-Integrated Environment of IC Testing. |
ITC |
1994 |
DBLP DOI BibTeX RDF |
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Displaying result #1 - #5 of 5 (100 per page; Change: )
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