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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
The graphs summarize 16 occurrences of 16 keywords
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Results
Found 20 publication records. Showing 20 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Coimbatore Chandersekaran, William R. Simpson |
A Multi-tiered Approach to Enterprise Support Services.  |
HCI  |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | Ebrima N. Ceesay, Coimbatore Chandersekaran, William R. Simpson |
An authentication model for delegation, attribution and least privilege. |
PETRA |
2010 |
DBLP DOI BibTeX RDF |
WS-*, security assertion markup language (SAML), authentication, authorization, delegation, public key infrastructure, attribution, credentialing, least privilege |
| 1 | John W. Sheppard, William R. Simpson |
Managing Conflict in System Diagnosis. |
IEEE Computer |
1998 |
DBLP DOI BibTeX RDF |
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| 1 | William R. Simpson |
Enough is enough already. |
ITC |
1998 |
DBLP DOI BibTeX RDF |
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| 1 | William R. Simpson |
Ethics, Professionalism and Accountability in Testing. |
ITC |
1997 |
DBLP DOI BibTeX RDF |
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| 1 | William R. Simpson |
The Key to Concurrent Engineering is Design Tools. |
ITC |
1996 |
DBLP DOI BibTeX RDF |
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| 1 | John W. Sheppard, William R. Simpson |
Improving the accuracy of diagnostics provided by fault dictionaries. |
VTS |
1996 |
DBLP DOI BibTeX RDF |
diagnostics accuracy improvement, digital circuit diagnosis, information flow model, VLSI, fault diagnosis, logic testing, integrated circuit testing, automatic testing, circuit analysis computing, digital integrated circuits, fault dictionaries, nearest neighbor classification |
| 1 | William R. Simpson |
Cutting the Cost of Test; the Value-added Way. |
ITC |
1995 |
DBLP DOI BibTeX RDF |
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| 1 | William R. Simpson |
A D&T Special Report: Defining ATLAS 2000. |
IEEE Design & Test of Computers |
1994 |
DBLP BibTeX RDF |
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| 1 | William R. Simpson, John W. Sheppard |
Fault Isolation in an Integrated Diagnostic Environment. |
IEEE Design & Test of Computers |
1993 |
DBLP DOI BibTeX RDF |
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| 1 | John W. Sheppard, William R. Simpson |
Performing Effective Fault Isolation in Integrated Diagnostics. |
IEEE Design & Test of Computers |
1993 |
DBLP DOI BibTeX RDF |
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| 1 | William R. Simpson, John W. Sheppard |
The Impact of Commercial Off-The-Shelf (COTS) Equipment on System Test and Diagnosis. |
ITC |
1993 |
DBLP DOI BibTeX RDF |
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| 1 | John W. Sheppard, William R. Simpson |
Applying Testability Analysis for Integrated Diagnostics. |
IEEE Design & Test of Computers |
1992 |
DBLP DOI BibTeX RDF |
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| 1 | William R. Simpson, John W. Sheppard |
System Testability Assessment for Integrated Diagnostics. |
IEEE Design & Test of Computers |
1992 |
DBLP DOI BibTeX RDF |
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| 1 | William R. Simpson, John W. Sheppard |
System Perspective on Diagnostic Testing. |
ITC |
1992 |
DBLP DOI BibTeX RDF |
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| 1 | John W. Sheppard, William R. Simpson |
A Mathematical Model for Integrated Diagnostics. |
IEEE Design & Test of Computers |
1991 |
DBLP DOI BibTeX RDF |
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| 1 | William R. Simpson, John W. Sheppard |
System Complexity and Integrated Diagnostics. |
IEEE Design & Test of Computers |
1991 |
DBLP DOI BibTeX RDF |
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| 1 | William R. Simpson, John W. Sheppard |
An Intelligent Approach to Automatic Test Equipment. |
ITC |
1991 |
DBLP DOI BibTeX RDF |
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| 1 | John W. Sheppard, William R. Simpson |
Using a Competitive Learning Neural Network to Evaluate Software Complexity. |
SIGSMALL/PC Symposium |
1990 |
DBLP DOI BibTeX RDF |
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| 1 | John W. Sheppard, William R. Simpson |
Functional path analysis: an approach to software verification. |
ACM Conference on Computer Science |
1988 |
DBLP DOI BibTeX RDF |
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Displaying result #1 - #20 of 20 (100 per page; Change: )
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