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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 11 occurrences of 11 keywords
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Results
Found 1 publication records. Showing 1 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Shiyi Xu, Wei Cen |
Forecasting the efficiency of test generation algorithms for digital circuits.  |
Asian Test Symposium  |
2000 |
DBLP DOI BibTeX RDF |
efficiency forecasting, testability parameters, genetic algorithms, genetic algorithms, VLSI, logic testing, integrated circuit testing, sequential circuits, sequential circuits, automatic test pattern generation, ATPG, combinational circuits, combinational circuits, digital circuits, VLSI circuits, digital integrated circuits, test generation algorithms |
Displaying result #1 - #1 of 1 (100 per page; Change: )
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