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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 3 occurrences of 2 keywords
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Results
Found 20 publication records. Showing 20 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Jiapeng Zheng, Wei Li, Xueqing Lu, Yuhua Cheng, Yangyuan Wang |
A low power and small area all digital delay-locked loop based on ring oscillator architecture.  |
SCIENCE CHINA Information Sciences  |
2012 |
DBLP DOI BibTeX RDF |
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| 1 | Lingjuan Wu, Jennifer Trezzo, Diba Mirza, Paul Roberts, Jules Jaffe, Yangyuan Wang, Ryan Kastner |
Designing an Adaptive Acoustic Modem for Underwater Sensor Networks. |
Embedded Systems Letters |
2012 |
DBLP DOI BibTeX RDF |
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| 1 | Zhihua Dong, Jinyan Wang, C. P. Wen, Shenghou Liu, Rumin Gong, Min Yu, Yilong Hao, Fujun Xu, Bo Shen, Yangyuan Wang |
High temperature induced failure in Ti/Al/Ni/Au Ohmic contacts on AlGaN/GaN heterostructure. |
Microelectronics Reliability |
2012 |
DBLP DOI BibTeX RDF |
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| 1 | YanDong He, Xing Zhang, Yangyuan Wang |
Process optimization of plasma nitridation SiON for 65 nm node gate dielectrics. |
SCIENCE CHINA Information Sciences |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | Yangyuan Wang |
The driving force for development of IC and system in future: Reducing the power consumption and improving the ratio of performance to power consumption. |
SCIENCE CHINA Information Sciences |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | Ru Huang, Runsheng Wang, Changze Liu, Liangliang Zhang, Jing Zhuge, Yu Tao, Jinbin Zou, Yuchao Liu, Yangyuan Wang |
HCI and NBTI induced degradation in gate-all-around silicon nanowire transistors. |
Microelectronics Reliability |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | Ru Huang, Runsheng Wang, Jing Zhuge, Changze Liu, Tao Yu, Liangliang Zhang, Xin Huang, Yujie Ai, Jinbin Zou, Yuchao Liu, Jiewen Fan, Huailin Liao, Yangyuan Wang |
Characterization and analysis of gate-all-around Si nanowire transistors for extreme scaling. |
CICC |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | Jin He, Xing Zhang, Yangyuan Wang, Xuemei Xi, Mansun Chan, Chenming Hu |
Retraction notice to "Normalized mutual integral difference operator: A novel experimental method for extracting threshold voltage of MOSFETs" [Microelectronics Journal 33 (2002) 667-670]. |
Microelectronics Journal |
2010 |
DBLP DOI BibTeX RDF |
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| 1 | Ming Li, Jinfeng Kang, Yangyuan Wang |
A novel voltage-type sense amplifier for low-power nonvolatile memories. |
SCIENCE CHINA Information Sciences |
2010 |
DBLP DOI BibTeX RDF |
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| 1 | Wei Liu, Wei Li, Peng Ren, Chinglong Lin, Shengdong Zhang, Yangyuan Wang |
A PVT Tolerant 10 to 500 MHz All-Digital Phase-Locked Loop With Coupled TDC and DCO. |
J. Solid-State Circuits |
2010 |
DBLP DOI BibTeX RDF |
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| 1 | Le Ye, Huailin Liao, Fei Song, Jiang Chen, Chen Li, Jinshu Zhao, Ruiqiang Liu, Chuan Wang, Congyin Shi, Junhua Liu, Ru Huang, Yangyuan Wang |
A Single-Chip CMOS UHF RFID Reader Transceiver for Chinese Mobile Applications. |
J. Solid-State Circuits |
2010 |
DBLP DOI BibTeX RDF |
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| 1 | Jian Wang, Wenhua Wang, Ru Huang, Yunpeng Pei, Shoubin Xue, Xin'an Wang, Chunhui Fan, Yangyuan Wang |
Deteriorated radiation effects impact on the characteristics of MOS transistors with multi-finger configuration. |
Microelectronics Reliability |
2010 |
DBLP DOI BibTeX RDF |
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| 1 | Ru Huang, HanMing Wu, Jinfeng Kang, DeYuan Xiao, XueLong Shi, Xia An, Yu Tian, Runsheng Wang, Liangliang Zhang, Xing Zhang, Yangyuan Wang |
Challenges of 22 nm and beyond CMOS technology. |
Science in China Series F: Information Sciences |
2009 |
DBLP DOI BibTeX RDF |
22 nm technology node, device architectures, metal gate/high K dielectrics, ultra low K dielectrics, CMOS technology |
| 1 | Yangyuan Wang, Xing Zhang, Xiaoyan Liu, Ru Huang |
Novel devices and process for 32 nm CMOS technology and beyond. |
Science in China Series F: Information Sciences |
2008 |
DBLP DOI BibTeX RDF |
high-k, non-planar MOSFET, quasi-ballistic transport, CMOS technology, metal gate |
| 1 | Teng Lin, Jianhua Feng, Yangyuan Wang |
A New Test Data Compression Scheme for Multi-scan Designs. |
ISVLSI |
2007 |
DBLP DOI BibTeX RDF |
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| 1 | Jin He, Xing Zhang, Ganggang Zhang, Mansun Chan, Yangyuan Wang |
A Complete Carrier-Based Non-Charge-Sheet Analytic Theory for Nano-Scale Undoped Surrounding-Gate MOSFETs. |
ISQED |
2006 |
DBLP DOI BibTeX RDF |
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| 1 | Jin He, Xing Zhang, Ganggang Zhang, Yangyuan Wang |
A Carrier-Based Analytic Model for Undoped (Lightly Doped) Ultra-Thin-Body Silicon-on-Insulator (UTB-SOI) MOSFETs. |
ISQED |
2006 |
DBLP DOI BibTeX RDF |
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| 1 | Ru Huang, Jinyan Wang, Jin He, Min Yu, Xing Zhang, Yangyuan Wang |
Hot carrier degradation behavior in SOI dynamic-threshold-voltage nMOSFET's (n-DTMOSFET) measured by gated-diode configuration. |
Microelectronics Reliability |
2003 |
DBLP DOI BibTeX RDF |
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| 1 | Jin He, Xing Zhang, Ru Huang, Yangyuan Wang |
Application of forward gated-diode R-G current method in extracting F-N stress-induced interface traps in SOI NMOSFETs. |
Microelectronics Reliability |
2002 |
DBLP DOI BibTeX RDF |
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| 1 | Jin He, Xing Zhang, Ru Huang, Yangyuan Wang |
Extraction of the lateral distribution of interface traps in MOSFETs by a novel combined gated-diode technique. |
Microelectronics Reliability |
2001 |
DBLP DOI BibTeX RDF |
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