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Publications of "Yiorgos Makris" ( http://dblp.L3S.de/Authors/Yiorgos_Makris )

  Author page on DBLP  Author page in RDF  Community of Yiorgos Makris in ASPL-2

Publication years (Num. hits)
1998-2003 (23) 2004-2005 (16) 2006-2008 (20) 2009-2010 (16) 2011-2012 (14)
Publication types (Num. hits)
article(24) inproceedings(65)
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The graphs summarize 33 occurrences of 27 keywords

Results
Found 89 publication records. Showing 89 according to the selection in the facets
Hits ? Authors Title Venue Year Link Author keywords
1Eric Love, Yier Jin, Yiorgos Makris Proof-Carrying Hardware Intellectual Property: A Pathway to Trusted Module Acquisition. Search on Bibsonomy IEEE Transactions on Information Forensics and Security The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Nathan Kupp, Yiorgos Makris Applying the Model-View-Controller Paradigm to Adaptive Test. Search on Bibsonomy IEEE Design & Test of Computers The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
1Yier Jin, Dzmitry Maliuk, Yiorgos Makris Post-deployment trust evaluation in wireless cryptographic ICs. Search on Bibsonomy DATE The full citation details ... 2012 DBLP  BibTeX  RDF
1Michail Maniatakos, Naghmeh Karimi, Chandra Tirumurti, Abhijit Jas, Yiorgos Makris Instruction-Level Impact Analysis of Low-Level Faults in a Modern Microprocessor Controller. Search on Bibsonomy IEEE Trans. Computers The full citation details ... 2011 DBLP  DOI  BibTeX  RDF instruction-level error, microprocessor controller, Fault simulation, concurrent error detection
1Naghmeh Karimi, Michail Maniatakos, Abhijit Jas, Chandra Tirumurti, Yiorgos Makris Workload-Cognizant Concurrent Error Detection in the Scheduler of a Modern Microprocessor. Search on Bibsonomy IEEE Trans. Computers The full citation details ... 2011 DBLP  DOI  BibTeX  RDF scheduler, microprocessor, invariance, Concurrent error detection
1Alfredo Benso, Yiorgos Makris, Pinaki Mazumder Guest Editors' Introduction: Special Section on Chips and Architectures for Emerging Technologies and Applications. Search on Bibsonomy IEEE Trans. Computers The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Nathan Kupp, He Huang, Yiorgos Makris, Petros Drineas Improving Analog and RF Device Yield through Performance Calibration. Search on Bibsonomy IEEE Design & Test of Computers The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Michail Maniatakos, Chandra Tirumurti, Abhijit Jas, Yiorgos Makris AVF Analysis Acceleration via Hierarchical Fault Pruning. Search on Bibsonomy European Test Symposium The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Michail Maniatakos, Yiorgos Makris, Prabhakar Kudva, Bruce M. Fleischer Exponent monitoring for low-cost concurrent error detection in FPU control logic. Search on Bibsonomy VTS The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Eric Love, Yier Jin, Yiorgos Makris Enhancing security via provably trustworthy hardware intellectual property. Search on Bibsonomy HOST The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Nathan Kupp, Mustapha Slamani, Yiorgos Makris Correlating inline data with final test outcomes in analog/RF devices. Search on Bibsonomy DATE The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Yier Jin, Yiorgos Makris PSCML: Pseudo-Static Current Mode Logic. Search on Bibsonomy ICECS The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Nathan Kupp, Haralampos-G. D. Stratigopoulos, Petros Drineas, Yiorgos Makris On proving the efficiency of alternative RF tests. Search on Bibsonomy ICCAD The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Yier Jin, Yiorgos Makris Is single-scheme Trojan prevention sufficient? Search on Bibsonomy ICCD The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Haralampos-G. D. Stratigopoulos, Petros Drineas, Mustapha Slamani, Yiorgos Makris RF Specification Test Compaction Using Learning Machines. Search on Bibsonomy IEEE Trans. VLSI Syst. The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Yier Jin, Yiorgos Makris Hardware Trojans in Wireless Cryptographic ICs. Search on Bibsonomy IEEE Design & Test of Computers The full citation details ... 2010 DBLP  DOI  BibTeX  RDF hardware Trojan, wireless cryptographic IC, statistical analysis, design and test
1Nathan Kupp, He Huang, Petros Drineas, Yiorgos Makris Post-production performance calibration in analog/RF devices. Search on Bibsonomy ITC The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Dzmitry Maliuk, Haralampos-G. D. Stratigopoulos, He Huang, Yiorgos Makris Analog neural network design for RF built-in self-test. Search on Bibsonomy ITC The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Michail Maniatakos, Yiorgos Makris Workload-driven selective hardening of control state elements in modern microprocessors. Search on Bibsonomy VTS The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Yier Jin, Nathan Kupp, Yiorgos Makris DFTT: Design for Trojan Test. Search on Bibsonomy ICECS The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Dzmitry Maliuk, Haralampos-G. D. Stratigopoulos, Yiorgos Makris An analog VLSI multilayer perceptron and its application towards built-in self-test in analog circuits. Search on Bibsonomy IOLTS The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Feng Shi, Yiorgos Makris Enhancing Simulation Accuracy through Advanced Hazard Detection in Asynchronous Circuits. Search on Bibsonomy IEEE Trans. Computers The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Sobeeh Almukhaizim, Feng Shi, Eric Love, Yiorgos Makris Soft-Error Tolerance and Mitigation in Asynchronous Burst-Mode Circuits. Search on Bibsonomy IEEE Trans. VLSI Syst. The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Nathan Kupp, Petros Drineas, Mustapha Slamani, Yiorgos Makris On Boosting the Accuracy of Non-RF to RF Correlation-Based Specification Test Compaction. Search on Bibsonomy J. Electronic Testing The full citation details ... 2009 DBLP  BibTeX  RDF
1Yiorgos Makris, Haralampos-G. D. Stratigopoulos Special Session 7C: TTTC 2009 Best Doctoral Thesis Contest. Search on Bibsonomy VTS The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Michail Maniatakos, Naghmeh Karimi, Chandra Tirumurti, Abhijit Jas, Yiorgos Makris Instruction-Level Impact Comparison of RT- vs. Gate-Level Faults in a Modern Microprocessor Controller. Search on Bibsonomy VTS The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Yier Jin, Nathan Kupp, Yiorgos Makris Experiences in Hardware Trojan Design and Implementation. Search on Bibsonomy HOST The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Haralampos-G. D. Stratigopoulos, Salvador Mir, Yiorgos Makris Enrichment of limited training sets in machine-learning-based analog/RF test. Search on Bibsonomy DATE The full citation details ... 2009 DBLP  BibTeX  RDF
1Yiorgos Makris Workload-Cognizant Impact Analysis and its Applications in Error Detection and Tolerance in Modern Microprocessors. Search on Bibsonomy DFT The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Naghmeh Karimi, Michail Maniatakos, Chandra Tirumurti, Abhijit Jas, Yiorgos Makris Impact analysis of performance faults in modern microprocessors. Search on Bibsonomy ICCD The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
1Sobeeh Almukhaizim, Yiorgos Makris Soft Error Mitigation Through Selective Addition of Functionally Redundant Wires. Search on Bibsonomy IEEE Transactions on Reliability The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Haralampos-G. D. Stratigopoulos, Yiorgos Makris Error Moderation in Low-Cost Machine-Learning-Based Analog/RF Testing. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Naghmeh Karimi, Michail Maniatakos, Abhijit Jas, Yiorgos Makris On the Correlation between Controller Faults and Instruction-Level Errors in Modern Microprocessors. Search on Bibsonomy ITC The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Nathan Kupp, Petros Drineas, Mustapha Slamani, Yiorgos Makris Confidence Estimation in Non-RF to RF Correlation-Based Specification Test Compaction. Search on Bibsonomy European Test Symposium The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1James Dardig, Haralampos-G. D. Stratigopoulos, Eric Stern, Mark Reed, Yiorgos Makris A Statistical Approach to Characterizing and Testing Functionalized Nanowires. Search on Bibsonomy VTS The full citation details ... 2008 DBLP  DOI  BibTeX  RDF testing, statistical analysis, nanowires
1Yier Jin, Yiorgos Makris Hardware Trojan Detection Using Path Delay Fingerprint. Search on Bibsonomy HOST The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Michail Maniatakos, Naghmeh Karimi, Yiorgos Makris, Abhijit Jas, Chandra Tirumurti Design and Evaluation of a Timestamp-Based Concurrent Error Detection Method (CED) in a Modern Microprocessor Controller. Search on Bibsonomy DFT The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Sobeeh Almukhaizim, Yiorgos Makris, Yu-Shen Yang, Andreas G. Veneris On the Minimization of Potential Transient Errors and SER in Logic Circuits Using SPFD. Search on Bibsonomy IOLTS The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
1Sobeeh Almukhaizim, Yiorgos Makris Concurrent Error Detection Methods for Asynchronous Burst-Mode Machines. Search on Bibsonomy IEEE Trans. Computers The full citation details ... 2007 DBLP  DOI  BibTeX  RDF asynchronous burst-mode machines, error-detecting codes, Concurrent error detection, Berger code
1Yiorgos Makris, Alex Orailoglu On the identification of modular test requirements for low cost hierarchical test path construction. Search on Bibsonomy Integration The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
1Haralampos-G. D. Stratigopoulos, Petros Drineas, Mustapha Slamani, Yiorgos Makris Non-RF to RF Test Correlation Using Learning Machines: A Case Study. Search on Bibsonomy VTS The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
1Haralampos-G. D. Stratigopoulos, Yiorgos Makris Concurrent detection of erroneous responses in linear analog circuits. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
1Sobeeh Almukhaizim, Petros Drineas, Yiorgos Makris Entropy-driven parity-tree selection for low-overhead concurrent error detection in finite state machines. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
1Sobeeh Almukhaizim, Yiorgos Makris, Yu-Shen Yang, Andreas G. Veneris Seamless Integration of SER in Rewiring-Based Design Space Exploration. Search on Bibsonomy ITC The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
1Feng Shi, Yiorgos Makris A Transistor-Level Test Strategy for C^2MOS MOUSETRAP Asynchronous Pipelines. Search on Bibsonomy ASYNC The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
1Gennette Gill, Ankur Agiwal, Montek Singh, Feng Shi, Yiorgos Makris Low-Overhead Testing of Delay Faults in High-Speed Asynchronous Pipelines. Search on Bibsonomy ASYNC The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
1Andreas G. Veneris, Yiorgos Makris Session Abstract. Search on Bibsonomy VTS The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
1Haralampos-G. D. Stratigopoulos, Yiorgos Makris Bridging the Accuracy of Functional and Machine-Learning-Based Mixed-Signal Testing. Search on Bibsonomy VTS The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
1Sobeeh Almukhaizim, Yiorgos Makris Berger code-based concurrent error detection in asynchronous burst-mode machines. Search on Bibsonomy DATE The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
1Feng Shi, Yiorgos Makris Testing delay faults in asynchronous handshake circuits. Search on Bibsonomy ICCAD The full citation details ... 2006 DBLP  DOI  BibTeX  RDF test generation, asynchronous circuits, delay faults, handshake circuits
1Sobeeh Almukhaizim, Petros Drineas, Yiorgos Makris Compaction-based concurrent error detection for digital circuits. Search on Bibsonomy Microelectronics Journal The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
1Haralampos-G. D. Stratigopoulos, Yiorgos Makris Nonlinear decision boundaries for testing analog circuits. Search on Bibsonomy IEEE Trans. on CAD of Integrated Circuits and Systems The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
1Feng Shi, Yiorgos Makris, Steven M. Nowick, Montek Singh Test generation for ultra-high-speed asynchronous pipelines. Search on Bibsonomy ITC The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
1Haralampos-G. D. Stratigopoulos, Yiorgos Makris Generating decision regions in analog measurement spaces. Search on Bibsonomy ACM Great Lakes Symposium on VLSI The full citation details ... 2005 DBLP  DOI  BibTeX  RDF implicit functional test, neural networks, analog circuits
1Feng Shi, Yiorgos Makris SPIN-PAC: test compaction for speed-independent circuits. Search on Bibsonomy ASP-DAC The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
1Haralampos-G. D. Stratigopoulos, Yiorgos Makris Constructive Derivation of Analog Specification Test Criteria. Search on Bibsonomy VTS The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
1Sobeeh Almukhaizim, Yiorgos Makris Concurrent Error Detection in Asynchronous Burst-Mode Controllers. Search on Bibsonomy DATE The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
1Yiorgos Makris, Ismet Bayraktaroglu, Alex Orailoglu Enhancing reliability of RTL controller-datapath circuits via Invariant-based concurrent test. Search on Bibsonomy IEEE Transactions on Reliability The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
1Haralampos-G. D. Stratigopoulos, Yiorgos Makris An Analog Checker with Input-Relative Tolerance for Duplicate Signals. Search on Bibsonomy J. Electronic Testing The full citation details ... 2004 DBLP  DOI  BibTeX  RDF analog checkers, on-line test, analog test, concurrent test
1Sobeeh Almukhaizim, Petros Drineas, Yiorgos Makris Concurrent Error Detection for Combinational and Sequential Logic via Output Compaction. Search on Bibsonomy ISQED The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
1Feng Shi, Yiorgos Makris SPIN-SIM: Logic and Fault Simulation for Speed-Independent Circuits. Search on Bibsonomy ITC The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
1Feng Shi, Yiorgos Makris Fault simulation and random test generation for speed-independent circuits. Search on Bibsonomy ACM Great Lakes Symposium on VLSI The full citation details ... 2004 DBLP  DOI  BibTeX  RDF random test pattern generation, fault simulation, asynchronous circuits, speed-independent circuits
1Sobeeh Almukhaizim, Petros Drineas, Yiorgos Makris Cost-Driven Selection of Parity Trees. Search on Bibsonomy VTS The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
1Sobeeh Almukhaizim, Petros Drineas, Yiorgos Makris On Concurrent Error Detection with Bounded Latency in FSMs. Search on Bibsonomy DATE The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
1Feng Shi, Yiorgos Makris SPIN-TEST: automatic test pattern generation for speed-independent circuits. Search on Bibsonomy ICCAD The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
1Feng Shi, Sobeeh Almukhaizim, Pey-Chang Lin, Yiorgos Makris Compiler-Based Frame Formation for Static Optimization. Search on Bibsonomy ICCD The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
1Petros Drineas, Yiorgos Makris SPaRe: selective partial replication for concurrent fault-detection in FSMs. Search on Bibsonomy IEEE T. Instrumentation and Measurement The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
1Petros Drineas, Yiorgos Makris Concurrent Fault Detection in Random Combinational Logic. Search on Bibsonomy ISQED The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
1Haralampos-G. D. Stratigopoulos, Yiorgos Makris Concurrent Error Detection in Linear Analog Circuits Using State Estimation. Search on Bibsonomy ITC The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
1Haralampos-G. D. Stratigopoulos, Yiorgos Makris An Analog Checker with Dynamically Adjustable Error Threshold for Fully Differential Circuits. Search on Bibsonomy VTS The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
1Petros Drineas, Yiorgos Makris SPaRe: Selective Partial Replication for Concurrent Fault Detection in FSMs. Search on Bibsonomy VLSI Design The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
1Petros Drineas, Yiorgos Makris Non-Intrusive Concurrent Error Detection in FSMs through State/Output Compaction and Monitoring via Parity Trees. Search on Bibsonomy DATE The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
1Sobeeh Almukhaizim, Yiorgos Makris Fault Tolerant Design of Combinational and Sequential Logic Based on a Parity Check Code. Search on Bibsonomy DFT The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
1Konstantinos Rokas, Yiorgos Makris, Dimitris Gizopoulos Low Cost Convolutional Code Based Concurrent Error Detection in FSMs. Search on Bibsonomy DFT The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
1Haralampos-G. D. Stratigopoulos, Yiorgos Makris An Analog Checker With Input-Relative Tolerance for Duplicate Signals. Search on Bibsonomy IOLTS The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
1Sobeeh Almukhaizim, Petros Drineas, Yiorgos Makris On Compaction-Based Concurrent Error Detection. (PDF / PS) Search on Bibsonomy IOLTS The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
1Sobeeh Almukhaizim, Thomas Verdel, Yiorgos Makris Cost-Effective Graceful Degradation in Speculative Processor Subsystems: The Branch Prediction Case. Search on Bibsonomy ICCD The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
1Petros Drineas, Yiorgos Makris Independent Test Sequence Compaction through Integer Programming. Search on Bibsonomy ICCD The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
1Yiorgos Makris, Jamison Collins, Alex Orailoglu Fast Hierarchical Test Path Construction for Circuits with DFT-Free Controller-Datapath Interface. Search on Bibsonomy J. Electronic Testing The full citation details ... 2002 DBLP  DOI  BibTeX  RDF controller-datapath circuit, hierarchical test path, influence tables, transparency
1Petros Drineas, Yiorgos Makris Non-Intrusive Design of Concurrently Self-Testable FSMs. Search on Bibsonomy Asian Test Symposium The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
1Yiorgos Makris, Alex Orailoglu Test Requirement Analysis for Low Cost Hierarchical Test Path Construction. Search on Bibsonomy Asian Test Symposium The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
1Thomas Verdel, Yiorgos Makris Duplication-Based Concurrent Error Detection in Asynchronous Circuits: Shortcomings and Remedies. (PDF / PS) Search on Bibsonomy DFT The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
1Yiorgos Makris, Vishal Patel, Alex Orailoglu Efficient Transparency Extraction and Utilization in Hierarchical Test. Search on Bibsonomy VTS The full citation details ... 2001 DBLP  DOI  BibTeX  RDF
1Yiorgos Makris, Jamison Collins, Alex Orailoglu Fast hierarchical test path construction for DFT-free controller-datapath circuits. Search on Bibsonomy Asian Test Symposium The full citation details ... 2000 DBLP  DOI  BibTeX  RDF fast hierarchical test path construction, DFT-free controller-datapath circuits, transparency based scheme, locally generated vectors, global design test, influence tables, valid control state sequences, module testing, fault coverage levels, vector counts, logic testing, test generation, automatic test pattern generation, ATPG, computational cost reduction
1Yiorgos Makris, Ismet Bayraktaroglu, Alex Orailoglu Invariance-Based On-Line Test for RTL Controller-Datapath Circuits. Search on Bibsonomy VTS The full citation details ... 2000 DBLP  DOI  BibTeX  RDF
1Yiorgos Makris, Alex Orailoglu Channel-Based Behavioral Test Synthesis for Improved Module Reachability. Search on Bibsonomy DATE The full citation details ... 1999 DBLP  DOI  BibTeX  RDF
1Yiorgos Makris, Alex Orailoglu A Module Diagnosis and Design-for-Debug Methodology Based on Hierarchical Test Paths. (PDF / PS) Search on Bibsonomy DFT The full citation details ... 1999 DBLP  DOI  BibTeX  RDF
1Yiorgos Makris, Alex Orailoglu RTL Test Justification and Propagation Analysis for Modular Designs. Search on Bibsonomy J. Electronic Testing The full citation details ... 1998 DBLP  DOI  BibTeX  RDF RTL testability analysis, test justification, test propagation, DFT, modular design
1Yiorgos Makris, Alex Orailoglu DFT guidance through RTL test justification and propagation analysis. Search on Bibsonomy ITC The full citation details ... 1998 DBLP  DOI  BibTeX  RDF
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