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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 15765 occurrences of 4130 keywords
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Results
Found 18673 publication records. Showing 18673 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 8 | Volkhard Klinger |
DiPaCS: a new concept for parallel circuit simulation.  |
Annual Simulation Symposium  |
1995 |
DBLP DOI BibTeX RDF |
DiPaCS system, parallel circuit simulation, distributed parallel circuit simulator, integrated circuit simulation, hierarchical circuit simulator, parallel processing, parallel programming, iterative methods, parallel machines, circuit analysis computing, integrated circuit layout, multicomputer systems, parallel iterative method |
| 7 | Dominik Stoffel, Wolfgang Kunz |
Record & play: a structural fixed point iteration for sequential circuit verification.  |
ICCAD  |
1997 |
DBLP DOI BibTeX RDF |
circuit resynthesis, circuit retiming, combinational verification techniques, instruction queue, iterative circuit array, local circuit transformation, sequential circuit verification, sequential logic equivalence checking, structural fixed point iteration, time frame equivalence, logic testing, finite state machine, logic design |
| 7 | Hideaki Doi, Yoko Suzuki, Yasuhiko Hara, Tadashi Iida, Yasuhiro Fujishita, Koichi Karasaki |
Real-Time X-Ray Inspection of 3D Defects in Circuit Board Patterns. (PDF / PS)  |
ICCV  |
1995 |
DBLP DOI BibTeX RDF |
printed circuit layout, X-ray applications, real time X-ray inspection, real-time X-ray inspection, 3D defect, 3-D defects, circuit board patterns, three dimensional defects, fine PCB patterns, sphere surface, X-ray detector, defect detection algorithm, heavy shading, real-time systems, feature extraction, feature extraction, signal processing, inspection, circuit analysis computing, X-ray images, printed circuit board, printed circuit testing, perspective transform, intensity variation, defect detection techniques |
| 6 | Masaki Hashizume, Masashi Sato, Hiroyuki Yotsuyanagi, Takeomi Tamesada |
Power Supply Circuit for High Speed Operation of Adiabatic Dynamic CMOS Logic Circuits.  |
DELTA  |
2002 |
DBLP DOI BibTeX RDF |
adiabatic logic circuit, power supply circuit, CMOS, dynamic circuit, low power circuit |
| 6 | Stanislav Polonsky, Moyra K. McManus, Daniel R. Knebel, Steve Steen, Pia Sanda |
Non-invasive timing analysis of IBM G6 microprocessor L1 cache using picosecond imaging circuit analysis.  |
Asian Test Symposium  |
2000 |
DBLP DOI BibTeX RDF |
imaging circuit analysis, IBM G6 microprocessor, non-invasive backside timing, Picosecond Imaging Circuit Analysis, waveform extraction, integrated circuit testing, timing analysis, race condition, circuit switching, integrated memory circuits, hazards and race conditions, L1 cache |
| 6 | Jennifer Dworak, Michael R. Grimaila, Brad Cobb, Ting-Chi Wang, Li-C. Wang, M. Ray Mercer |
On the superiority of DO-RE-ME/MPG-D over stuck-at-based defective part level prediction.  |
Asian Test Symposium  |
2000 |
DBLP DOI BibTeX RDF |
DO-RE-ME technique, MPG-D model, defective part level prediction, benchmark circuit simulations, stuck-at fault detection tests, bridging surrogate detection, stuck-at fault coverage, predictor accuracy, industrial circuit, test pattern sequences, integrated circuit testing, automatic test pattern generation, ATPG, fault simulation, logic circuit, circuit simulation, integrated logic circuits, correlation coefficient |
| 6 | Fabian Vargas, Alexandre M. Amory |
Transient-fault tolerant VHDL descriptions: a case-study for area overhead analysis.  |
Asian Test Symposium  |
2000 |
DBLP DOI BibTeX RDF |
transient-fault tolerant VHDL descriptions, area overhead analysis, reliable complex circuit design, harmful environments, reliability level, early-estimation, maximum area overhead, redundancy insertion, application minimum reliability requirement, FT-PRO tool, fault tolerant computing, redundancy, microprocessor, integrated circuit design, circuit CAD, CAD tool, transients, reliability estimation, memory elements, integrated circuit reliability, fault-tolerant circuit |
| 6 | S. K. Gupta, M. M. Hasan |
KANSYS: a CAD tool for analog circuit synthesis.  |
VLSI Design  |
1996 |
DBLP DOI BibTeX RDF |
KANSYS, analog circuit synthesis, knowledge intensive hierarchical design, transistor circuit designs, functional circuits, knowledge based systems, hierarchy, integrated circuit design, circuit CAD, CAD tool, analogue integrated circuits, design knowledge, process specifications |
| 6 | Narayanan Vijaykrishnan, N. Ranganathan |
SUBGEN: a genetic approach for subcircuit extraction.  |
VLSI Design  |
1996 |
DBLP DOI BibTeX RDF |
SUBGEN model, subcircuit extraction, large circuit graph, genetic algorithms, genetic algorithm, graph theory, computer-aided design, integrated circuit design, circuit CAD, CMOS integrated circuits, CMOS circuit, integrated circuit modelling |
| 6 | Eric Felt, Alberto L. Sangiovanni-Vincentelli |
Optimization of analog IC test structures.  |
VTS  |
1996 |
DBLP DOI BibTeX RDF |
integrated circuit measurement, analog IC test structures, circuit parameters, statistical analysis, integrated circuit testing, accuracy, circuit optimisation, design of experiments, design of experiments, analogue integrated circuits, statistical techniques, network parameters, integrated circuit noise, measurement noise |
| 6 | Chung-Len Lee, Horng Nan Chern, Min Shung Liao, Hui Min Wang |
On Designing of 4-Valued Memory with Double-Gate TFT. (PDF / PS)  |
ISMVL  |
1995 |
DBLP DOI BibTeX RDF |
thin film transistors, 4-valued memory, double-gate TFT, 4 valued memory cell, double gate thin film transistor, double gate TFT, HSPICE simulation, resistor load, CMOS load basic block circuit, memory cell circuits, SRAM cell circuit, memory architecture, integrated circuit design, multivalued logic, SPICE, circuit design, multivalued logic circuits, SRAM chips, CMOS memory circuits, equivalent circuits, equivalent circuit |
| 6 | Anirudh Devgan, Ronald A. Rohrer |
Efficient simulation of interconnect and mixed analog-digital circuits in ACES.  |
VLSI Design  |
1995 |
DBLP DOI BibTeX RDF |
adaptively controlled explicit simulation, mixed analog-digital circuits, analog circuit simulation, interconnect circuit simulation, AWE macromodels, nonlinear terminations, variable accuracy device models, circuit topology constraints removal, timing, circuit analysis computing, transient analysis, analogue integrated circuits, integrated circuit interconnections, mixed analogue-digital integrated circuits, ACES, transient simulation, timing simulation |
| 5 | Kai Strunz, Qianli Su |
Stochastic formulation of SPICE-type electronic circuit simulation with polynomial chaos.  |
ACM Trans. Model. Comput. Simul.  |
2008 |
DBLP DOI BibTeX RDF |
Galerkin projection, electronic circuit, nonsampling stochastic analysis, tolerance analysis, SPICE, circuit simulation, spectral methods, transients, power electronics, stochastic differential equations, polynomial chaos, Circuit modeling |
| 5 | Paul Tarau, Brenda Luderman |
Revisiting exact combinational circuit synthesis.  |
SAC  |
2008 |
DBLP DOI BibTeX RDF |
exact combinational circuit synthesis, logic programming and circuit design, minimal transistor-count circuit synthesis |
| 5 | Paul Tarau, Brenda Luderman |
A Logic Programming Framework for Combinational Circuit Synthesis.  |
ICLP  |
2007 |
DBLP DOI BibTeX RDF |
logic programming and circuit design, combinatorial object generation, exact combinational circuit synthesis, universal boolean logic libraries, symbolic rewriting, minimal transistor-count circuit synthesis |
| 5 | José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski |
Testing a PWM circuit using functional fault models and compact test vectors for operational amplifiers.  |
Asian Test Symposium  |
2000 |
DBLP DOI BibTeX RDF |
PWM circuit, compact test vectors, analog VLSI technology, functional fault macromodels, compact test vector construction, open loop gain, CMMR, analog circuit simulation complexity, VLSI, integrated circuit testing, design for testability, automatic test pattern generation, fault modeling, fault simulation, fault simulation, operational amplifiers, operational amplifiers, test pattern, functional fault models, analogue circuits, fault dictionary, pulse width modulation, slew-rate |
| 5 | Abby A. Ilumoka |
Efficient prediction of interconnect crosstalk using neural networks.  |
ICTAI  |
2000 |
DBLP DOI BibTeX RDF |
interconnect crosstalk prediction, deep submicron downscaling, wirecells, modular artificial neural networks, multiparadigm prototyping system, equicoupling contours, isocouples, transconductance amplifier, neural networks, delays, delay, finite element method, neural nets, crosstalk, experimental results, circuit CAD, finite element analysis, circuit simulation, circuit simulator, integrated circuit interconnections, wafer-scale integration, wafer scale integration |
| 5 | Lluis Ribas, Jordi Carrabina |
Digital MOS Circuit Partitioning with Symbolic Modeling.  |
DATE  |
1999 |
DBLP DOI BibTeX RDF |
switch-level circuit analysis, symbolic circuit traversal, circuit partitioning, symbolic modeling |
| 5 | Andrew R. Conn, Ruud A. Haring, Chandramouli Visweswariah, Chai Wah Wu |
Circuit optimization via adjoint Lagrangians.  |
ICCAD  |
1997 |
DBLP DOI BibTeX RDF |
Adjoint circuit, Optimization, Circuit simulation, Trust region, Augmented Lagrangian, Circuit tuning |
| 5 | Sumit Roy, Prithviraj Banerjee |
A Comparison of Parallel Approaches for Algebraic Factorization in Logic Synthesis. (PDF / PS)  |
IPPS  |
1997 |
DBLP DOI BibTeX RDF |
algebraic factorization, circuit replication, totally independent factorization, L-shaped partitioning strategy, rectangle interaction, ex1010 circuit, sequential kernel extraction algorithms, SIS sequential circuit synthesis system, quality degradation, parallel algorithms, logic synthesis, logic CAD, circuit partitions, divide-and-conquer strategy |
| 5 | F. Mohamed, M. Manzouki, Anton Biasizzo, Franc Novak |
Analog circuit simulation and troubleshooting with FLAMES.  |
VTS  |
1996 |
DBLP DOI BibTeX RDF |
analog circuit simulation, model-based expert system, VLSI, fuzzy logic, fuzzy logic, integrated circuit testing, circuit analysis computing, analogue integrated circuits, troubleshooting, FLAMES, diagnostic expert systems |
| 5 | Ayman I. Kayssi |
Macromodeling C- and RC-loaded CMOS inverters for timing analysis.  |
Great Lakes Symposium on VLSI  |
1996 |
DBLP DOI BibTeX RDF |
RC-loaded CMOS inverters, C-loaded CMOS inverters, series-resistor shunt-capacitor circuit, capacitive load case, input wave shape, transistor drive, timing, logic CAD, timing analysis, circuit analysis computing, CMOS logic circuits, circuit simulation, table lookup, macromodels, logic gates, lookup table, integrated circuit modelling |
| 5 | Carlton Bickford, Marie S. Teo, Gary Wallace, John A. Stankovic, Krithi Ramamritham |
A robotic assembly application on the Spring real-time system. (PDF / PS)  |
IEEE Real Time Technology and Applications Symposium  |
1996 |
DBLP DOI BibTeX RDF |
printed circuit manufacture, printed circuit layout, robotic assembly application, Spring real-time system, run-time system support, predictability demands, robotic work-cell, circuit board assembly, user understanding, target hardware properties, process layout, resource layout, shared resource usage, process suspension, efficient run-time representation, real-time systems, robots, timing, completeness, flexibility, reengineering, timing analysis, circuit layout CAD, assembling, systems re-engineering, interprocess communication, program representation, porting, ease of use, industrial robots, software development tools |
| 5 | Anantha Chandrakasan |
Ultra low power digital signal processing.  |
VLSI Design  |
1996 |
DBLP DOI BibTeX RDF |
ultra low power digital signal processing, portable wireless device, capacitance minimization, spatial signal correlations, temporal signal correlations, re-synchronization, operation reduction, 1 V, logic design, DSP, power consumption, switching, integrated circuit design, voltage scaling, digital signal processing chips, circuit optimisation, circuit design, data representation, circuit optimization, glitching, architecture optimization |
| 5 | Pradip Mandal, V. Visvanathan |
Design of high performance two stage CMOS cascode op-amps with stable biasing.  |
VLSI Design  |
1996 |
DBLP DOI BibTeX RDF |
two stage CMOS cascode op-amps, stable biasing, mirror biasing, output voltage, bias variations, low frequency common mode rejection ratios, power supply rejection ratios, systematic offset, circuit analysis computing, performance metrics, integrated circuit design, circuit simulations, operational amplifiers, CMOS analogue integrated circuits, slew rate, circuit stability |
| 5 | Yinghua Min, Zhuxing Zhao, Zhongcheng Li |
Boolean process-an analytical approach to circuit representation (II).  |
Asian Test Symposium  |
1995 |
DBLP DOI BibTeX RDF |
waveform analysis, circuit representation, logical behavior, waveform functions, mathematical tools, waveform polynomials, input transitions, VLSI, Boolean functions, timing, design for testability, logic design, logical design, polynomials, integrated circuit design, VLSI circuits, performance enhancement, timing behavior, Boolean process, circuit delay |
| 5 | Dimitrios Karayiannis, Spyros Tragoudas |
Uniform area timing-driven circuit implementation.  |
Great Lakes Symposium on VLSI  |
1995 |
DBLP DOI BibTeX RDF |
circuit module, cell library, input-output paths, overall area, timing-driven circuit implementation, computational complexity, heuristics, CAD, delays, timing, sequential circuits, sequential circuits, NP-hard, directed graphs, combinational circuits, combinational circuits, logic CAD, polynomial time algorithm, directed acyclic graphs, circuit CAD, cellular arrays, propagation delay |
| 5 | Imtiaz P. Shaik, Michael L. Bushnell |
Circuit design for low overhead delay-fault BIST using constrained quadratic 0-1 programming .  |
VTS  |
1995 |
DBLP DOI BibTeX RDF |
low overhead delay-fault BIST, constrained quadratic 0-1 programming, built-in self testing model, weighted signed graph balancing problem, VLSI, logic testing, delays, built-in self test, integrated circuit testing, logic design, automatic testing, integrated circuit design, quadratic programming, circuit design, digital integrated circuits, hazards and race conditions |
| 5 | Jin-Tai Yan, Pei-Yung Hsiao |
A new fuzzy-clustering-based approach for two-way circuit partitioning.  |
VLSI Design  |
1995 |
DBLP DOI BibTeX RDF |
fuzzy-clustering-based approach, two-way circuit partitioning, circuit netlist, undirected edge-weighted graph, tree net model, clustering distance, area information, area-balanced constraints, circuit benchmarks, VLSI, simulated annealing, network topology, trees (mathematics), fuzzy set theory, logic partitioning, fuzzy c-means clustering, fuzzy memberships |
| 5 | S. C. Prasad, Kaushik Roy |
Circuit optimization for minimisation of power consumption under delay constraint.  |
VLSI Design  |
1995 |
DBLP DOI BibTeX RDF |
power consumption minimisation, internal capacitances, series-connected transistors, multipass algorithm, transistor reordering, VLSI, delays, logic design, logic CAD, circuit layout CAD, CMOS logic circuits, minimisation, circuit optimisation, integrated circuit layout, VLSI circuits, logic gates, capacitance, circuit optimization, delay constraint, CMOS gates |
| 5 | Jin-Tai Yan |
Connection-oriented net model and fuzzy clustering techniques for K-way circuit partitioning. (PDF / PS)  |
ICCD  |
1995 |
DBLP DOI BibTeX RDF |
fuzzy neural nets, connection-oriented net model, fuzzy clustering techniques, K-way circuit partitioning, chain net model, cut analysis, multiple-pin net, edge-weighted graph, MCNC circuit benchmarks, partitioning balance, partitioning cut, computational complexity, complexity, fuzzy logic, high level synthesis, circuit analysis computing, hypergraph, fuzzy c-means clustering, mapped graph, fuzzy memberships |
| 5 | Frederik Beeftink, Arjan J. van Genderen, N. P. van der Meijs |
Accurate and efficient layout-to-circuit extraction for high-speed MOS and bipolar/BiCMOS integrated circuits. (PDF / PS)  |
ICCD  |
1995 |
DBLP DOI BibTeX RDF |
MOS integrated circuits, bipolar integrated circuits, BiCMOS integrated circuits, layout-to-circuit extraction, high-speed MOS integrated circuits, bipolar/BiCMOS integrated circuits, device recognition, equivalent network, layout parasitics, interconnects, circuit analysis computing, circuit layout CAD, Space, Spice, device modeling |
| 5 | Sachin S. Sapatnekar, Weitong Chuang |
Power vs. delay in gate sizing: conflicting objectives?  |
ICCAD  |
1995 |
DBLP DOI BibTeX RDF |
power-delay tradeoffs, short-circuit power, logic design, logic CAD, integrated circuit design, circuit CAD, optimization problem, circuit optimisation, gate sizing, convex programming, CMOS digital integrated circuits, dynamic power |
| 5 | Manoj Franklin |
Fast computation of C-MISR signatures.  |
Asian Test Symposium  |
1995 |
DBLP DOI BibTeX RDF |
C-MISR signatures, built-in self-test applications, good circuit signature, faulty circuit signatures, cellular automata-based multi-input signature registers, equivalent single input circuit, VLSI, logic testing, built-in self test, cellular automata, integrated circuit testing, sequential circuits, shift registers, test responses, signature analyzers, equivalent circuits |
| 5 | L. F. Fuller, C. Kraaijenvanger |
Design and manufacture of a 2K transistor p-well CMOS gate array in a student run factory at RIT.  |
Great Lakes Symposium on VLSI  |
1995 |
DBLP DOI BibTeX RDF |
educational aids, p-well CMOS gate array, student run factory, microelectronic engineering program, wafer fabrication, logic design, integrated circuit design, integrated circuit design, CMOS logic circuits, logic arrays, teaching tool, integrated circuit manufacture, integrated circuit manufacturing, electronic engineering education |
| 5 | J. T. Mowchenko, Y. Yang |
Optimizing wiring space in slicing floorplans.  |
Great Lakes Symposium on VLSI  |
1995 |
DBLP DOI BibTeX RDF |
wiring space optimisation, slicing floorplans, net density, sibling rectangles, circuit modules, routed layouts, VLSI, heuristic, network routing, circuit layout CAD, circuit optimisation, integrated circuit layout, branch and bound algorithm, wiring, IC layout |
| 5 | Jitendra Khare, Sujoy Mitra, Pranab K. Nag, U. Maly, Rob A. Rutenbar |
Testability-oriented channel routing.  |
VLSI Design  |
1995 |
DBLP DOI BibTeX RDF |
IC testing quality, testability-oriented channel routing, IC layout modification, test escape probability, iterative channel routing tool, fault undetectability, WrenTR, fault diagnosis, integrated circuit testing, design for testability, fault detectability, network routing, circuit layout CAD, bridging fault, circuit optimisation, integrated circuit layout, design strategies, yield loss, integrated circuit yield |
| 5 | Trevor J. Smedley |
A High-Level Visual Language for the Graphical Description of Digital Circuits. (PDF / PS)  |
VL  |
1995 |
DBLP DOI BibTeX RDF |
pulse circuits, high-level visual language, graphical description, programming language systems, digital design systems, full-featured visual programming language, complex circuit specification, repetitive structures, conditional structures, visual languages, circuit analysis computing, circuit CAD, digital circuits, engineering graphics, program structures, digital circuit design |
| 5 | Akio Okazaki, Takashi Kondo, Kazuhiro Mori, Shou Tsunekawa, Eiji Kawamoto |
An Automatic Circuit Diagram Reader with Loop-Structure-Based Symbol Recognition.  |
IEEE Trans. Pattern Anal. Mach. Intell.  |
1988 |
DBLP DOI BibTeX RDF |
automatic circuit diagram reader, loop-structure-based symbol recognition, logic circuit diagram reader, symbol segmentation, symbol identification, decision-tree control, character string recognition, connecting line analysis, computer vision, feature extraction, computerised pattern recognition, computerised pattern recognition, logic CAD, template matching, circuit CAD, VLSI-CAD |
| 4 | Zhai Zhang, Youren Wang, Shanshan Yang, Rui Yao, Jiang Cui |
The research of self-repairing digital circuit based on embryonic cellular array.  |
Neural Computing and Applications  |
2008 |
DBLP DOI BibTeX RDF |
Self-repairing digital circuit, Embryonic cellular array, Fault-tolerance design, Digital circuit design |
| 4 | Yoichi Sasaki, Kazuteru Namba, Hideo Ito |
Circuit and Latch Capable of Masking Soft Errors with Schmitt Trigger.  |
J. Electronic Testing  |
2008 |
DBLP DOI BibTeX RDF |
Masking circuit, Pass transistor, Schmitt trigger circuit, Soft error, Latch |
| 4 | Felipe Machado, Teresa Riesgo, Yago Torroja |
Disjoint Region Partitioning for Probabilistic Switching Activity Estimation at Register Transfer Level.  |
PATMOS  |
2008 |
DBLP DOI BibTeX RDF |
activity estimation, CAD, VHDL, BDD, power estimation, RTL, Switching activity, circuit partition, digital circuit design |
| 4 | Christophe Giacomotto, Mandeep Singh, Milena Vratonjic, Vojin G. Oklobdzija |
Energy Efficiency of Power-Gating in Low-Power Clocked Storage Elements.  |
PATMOS  |
2008 |
DBLP DOI BibTeX RDF |
Clocked storage elements, VLSI, power consumption, flip-flops, voltage scaling, clock gating, power gating, energy optimization, MTCMOS, circuit optimization, circuit tuning, circuit analysis |
| 4 | Guoyong Shi, Weiwei Chen, C.-J. Richard Shi |
A Graph Reduction Approach to Symbolic Circuit Analysis.  |
ASP-DAC  |
2007 |
DBLP DOI BibTeX RDF |
symbolic analog circuit simulator, symbolic circuit analysis, recursive sign determination algorithm, binary decision diagram, graph reduction |
| 4 | Hai Lin, Yu Wang 0002, Rong Luo, Huazhong Yang, Hui Wang 0004 |
IR-drop Reduction Through Combinational Circuit Partitioning.  |
PATMOS  |
2006 |
DBLP DOI BibTeX RDF |
Static Timing Analysis, IR-drop, circuit partitioning |
| 4 | Bipul C. Paul, Shinobu Fujita, Masaki Okajima, Thomas Lee |
Modeling and analysis of circuit performance of ballistic CNFET.  |
DAC  |
2006 |
DBLP DOI BibTeX RDF |
ballistic carbon nanotube FET (CNFET), circuit compatible model, parasitic capacitance, circuit performance |
| 4 | Hajime Shibata, Adrian Stoica, Nobuo Fujii |
Controllable decoding for automated analog circuit structure design.  |
Soft Comput.  |
2004 |
DBLP DOI BibTeX RDF |
Automated circuit synthesis, Genetic algorithm, Analog circuit |
| 4 | Takahiro Hanyu, Tsukasa Ike, Michitaka Kameyama |
Low-Power Dual-Rail Multiple-Valued Current-Mode Logic Circuit Using Multiple Input-Signal Levels. (PDF / PS)  |
ISMVL  |
2000 |
DBLP DOI BibTeX RDF |
dual-rail multiple-valued current-mode logic circuit, two supply voltages, differential-pair circuit, radix-2 signed-digit adder |
| 4 | Wei-Yu Chen, Sandeep K. Gupta, Melvin A. Breuer |
Test generation for crosstalk-induced faults: framework and computational result.  |
Asian Test Symposium  |
2000 |
DBLP DOI BibTeX RDF |
2-vector test generation, crosstalk-induced faults, noise effects, design effort, debugging effort, pulses, signal speedup, signal slowdown, digital combinational circuits, mixed-signal test generator, XGEN, static values, dynamic signals, signal arrival times, rise times, fall times, integrated circuit testing, automatic test pattern generation, combinational circuits, accuracy, vectors, circuit analysis computing, crosstalk, transitions, integrated logic circuits, technology scaling, SPICE simulations, gate delay, circuit performance, timing information, clock frequency |
| 4 | Michael J. Liebelt, Cheng-Chew Lim |
A method for determining whether asynchronous circuits are self-checking.  |
Asian Test Symposium  |
2000 |
DBLP DOI BibTeX RDF |
low-power electronics, TSC, low noise properties, semi-modular asynchronous circuit, output stuck-at-faults, low power, fault diagnosis, logic testing, integrated circuit testing, design for testability, asynchronous circuits, testability, totally self-checking, integrated circuit noise |
| 4 | Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Tomoo Inoue, Hideo Fujiwara |
Testing for the programming circuit of LUT-based FPGAs.  |
Asian Test Symposium  |
1997 |
DBLP DOI BibTeX RDF |
programming circuit, control circuit, configuration memory cell array, FPGA, fault model, SRAM, shift registers, shift registers, look-up table |
| 4 | Andy Negoi, Alain Guyot, Jacques Zimmermann |
A dedicated circuit for charged particles simulation using the Monte Carlo method.  |
ASAP  |
1997 |
DBLP DOI BibTeX RDF |
dedicated circuit, charged particles simulation, dedicated integrated circuit, integro-differential Boltzmann equation, direct statistical computation, simulated particles distribution function, semiconductor device hardware simulator, microdynamical transport, Boltzmann equation, binary format, drift velocity, static uniform electric field, hot carrier effects, computational complexity, Monte Carlo method |
| 4 | Anirudh Devgan |
Efficient coupled noise estimation for on-chip interconnects.  |
ICCAD  |
1997 |
DBLP DOI BibTeX RDF |
coupled noise estimation, dynamic logic circuit families, noise criticality pruning, physical design based noise avoidance, circuit simulation, on-chip interconnects, Elmore delay, noise analysis, timing simulation, integrated circuit noise, deep submicron design |
| 4 | Sergey Gavrilov, Alexey Glebov, Satyamurthy Pullela, S. C. Moore, Abhijit Dharchoudhury, Rajendran Panda, Gopalakrishnan Vijayan, David Blaauw |
Library-less synthesis for static CMOS combinational logic circuits.  |
ICCAD  |
1997 |
DBLP DOI BibTeX RDF |
library-less synthesis, resynthesized circuits, size-wise CMOS circuit optimization, static CMOS combinational logic circuits, structural CMOS circuit optimization, transistor level technique, CMOS logic circuits, design space, optimal design, circuit performance |
| 4 | Yves Gagnon, Yvon Savaria, Michel Meunier, Claude Thibeault |
Are defect-tolerant circuits with redundancy really cost-effective? Complete and realistic cost model. (PDF / PS)  |
DFT  |
1997 |
DBLP DOI BibTeX RDF |
defect-tolerant circuit, contamination, wafer test, silicon chip, reconfiguration, redundancy, integrated circuit testing, manufacturing, yield, cost model, integrated circuit, figure of merit, fault tolerant circuit |
| 4 | Minesh B. Amin, Bapiraju Vinnakota |
ZAMBEZI: a parallel pattern parallel fault sequential circuit fault simulator.  |
VTS  |
1996 |
DBLP DOI BibTeX RDF |
ZAMBEZI, parallel pattern simulator, parallel fault simulation, sequential circuit fault simulator, multiple faults simulation, multiple vectors, parallel algorithms, VLSI, fault diagnosis, logic testing, sequential circuits, circuit analysis computing, integrated logic circuits |
| 4 | Naim Ben Hamida, Bechir Ayari, Bozena Kaminska |
Testing of embedded A/D converters in mixed-signal circuit. (PDF / PS)  |
ICCD  |
1996 |
DBLP DOI BibTeX RDF |
embedded A/D converters testing, integral nonlinearity error, differential nonlinearity error, offset error, gain error, boolean function manipulation, FFT, histogram, functional testing, transfer function, digital circuit, signal-to-noise ratio, mixed-signal circuit, analogue-digital conversion |
| 4 | Vamsi Boppana, W. Kent Fuchs |
Integrated fault diagnosis targeting reduced simulation.  |
ICCAD  |
1996 |
DBLP DOI BibTeX RDF |
ISCAS 85 circuit, ISCAS 89 circuit, dynamic techniques, integrated fault diagnosis, precomputed information, reduced simulation, run-time cost reduction, static techniques, combinational circuit, circuit analysis computing, run-time analysis |
| 4 | Julien Dunoyer, Nizar Abdallah, Pirouz Bazargan-Sabet |
A symbolic simulation approach in resolving signals' correlation.  |
Annual Simulation Symposium  |
1996 |
DBLP DOI BibTeX RDF |
signal resolution, signal correlation resolution, symbolic simulation approach, evaluation package, signal transition density, specification levels, first order clue, independent inputs, binary decision diagram concept, algorithms, VLSI, probability, logic CAD, digital simulation, design process, decision theory, circuit analysis computing, integrated circuit design, circuit CAD, digital circuits, subroutines, symbol manipulation, power dissipation, correlation methods, digital integrated circuits, signal probability, probabilistic approach, synthesis tools |
| 4 | Arun Balakrishnan, Srimat T. Chakradhar |
Retiming with logic duplication transformation: theory and an application to partial scan.  |
VLSI Design  |
1996 |
DBLP DOI BibTeX RDF |
logic duplication transformation, partial scan application, RLD configurations, RLD transformation, testability metrics, scan flip-flops, sequential circuit design, linear programming, timing, integer programming, logic design, sequential circuits, logic CAD, polynomial time algorithm, integer linear program, flip-flops, retiming, integrated circuit design, circuit CAD, integrated logic circuits, objective function |
| 4 | Sunil R. Das, N. Goel, Wen-Ben Jone, Amiya R. Nayak |
Syndrome signature in output compaction for VLSI BIST.  |
VLSI Design  |
1996 |
DBLP DOI BibTeX RDF |
syndrome signature, output compaction, VLSI BIST, input patterns, n-input combinational circuit, primary syndrome, subsyndromes, subfunctions, single-output circuit, multiple output, VLSI, logic testing, data compression, built-in self test, integrated circuit testing, combinational circuits, switching functions, exhaustive testing |
| 4 | Hari Balachandran, D. M. H. Walker |
Improvement of SRAM-based failure analysis using calibrated Iddq testing.  |
VTS  |
1996 |
DBLP DOI BibTeX RDF |
defect-bitmap dictionary, voltage testing, microprocessor cache memory, integrated circuit testing, calibration, calibration, SRAM, cache storage, failure analysis, failure analysis, IDDQ testing, current testing, defect classification, SRAM chips, integrated circuit yield, integrated circuit yield |
| 4 | Keerthi Heragu, Janak H. Patel, Vishwani D. Agrawal |
Segment delay faults: a new fault model.  |
VTS  |
1996 |
DBLP DOI BibTeX RDF |
segment delay faults, delay defect, distributed defect, rising transitions, falling transitions, transition tests, nonrobust tests, VLSI, fault diagnosis, logic testing, delays, integrated circuit testing, fault model, automatic testing, circuit analysis computing, robust tests, integrated circuit modelling, production testing, spot defect, manufacturing defects |
| 4 | Haluk Konuk, F. Joel Ferguson |
An unexpected factor in testing for CMOS opens: the die surface.  |
VTS  |
1996 |
DBLP DOI BibTeX RDF |
surface phenomena, electric charge, CMOS opens, die surface, RC interconnect, HSPICE simulations, trapped charge, floating gates, VLSI, integrated circuit testing, CMOS integrated circuits, integrated circuit modelling, circuit model |
| 4 | Robert B. Norwood, Edward J. McCluskey |
Synthesis-for-scan and scan chain ordering.  |
VTS  |
1996 |
DBLP DOI BibTeX RDF |
synthesis-for-scan procedure, scan chain ordering, testable circuit design, beneficial scan, VLSI, logic testing, integrated circuit testing, design for testability, logic design, sequential circuits, logic synthesis, flip-flops, integrated circuit design, integrated logic circuits, test strategy, boundary scan testing, functional specifications |
| 4 | John W. Sheppard, William R. Simpson |
Improving the accuracy of diagnostics provided by fault dictionaries.  |
VTS  |
1996 |
DBLP DOI BibTeX RDF |
diagnostics accuracy improvement, digital circuit diagnosis, information flow model, VLSI, fault diagnosis, logic testing, integrated circuit testing, automatic testing, circuit analysis computing, digital integrated circuits, fault dictionaries, nearest neighbor classification |
| 4 | Mohamed Soufi, Steve Rochon, Yvon Savaria, Bozena Kaminska |
Design and performance of CMOS TSPC cells for high speed pseudo random testing.  |
VTS  |
1996 |
DBLP DOI BibTeX RDF |
CMOS TSPC cells, high speed pseudo random testing, built-in self-test scheme, HSpice simulations, functionally equivalent logic block, true single phase clocking, logic testing, built-in self test, integrated circuit testing, logic CAD, layout, circuit analysis computing, clocks, circuit layout CAD, CMOS logic circuits, SPICE, cellular arrays, integrated circuit layout, test methodology, untestable faults, netlists |
| 4 | Fadi Y. Busaba, Parag K. Lala |
A graph coloring based approach for self-checking logic circuit design.  |
Asian Test Symposium  |
1995 |
DBLP DOI BibTeX RDF |
logic circuit design, bidirectional error, residue weights assignments, output lines, errors identification, graph theory, logic testing, integrated circuit testing, logic design, error detection, error detection, automatic testing, graph coloring, fault location, integrated logic circuits, graph colouring, self-checking, residue codes, single stuck-at fault |
| 4 | Wilbert H. F. J. Körver |
A universal formalization of the effects of threshold voltages for discrete switch-level circuit models.  |
Great Lakes Symposium on VLSI  |
1995 |
DBLP DOI BibTeX RDF |
field effect transistor switches, threshold voltage effects, discrete switch-level circuit models, universal formalization, switch imperfection, CMOS design, demolition degree, CMOS digital integrated circuits, state transitions, integrated circuit modelling, switching circuits |
| 4 | I. S. Abu-Khater, A. Bellaouar, Mohamed I. Elmasry, Ran-Hong Yan |
Circuit/architecture for low-power high-performance 32-bit adder.  |
Great Lakes Symposium on VLSI  |
1995 |
DBLP DOI BibTeX RDF |
conditional sum architecture, CPL-like logic implementation, power supply voltage, minimum size, optimized speed, 1 to 3.3 V, logic design, CMOS, integrated circuit design, adders, adder, CMOS logic circuits, circuit optimisation, 32 bit |
| 4 | Chantal Ykman-Couvreur, Bill Lin |
Optimised state assignment for asynchronous circuit synthesis.  |
ASYNC  |
1995 |
DBLP DOI BibTeX RDF |
optimised state assignment, asynchronous circuit synthesis, complete state coding, state graph level, asynchronous benchmarks, circuit area, logic design, encoding, asynchronous circuits, computation time, state assignment |
| 4 | Hao Tang, Hung Chang Lin |
A Fuzzy Membership Function Circuit Using Hysteretic Resonant Tunneling Diodes. (PDF / PS)  |
ISMVL  |
1995 |
DBLP DOI BibTeX RDF |
switched capacitor networks, signal sampling, fuzzy membership function circuit, hysteretic resonant tunneling diodes, fuzzy logic hardware, hysteretic effect, input sampling, sampled input, intrinsic I-V characteristics, fuzzy logic, integrated logic circuits, membership function, hysteresis, resonant tunnelling diodes, resonant tunneling diodes, circuit performance |
| 4 | Goutam Debnath, K. Debnath, R. Fernando |
The Pentium processor-90/100, microarchitecture and low power circuit design.  |
VLSI Design  |
1995 |
DBLP DOI BibTeX RDF |
BIMOS integrated circuits, Pentium processor-90/100, low power circuit design, BiNMOS process, power consumption reduction, symmetric dual processing feature, multithreaded operating systems, 0.6 micron, 3.3 V, computer architecture, microarchitecture, integrated circuit design, microprocessor chips, 100 MHz |
| 4 | Takafumi Hamano, Naofumi Takagi, Shuzo Yajima, Franco P. Preparata |
O(n)-depth circuit algorithm for modular exponentiation.  |
IEEE Symposium on Computer Arithmetic  |
1995 |
DBLP DOI BibTeX RDF |
O(n)-depth circuit algorithm, polynomial-size combinational circuit algorithm, n-bit modular exponentiation, n-bit binary integers, square-and-multiply method, public key cryptography, combinational circuits, digital arithmetic, modular exponentiation |
| 4 | Mike Chou, Jacob K. White |
Efficient reduced-order modeling for the transient simulation of three-dimensional interconnect.  |
ICCAD  |
1995 |
DBLP DOI BibTeX RDF |
Arnoldi method, SPICE-level simulation, Taylor series terms, surface-volume methods, three-dimensional interconnect, circuit analysis computing, transient analysis, integrated circuit interconnect, integrated circuit interconnections, reduced-order modeling, reduced-order models, transient simulation, series (mathematics) |
| 4 | Amir H. Farrahi, Majid Sarrafzadeh |
System partitioning to maximize sleep time.  |
ICCAD  |
1995 |
DBLP DOI BibTeX RDF |
Geo-Part, exploitable sleep time, geometric partitioning heuristic, low-power synthesis, memory refresh circuitry, segment tree data structure, VLSI, logic CAD, integrated circuit design, circuit CAD, circuit optimisation, logic partitioning, partitioning problem, system partitioning |
| 4 | Haifang Liao, Wayne Wei-Ming Dai |
Partitioning and reduction of RC interconnect networks based on scattering parameter macromodels.  |
ICCAD  |
1995 |
DBLP DOI BibTeX RDF |
circuit reduction, scattering parameter, interconnect network, macromodel, Circuit partitioning, circuit synthesis |
| 4 | Sudhir K. Jhajharia, Hua Swee Wang |
Training diploma students on ATE-related module.  |
Asian Test Symposium  |
1995 |
DBLP DOI BibTeX RDF |
electronic equipment testing, tertiary institution, ATE-related module, diploma students, final year students, Microelectronics option, Electronics and Communication Engineering Department, Singapore Polytechnic, Singapore Polytechnic Education Model, automated test equipment, Advanced Diploma, practical training, laboratory session, training, integrated circuit testing, assessment, teaching, teaching, automatic testing, automatic test equipment, test patterns, printed circuit boards, educational courses, printed circuit testing, industry-standard, electronic engineering education |
| 4 | Pierre Fraigniaud, Joseph G. Peters |
Structured communication in torus networks.  |
HICSS  |
1995 |
DBLP DOI BibTeX RDF |
combinational switching, structured communication, one-to-all data movement patterns, all-to-all data movement patterns, 2D tori, multi-dimensional tori, synchronous circuit-switched routing, multi-scattering, circuit-switching algorithms, short routing, broadcasting, broadcasting, multiprocessor interconnection networks, gossiping, distributed memory systems, network routing, virtual channels, cycles, circuit switching, switching theory, scattering, torus networks, message length, store-and-forward routing |
| 4 | K. Y. Wu, P. K. H. Ng, Xing Dong Jia, Richard M. M. Chen, A. M. Layfield |
Performance tuning of a multiprocessor sparse matrix equation solver.  |
HICSS  |
1995 |
DBLP DOI BibTeX RDF |
multiprocessor sparse matrix equation solver, sparse matrix equation, linear simultaneous equations, electrical circuit, multiprocessor implementation, parallel direct method, parallel algorithms, circuit analysis computing, SPICE, SPICE, circuit simulation, sparse matrices, performance tuning |
| 4 | Manjit Borah, Mary Jane Irwin, Robert Michael Owens |
Minimizing power consumption of static CMOS circuits by transistor sizing and input reordering.  |
VLSI Design  |
1995 |
DBLP DOI BibTeX RDF |
power consumption minimisation, static CMOS circuits, input reordering, high fan-out gates, power constrained module generator, PowerSizer, logic CAD, circuit layout CAD, CMOS logic circuits, logic circuits, minimisation, arithmetic circuits, circuit optimisation, integrated circuit layout, transistor sizing |
| 4 | Tapan J. Chakraborty, Vishwani D. Agrawal |
Robust testing for stuck-at faults.  |
VLSI Design  |
1995 |
DBLP DOI BibTeX RDF |
logic circuit testing, d-robust tests, fault diagnosis, logic testing, delays, sequential circuits, sequential circuits, fault models, combinational circuits, combinational circuit, robust testing, single stuck-at faults, circuit models |
| 4 | Chunduri Rama Mohan, Partha Pratim Chakrabarti |
Combined optimization of area and testability during state assignment of PLA-based FSM's.  |
VLSI Design  |
1995 |
DBLP DOI BibTeX RDF |
combined optimization, testability optimisation, PLA-based FSM, EARTH algorithm, single cross-point faults, redundancy checker, fault diagnosis, logic testing, redundancy, finite state machines, integrated circuit testing, design for testability, fault model, logic CAD, programmable logic arrays, circuit layout CAD, circuit optimisation, integrated circuit layout, state assignment, state assignment, minimisation of switching nets, single stuck-at faults, area minimization |
| 4 | Sven Simon, Ralf Bucher, Josef A. Nossek |
Retiming of synchronous circuits with variable topology.  |
VLSI Design  |
1995 |
DBLP DOI BibTeX RDF |
variable topology, combinational elements selection, circuit graph, optimization, graph theory, linear programming, delays, timing, interconnections, logic design, network topology, logic CAD, retiming, circuit CAD, circuit optimisation, synchronous circuits |
| 4 | Nagaraj Subramanyam, K. G. Praveen, Ramesh Ramani, D. Suryanarayana |
CODAC-a characterization system for digital and analog circuits.  |
VLSI Design  |
1995 |
DBLP DOI BibTeX RDF |
CODAC, characterization system, electrical simulator, procedural interface, customized analysis functions, parallel processing, circuit analysis computing, Monte Carlo methods, circuit CAD, SPICE, SPICE, analog circuits, digital circuits, CAD tool, digital integrated circuits, analogue integrated circuits, circuit analysis, Monte Carlo analysis |
| 4 | Alessandro Bogliolo, Maurizio Damiani, Piero Olivo, Bruno Riccò |
Reliability evaluation of combinational logic circuits by symbolic simulation.  |
VTS  |
1995 |
DBLP DOI BibTeX RDF |
mcnc benchmark circuits, fault-tolerant combinational logic circuits, circuit functionality, fault indicators, control variables, BDD-based symbolic simulation, undetectable multiple faults, VLSI, VLSI, combinational circuits, logic CAD, digital simulation, circuit analysis computing, reliability evaluation, integrated circuit reliability |
| 4 | Takushi Tanaka |
Parsing Electronic Circuits in a Logic Grammar.  |
IEEE Trans. Knowl. Data Eng.  |
1993 |
DBLP DOI BibTeX RDF |
trouble shooting, automatic circuit understanding, circuit structures, definite clause set grammar, DCSG top-down parsing mechanism, trees (mathematics), circuit analysis computing, grammars, structural analysis, formal logic, hierarchical structures, circuit design, words, parse trees, functional blocks, causal analysis, sentence, logic grammar |
| 4 | Rohit Kapur, M. Ray Mercer |
Bounding Signal Probabilities for Testability Measurement Using Conditional Syndromes.  |
IEEE Trans. Computers  |
1992 |
DBLP DOI BibTeX RDF |
bounding algorithm, circuit faults, conditional syndromes, auxiliary gate, pseudorandom pattern resistant faults, circuit structure, computational complexity, lower bounds, built-in self test, integrated circuit testing, circuit analysis computing, signal probabilities, testability measurement, random pattern testability |
| 4 | Wolfgang Borutzky |
Combining Behavioral Block Diagram Modelling with Circuit Simulation.  |
EUROCAST  |
1989 |
DBLP DOI BibTeX RDF |
mixed behavioral, circuit-level modelling, electrical macromodels, continuous system simulation, electronic control systems, circuit simulation, functional simulation, block diagrams, signal processing systems |
| 4 | Qin-Zhong Ye, Per-Erik Danielsson |
Inspection of Printed Circuit Boards by Connectivity Preserving Shrinking.  |
IEEE Trans. Pattern Anal. Mach. Intell.  |
1988 |
DBLP DOI BibTeX RDF |
PCB manufacture, connectivity preserving shrinking, edge irregularities, printed circuit manufacture, computer vision, computer vision, computerised pattern recognition, computerised pattern recognition, inspection, sensitivity, quality control, quality control, visual inspection, printed circuit boards, pipelined structure |
| 4 | Yasuhiko Hara, Hideaki Doi, Koichi Karasaki, Tadashi Iida |
A System for PCB Automated Inspection Using Fluorescent Light.  |
IEEE Trans. Pattern Anal. Mach. Intell.  |
1988 |
DBLP DOI BibTeX RDF |
violet illumination, PCB automated inspection, fluorescent light, nicks, printed circuit board pattern, ultraviolet rays, glass-epoxy, glass-polyimide, high-sensitivity TV camera, silhouette image, fluorescence, pattern recognition, computer vision, computer vision, fault detection, computerised pattern recognition, inspection, circuit analysis computing, fault location, cuts, printed circuit testing, optical fiber, short-circuits |
| 4 | D. B. Shu, C. C. Li, J. F. Mancuso, Y. N. Sun |
A Line Extraction Method for Automated SEM Inspection of VLSI Resist.  |
IEEE Trans. Pattern Anal. Mach. Intell.  |
1988 |
DBLP DOI BibTeX RDF |
line extraction method, automated SEM inspection, VLSI resist, precision digital edge-line-detection method, edge contours, submicrometer width, integrated circuit fabrication, computer vision, VLSI, transforms, integrated circuit testing, computerised picture processing, automatic testing, Hough transform, inspection, circuit analysis computing, scanning electron microscopy, scanning electron microscopy |
| 4 | Stanley Lass |
Automated printed circuit routing with a stepping aperture.  |
Commun. ACM  |
1969 |
DBLP DOI BibTeX RDF |
circuit board, printed circuit, stepping aperture, routing, interconnections, lines, computer program, vias, pins, aperture |
| 3 | Abdulhadi Shoufan, Zheng Lu, Guido Rößling |
A platform for visualizing digital circuit synthesis with VHDL.  |
ITiCSE  |
2010 |
DBLP DOI BibTeX RDF |
digital circuit synthesis, visualization, animation, VHDL |
| 3 | Jun Liu, Ming-xin Yang, Jian-Bo Wang |
Thick Film Integrated Circuit Design of Multi-measurement Module.  |
APWCS  |
2010 |
DBLP DOI BibTeX RDF |
Thick film integrated circuit, Signal adjustment circuit, Thermocouple, Spi, Calibration |
| 3 | Huang Yushui, Zhu Ling, Xin Yugang |
Analysis and Optimization Design of M57959L Module-Based IGBT Drive Circuit.  |
APWCS  |
2010 |
DBLP DOI BibTeX RDF |
IGBT, drive circuit, M57959L, optimization circuit, High reliability |
| 3 | Ramamohan Paturi, Pavel Pudlák |
On the complexity of circuit satisfiability.  |
STOC  |
2010 |
DBLP DOI BibTeX RDF |
NP-completeness, circuit satisfiability |
| 3 | Jernej Olensek, Árpád Bürmen, Janez Puhan, Tadej Tuma |
DESA: a new hybrid global optimization method and its application to analog integrated circuit sizing.  |
J. Global Optimization  |
2009 |
DBLP DOI BibTeX RDF |
Analog integrated circuit sizing, Optimization, Simulated annealing, Differential evolution |
| 3 | Andrew Zalesky |
To burst or circuit switch?  |
IEEE/ACM Trans. Netw.  |
2009 |
DBLP DOI BibTeX RDF |
all-optical switching, optical circuit switching, path decomposition, stochastic performance modeling, vacation queue, blocking probability, optical burst switching |
| 3 | Michal Koucký |
Circuit Complexity of Regular Languages.  |
Theory Comput. Syst.  |
2009 |
DBLP DOI BibTeX RDF |
Circuit complexity, Regular languages, Upper and lower bounds |
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