|
|
|
|
Venues (Conferences, Journals, ...)
|
|
|
GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
No Growbag Graphs found.
|
|
|
|
|
Results
Found 6 publication records. Showing 6 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Bin Zhou, Liyi Xiao, Yizheng Ye, Xin-chun Wu, Bei Cao |
Test Pattern Generation Based on Multi-TRC Scan Architecture for Reducing Test Cost.  |
J. Low Power Electronics  |
2012 |
DBLP BibTeX RDF |
|
| 1 | Xin-chun Wu, Jinxiang Wang, Bin Zhou, Zhigang Mao, Zhiqiang Gao |
Companding schemes based on transforming signal statistics into trigonal distributions for PAPR reduction in OFDM systems. |
Int. J. Communication Systems |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Bin Zhou, Liyi Xiao, Yizheng Ye, Xin-chun Wu |
Optimization of Test Power and Data Volume in BIST Scheme Based on Scan Slice Overlapping. |
J. Electronic Testing |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Bin Zhou, Yizheng Ye, Zhao-lin Li, Jianwei Zhang, Xin-chun Wu, Rui Ke |
A test set embedding approach based on twisted-ring counter with few seeds. |
Integration |
2010 |
DBLP DOI BibTeX RDF |
|
| 1 | Bin Zhou, Yizheng Ye, Zhao-lin Li, Xin-chun Wu, Rui Ke |
A new low power test pattern generator using a variable-length ring counter. |
ISQED |
2009 |
DBLP DOI BibTeX RDF |
|
| 1 | Bin Zhou, Yizheng Ye, Xin-chun Wu, Zhao-lin Li |
Reduction of Test Power and Data Volume in BIST Scheme based on Scan Slice Overlapping. |
ISCAS |
2009 |
DBLP DOI BibTeX RDF |
|
Displaying result #1 - #6 of 6 (100 per page; Change: )
|
|
![[Valid RSS]](Pics/valid-rss.png "Validate my RSS feed")