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Found 16 publication records. Showing 16 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Youhua Shi, Nozomu Togawa, Masao Yanagisawa, Tatsuo Ohtsuki |
Robust Secure Scan Design Against Scan-Based Differential Cryptanalysis.  |
IEEE Trans. VLSI Syst.  |
2012 |
DBLP DOI BibTeX RDF |
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| 1 | Youhua Shi, Nozomu Togawa, Masao Yanagisawa, Tatsuo Ohtsuki |
Improved Launch for Higher TDF Coverage With Fewer Test Patterns. |
IEEE Trans. on CAD of Integrated Circuits and Systems |
2010 |
DBLP DOI BibTeX RDF |
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| 1 | Ryuta Nara, Hiroshi Atobe, Youhua Shi, Nozomu Togawa, Masao Yanagisawa, Tatsuo Ohtsuki |
State-dependent changeable scan architecture against scan-based side channel attacks. |
ISCAS |
2010 |
DBLP DOI BibTeX RDF |
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| 1 | Youhua Shi, Nozomu Togawa, Masao Yanagisawa, Tatsuo Ohtsuki |
X-Handling for Current X-Tolerant Compactors with More Unknowns and Maximal Compaction. |
IEICE Transactions |
2009 |
DBLP BibTeX RDF |
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| 1 | Kazuyuki Tanimura, Ryuta Nara, Shunitsu Kohara, Youhua Shi, Nozomu Togawa, Masao Yanagisawa, Tatsuo Ohtsuki |
Unified Dual-Radix Architecture for Scalable Montgomery Multiplications in GF(P) and GF(2n). |
IEICE Transactions |
2009 |
DBLP BibTeX RDF |
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| 1 | Youhua Shi, Nozomu Togawa, Masao Yanagisawa, Tatsuo Ohtsuki |
Design-for-secure-test for crypto cores. |
ITC |
2009 |
DBLP DOI BibTeX RDF |
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| 1 | Youhua Shi, Nozomu Togawa, Masao Yanagisawa, Tatsuo Ohtsuki |
A Unified Test Compression Technique for Scan Stimulus and Unknown Masking Data with No Test Loss. |
IEICE Transactions |
2008 |
DBLP DOI BibTeX RDF |
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| 1 | Youhua Shi, Nozomu Togawa, Masao Yanagisawa, Tatsuo Ohtsuki |
A Secure Test Technique for Pipelined Advanced Encryption Standard. |
IEICE Transactions |
2008 |
DBLP DOI BibTeX RDF |
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| 1 | Kazuyuki Tanimura, Ryuta Nara, Shunitsu Kohara, Kazunori Shimizu, Youhua Shi, Nozomu Togawa, Masao Yanagisawa, Tatsuo Ohtsuki |
Scalable unified dual-radix architecture for Montgomery multiplication in GF(P) and GF(2n). |
ASP-DAC |
2008 |
DBLP DOI BibTeX RDF |
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| 1 | Youhua Shi, Nozomu Togawa, Masao Yanagisawa, Tatsuo Ohtsuki |
GECOM: Test data compression combined with all unknown response masking. |
ASP-DAC |
2008 |
DBLP DOI BibTeX RDF |
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| 1 | Youhua Shi, Nozomu Togawa, Masao Yanagisawa, Tatsuo Ohtsuki |
Design for Secure Test - A Case Study on Pipelined Advanced Encryption Standard. |
ISCAS |
2007 |
DBLP DOI BibTeX RDF |
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| 1 | Youhua Shi, Nozomu Togawa, Shinji Kimura, Masao Yanagisawa, Tatsuo Ohtsuki |
Selective Low-Care Coding: A Means for Test Data Compression in Circuits with Multiple Scan Chains. |
IEICE Transactions |
2006 |
DBLP DOI BibTeX RDF |
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| 1 | Youhua Shi, Nozomu Togawa, Shinji Kimura, Masao Yanagisawa, Tatsuo Ohtsuki |
FCSCAN: an efficient multiscan-based test compression technique for test cost reduction. |
ASP-DAC |
2006 |
DBLP DOI BibTeX RDF |
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| 1 | Gang Zeng, Youhua Shi, Toshinori Takabatake, Masao Yanagisawa, Hideo Ito |
Low-Cost IP Core Test Using Multiple-Mode Loading Scan Chain and Scan Chain Clusters. |
DFT |
2006 |
DBLP DOI BibTeX RDF |
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| 1 | Youhua Shi, Nozomu Togawa, Masao Yanagisawa, Tatsuo Ohtsuki, Shinji Kimura |
Low Power Test Compression Technique for Designs with Multiple Scan Chain. |
Asian Test Symposium |
2005 |
DBLP DOI BibTeX RDF |
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| 1 | Youhua Shi, Shinji Kimura, Nozomu Togawa, Masao Yanagisawa, Tatsuo Ohtsuki |
Alternative Run-Length Coding through Scan Chain Reconfiguration for Joint Minimization of Test Data Volume and Power Consumption in Scan Test. |
Asian Test Symposium |
2004 |
DBLP DOI BibTeX RDF |
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