Search results for "broadside tests"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
3	Irith Pomeranz, Sudhakar M. Reddy	Expanded Definition of Functional Operation Conditions and its Effects on the Computation of Functional Broadside Tests.	VTS	2008	DBLP DOI BibTeX RDF	functional broadside tests, test generation, transition faults, reachable states, full-scan circuits
2	Irith Pomeranz	On Transition Fault Diagnosis Using Multicycle At-Speed Broadside Tests.	European Test Symposium	2011	DBLP DOI BibTeX RDF	Broadside tests, multicycle tests, fault diagnosis, transition faults
2	Irith Pomeranz, Sudhakar M. Reddy	Functional Broadside Tests Under an Expanded Definition of Functional Operation Conditions.	IEEE Trans. on CAD of Integrated Circuits and Systems	2009	DBLP DOI BibTeX RDF
2	Hangkyu Lee, Irith Pomeranz, Sudhakar M. Reddy	On Complete Functional Broadside Tests for Transition Faults.	IEEE Trans. on CAD of Integrated Circuits and Systems	2008	DBLP DOI BibTeX RDF
2	Irith Pomeranz, Sudhakar M. Reddy	Improving the Transition Fault Coverage of Functional Broadside Tests by Observation Point Insertion.	IEEE Trans. VLSI Syst.	2008	DBLP DOI BibTeX RDF
2	Irith Pomeranz, Sudhakar M. Reddy, Sandip Kundu	On Common-Mode Skewed-Load and Broadside Tests.	VLSI Design	2008	DBLP DOI BibTeX RDF
2	Irith Pomeranz, Sudhakar M. Reddy	Synthesis for Broadside Testability of Transition Faults.	VTS	2008	DBLP DOI BibTeX RDF	broadside tests, standard scan, transition faults, test synthesis, full-scan circuits
2	Irith Pomeranz, Sudhakar M. Reddy	Functional Broadside Tests with Different Levels of Reachability.	VLSI Design	2007	DBLP DOI BibTeX RDF
1	Irith Pomeranz	Fast Identification of Undetectable Transition Faults under Functional Broadside Tests.	IEEE Trans. Computers	2012	DBLP DOI BibTeX RDF
1	Irith Pomeranz	Undetectable transition faults under broadside tests with constant primary input vectors.	IET Computers & Digital Techniques	2012	DBLP DOI BibTeX RDF
1	Irith Pomeranz	Scan Shift Power of Functional Broadside Tests.	IEEE Trans. on CAD of Integrated Circuits and Systems	2011	DBLP DOI BibTeX RDF
1	Irith Pomeranz	Generation of Multi-Cycle Broadside Tests.	IEEE Trans. on CAD of Integrated Circuits and Systems	2011	DBLP DOI BibTeX RDF
1	Irith Pomeranz, Sudhakar M. Reddy	Two-dimensional partially functional broadside tests.	IET Computers & Digital Techniques	2011	DBLP DOI BibTeX RDF
1	Irith Pomeranz, Sudhakar M. Reddy	Broadside and Functional Broadside Tests for Partial-Scan Circuits.	IEEE Trans. VLSI Syst.	2011	DBLP DOI BibTeX RDF
1	Irith Pomeranz, Sudhakar M. Reddy	On Functional Broadside Tests With Functional Propagation Conditions.	IEEE Trans. VLSI Syst.	2011	DBLP DOI BibTeX RDF
1	Irith Pomeranz	Augmenting Functional Broadside Tests for Transition Fault Coverage with Bounded Switching Activity.	PRDC	2011	DBLP DOI BibTeX RDF
1	Irith Pomeranz	Built-in generation of functional broadside tests.	DATE	2011	DBLP BibTeX RDF
1	Irith Pomeranz, Sudhakar M. Reddy	Forming multi-cycle tests for delay faults by concatenating broadside tests.	VTS	2010	DBLP DOI BibTeX RDF
1	Irith Pomeranz, Sudhakar M. Reddy	On reset based functional broadside tests.	DATE	2010	DBLP BibTeX RDF
1	Irith Pomeranz, Sudhakar M. Reddy	Definition and generation of partially-functional broadside tests.	IET Computers & Digital Techniques	2009	DBLP DOI BibTeX RDF
1	Irith Pomeranz, Sudhakar M. Reddy	On-chip Generation of the Second Primary Input Vectors of Broadside Tests.	DFT	2009	DBLP DOI BibTeX RDF
1	Irith Pomeranz, Sudhakar M. Reddy	State persistence: a property for guiding test generation.	ACM Great Lakes Symposium on VLSI	2009	DBLP DOI BibTeX RDF	broadside tests, test generation, transition faults, scan-based tests
1	Irith Pomeranz, Sudhakar M. Reddy	Functional Broadside Tests with Minimum and Maximum Switching Activity.	J. Low Power Electronics	2008	DBLP DOI BibTeX RDF
1	Irith Pomeranz, Sudhakar M. Reddy	Scan-Based Delay Test Types and Their Effect on Power Dissipation During Test.	IEEE Trans. on CAD of Integrated Circuits and Systems	2008	DBLP DOI BibTeX RDF
1	Irith Pomeranz, Sudhakar M. Reddy	Generation of Functional Broadside Tests for Transition Faults.	IEEE Trans. on CAD of Integrated Circuits and Systems	2006	DBLP DOI BibTeX RDF
1	Irith Pomeranz, Sudhakar M. Reddy	Test compaction for transition faults under transparent-scan.	DATE	2006	DBLP DOI BibTeX RDF
1	Irith Pomeranz, Sudhakar M. Reddy	Scan-Based Delay Fault Tests for Diagnosis of Transition Faults.	DFT	2006	DBLP DOI BibTeX RDF
1	Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz	Methods for improving transition delay fault coverage using broadside tests.	ITC	2005	DBLP DOI BibTeX RDF
1	Narendra Devta-Prasanna, Sudhakar M. Reddy, Arun Gunda, P. Krishnamurthy, Irith Pomeranz	Improved Delay Fault Coverage Using Subsets of Flip-flops to Launch Transitions.	Asian Test Symposium	2005	DBLP DOI BibTeX RDF