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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 1 occurrences of 1 keywords
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Results
Found 3 publication records. Showing 3 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Kristof Croes, G. Cannatá, L. Zhao, Zsolt Tokei |
Study of copper drift during TDDB of intermetal dielectrics by using fully passivated MOS capacitors as test vehicle.  |
Microelectronics Reliability  |
2008 |
DBLP DOI BibTeX RDF |
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| 1 | Jin Guo, Antonis Papanikolaou, Michele Stucchi, Kristof Croes, Zsolt Tokei, Francky Catthoor |
A tool flow for predicting system level timing failures due to interconnect reliability degradation. |
ACM Great Lakes Symposium on VLSI |
2008 |
DBLP DOI BibTeX RDF |
system degradation, system level failures, interconnect reliability |
| 1 | Antonis Papanikolaou, Miguel Miranda, Hua Wang, Francky Catthoor, M. Satyakiran, Pol Marchal, Ben Kaczer, C. Bruynseraede, Zsolt Tokei |
Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design. |
VLSI-SoC |
2006 |
DBLP DOI BibTeX RDF |
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