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Publications of "William J. Roesch" ( http://dblp.L3S.de/Authors/William_J._Roesch )

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Publication years (Num. hits)
2001-2012 (12)
Publication types (Num. hits)
article(12)
Venues (Conferences, Journals, ...)
Microelectronics Reliability(12)
Authors
William J. Roesch(12) Dorothy June M. Hamada(4) David Littleton(2) Steve Brockett(1) Suwanna Jittinorasett(1)
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Found 12 publication records. Showing 12 according to the selection in the facets
Hits ?▲ Authors Title Venue Year Link Author keywords
1William J. Roesch, Dorothy June M. Hamada, David Littleton Introducing a scale structure to correlate quality and reliability. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1David Littleton, Dorothy June M. Hamada, William J. Roesch Drainage ratio impact on void creation in gold interconnect. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1William J. Roesch The ROCS Workshop and 25 years of compound semiconductor reliability. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1William J. Roesch Forensic characterization of thin film resistor degradation. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Dorothy June M. Hamada, William J. Roesch A wafer-level approach to device lifetesting. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1William J. Roesch, Steve Brockett Field returns, a source of natural failure mechanisms. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
1William J. Roesch Historical review of compound semiconductor reliability. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
1William J. Roesch Compound semiconductor activation energy in humidity. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
1William J. Roesch, Dorothy June M. Hamada Metal defect yield and reliability relationships. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
1William J. Roesch, Suwanna Jittinorasett Cycling copper flip chip interconnects. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
1William J. Roesch Methods of reducing defects in GaAs ICs. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
1William J. Roesch Volume impacts on GaAs reliability improvement. Search on Bibsonomy Microelectronics Reliability The full citation details ... 2001 DBLP  DOI  BibTeX  RDF
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