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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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Results
Found 5 publication records. Showing 5 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Bingxu Ning, Zhengxuan Zhang, Zhangli Liu, Zhiyuan Hu, Ming Chen, Dawei Bi, Shichang Zou |
Radiation-induced shallow trench isolation leakage in 180-nm flash memory technology.  |
Microelectronics Reliability  |
2012 |
DBLP DOI BibTeX RDF |
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| 1 | Zhiyuan Hu, Zhangli Liu, Hua Shao, Zhengxuan Zhang, Bingxu Ning, Ming Chen, Dawei Bi, Shichang Zou |
Impact of within-wafer process variability on radiation response. |
Microelectronics Journal |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | Bingxu Ning, Zhiyuan Hu, Zhengxuan Zhang, Zhangli Liu, Ming Chen, Dawei Bi, Shichang Zou |
The impact of total ionizing radiation on body effect. |
Microelectronics Journal |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | Zhangli Liu, Zhiyuan Hu, Zhengxuan Zhang, Hua Shao, Ming Chen, Dawei Bi, Bingxu Ning, Shichang Zou |
Comparison of TID response in core, input/output and high voltage transistors for flash memory. |
Microelectronics Reliability |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | Zhiyuan Hu, Zhangli Liu, Hua Shao, Zhengxuan Zhang, Bingxu Ning, Ming Chen, Dawei Bi, Shichang Zou |
Total ionizing dose effects in elementary devices for 180-nm flash technologies. |
Microelectronics Reliability |
2011 |
DBLP DOI BibTeX RDF |
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