Search results for "broadside test"

Found 8 publication records. Showing 8 according to the selection in the facets

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
3	Bo Yao, Irith Pomeranz, Sudhakar M. Reddy	Deterministic broadside test generation for transition path delay faults.	ACM Great Lakes Symposium on VLSI	2010	DBLP DOI BibTeX RDF	broadside test, deterministic test generation, path delay fault, transition fault
1	Ho Fai Ko, Nicola Nicolici	Automated Scan Chain Division for Reducing Shift and Capture Power During Broadside At-Speed Test.	IEEE Trans. on CAD of Integrated Circuits and Systems	2008	DBLP DOI BibTeX RDF
1	Hangkyu Lee, Irith Pomeranz, Sudhakar M. Reddy	On Complete Functional Broadside Tests for Transition Faults.	IEEE Trans. on CAD of Integrated Circuits and Systems	2008	DBLP DOI BibTeX RDF
1	Irith Pomeranz, Sudhakar M. Reddy	Scan-Based Delay Test Types and Their Effect on Power Dissipation During Test.	IEEE Trans. on CAD of Integrated Circuits and Systems	2008	DBLP DOI BibTeX RDF
1	Tsuyoshi Iwagaki, Satoshi Ohtake, Hideo Fujiwara	A New Test Generation Model for Broadside Transition Testing of Partial Scan Circuits.	VLSI-SoC	2006	DBLP DOI BibTeX RDF
1	Yung-Chieh Lin, Feng Lu, Kwang-Ting Cheng	Pseudofunctional testing.	IEEE Trans. on CAD of Integrated Circuits and Systems	2006	DBLP DOI BibTeX RDF
1	Irith Pomeranz, Sudhakar M. Reddy	Generation of Functional Broadside Tests for Transition Faults.	IEEE Trans. on CAD of Integrated Circuits and Systems	2006	DBLP DOI BibTeX RDF
1	Narendra Devta-Prasanna, Sudhakar M. Reddy, Arun Gunda, P. Krishnamurthy, Irith Pomeranz	Improved Delay Fault Coverage Using Subsets of Flip-flops to Launch Transitions.	Asian Test Symposium	2005	DBLP DOI BibTeX RDF

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