Search results for "built-in tests"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
3	Colin Atkinson	Component-Oriented Verification of Software Architectures through Built-in Tests.	ECSA	2008	DBLP DOI BibTeX RDF	Verification, built-in tests, system services
3	Yingxu Wang, Graham King	A European COTS Architecture with Built-in Tests.	OOIS	2002	DBLP DOI BibTeX RDF	test reuse, run-time testing, Software engineering, architecture, component, COTS, built-in tests, real-time software, industrial practices, OO
1	Ming Gao, Hsiu-Ming Chang, Peter Lisherness, Kwang-Ting (Tim) Cheng	Time-Multiplexed Online Checking.	IEEE Trans. Computers	2011	DBLP DOI BibTeX RDF	fault tolerance, Availability, built-in tests, error-checking
1	Deepa Mannath, Dallas Webster, Victor Montaño-Martinez, David Cohen, Shai Kush, Thiagarajan Ganesan, Adesh Sontakke	Structural approach for built-in tests in RF devices.	ITC	2010	DBLP DOI BibTeX RDF
1	Mehrdad Nourani, Mohammad Tehranipoor, Nisar Ahmed	Low-Transition Test Pattern Generation for BIST-Based Applications.	IEEE Trans. Computers	2008	DBLP DOI BibTeX RDF	Low power pattern generation, Test generation, Built-in tests, Testing strategies, Random generation
1	Ioannis Voyiatzis	An ALU-Based BIST Scheme for Word-Organized RAMs.	IEEE Trans. Computers	2008	DBLP DOI BibTeX RDF	Memory control and access, Reliability, Test generation, Built-In Tests, Testing and Fault-Tolerance, Semiconductor Memories
1	Egas Henes Neto, Gilson I. Wirth, Fernanda Lima Kastensmidt	Mitigating Soft Errors in SRAM Address Decoders Using Built-in Current Sensors.	J. Electronic Testing	2008	DBLP DOI BibTeX RDF	Fault-tolerance, Reliability, Testing, Built-in tests, Error-checking
1	Colin Atkinson, Daniel Brenner, Giovanni Falcone, Monika Juhasz	Specifying High-Assurance Services.	IEEE Computer	2008	DBLP DOI BibTeX RDF
1	Salem Abdennadher, Saghir A. Shaikh	Practices in Mixed-Signal and RF IC Testing.	IEEE Design & Test of Computers	2007	DBLP DOI BibTeX RDF	I/O testing, SiP testing, wireless transceiver testing, DFT, built-in tests, ATE
1	Daniel Brenner, Colin Atkinson, Rainer Malaka, Matthias Merdes, Barbara Paech, Dima Suliman	Reducing verification effort in component-based software engineering through built-in testing.	Information Systems Frontiers	2007	DBLP DOI BibTeX RDF	Run-time testing, MORABIT, Built-in test, Integration test
1	Soumendu Bhattacharya, Abhijit Chatterjee	A DFT Approach for Testing Embedded Systems Using DC Sensors.	IEEE Design & Test of Computers	2006	DBLP DOI BibTeX RDF	computer-aided design, test generation, built-in tests, reliability and testing
1	Egas Henes Neto, Ivandro Ribeiro, Michele G. Vieira, Gilson I. Wirth, Fernanda Lima Kastensmidt	Using Bulk Built-in Current Sensors to Detect Soft Errors.	IEEE Micro	2006	DBLP DOI BibTeX RDF	Reliability, Built-in tests, Error-checking, Testing and Fault-Tolerance
1	Daniel Brenner, Colin Atkinson, Barbara Paech, Rainer Malaka, Matthias Merdes, Dima Suliman	Reducing Verification Effort in Component-Based Software Engineering through Built-In Testing.	EDOC	2006	DBLP DOI BibTeX RDF
1	Daniel Brenner	Enabling Run-Time System Verification through Built-In Testing.	TAIC PART	2006	DBLP DOI BibTeX RDF
1	Hans-Gerhard Groß, Ina Schieferdecker, George Din	Model-Based Built-In Tests.	Electr. Notes Theor. Comput. Sci.	2005	DBLP DOI BibTeX RDF
1	André DeHon, Helia Naeimi	Seven Strategies for Tolerating Highly Defective Fabrication.	IEEE Design & Test of Computers	2005	DBLP DOI BibTeX RDF	Reliability, integrated circuits, Reconfigurable hardware, Built-in tests, Testing strategies, Logic Arrays, Testing and Fault-Tolerance, Redundant design, Advanced Technologies
1	Taewoong Jeon, Hyonwoo Seung, Sungyoung Lee	Embedding built-in tests in hot spots of an object-oriented framework.	SIGPLAN Notices	2002	DBLP DOI BibTeX RDF	hook classes, testability, object-oriented framework, built-in test (BIT)
1	Taewoong Jeon, Sungyoung Lee, Hyonwoo Seung	Increasing the Testability of Object-Oriented Frameworks with Built-in Tests.	AISA	2002	DBLP DOI BibTeX RDF
1	Yingxu Wang, Graham King, Dilip Patel, Shushma Patel, Alec Dorling	On Coping with Real-Time Software Dynamic Inconsistency by Built-in Tests.	Ann. Software Eng.	1999	DBLP DOI BibTeX RDF
1	Yingxu Wang, Graham King, Hakan Wickburg	A Method for Built-in Tests in Component-based Software Maintenance.	CSMR	1999	DBLP DOI BibTeX RDF	maintenance mode, normal mode, test component reuse, reengineering maintenance, Software engineering, software maintenance, software components, built-in test
1	Jian Shen, Jacob A. Abraham	Synthesis of Native Mode Self-Test Programs.	J. Electronic Testing	1998	DBLP DOI BibTeX RDF	native mode self-test, test synthesis, functional test generation
1	Bernhard Eschermann	State Assignment for Hardwired VLSI Control Units.	ACM Comput. Surv.	1993	DBLP DOI BibTeX RDF	coding constraints, VLSI, computer-aided design, synthesis, finite-state machines, logic design, sequential circuits, testability, integrated circuits, built-in tests, state assignment, control design
1	Paul H. Bardell, William H. McAnney	Pseudorandom Arrays for Built-In Tests.	IEEE Trans. Computers	1986	DBLP DOI BibTeX RDF	two-dimensional window property, Built-in self-test stimuli, linear dependencies in m- sequences, parallel LFSR sequences, pseudorandom binary sequences, pseudorandom sequences