Search results for "fault dominance"

Found 13 publication records. Showing 13 according to the selection in the facets

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
2	Shiyi Xu	A New Approach to Improving the Test Effectiveness in Software Testing Using Fault Collapsing.	PRDC	2006	DBLP DOI BibTeX RDF	Software Testing, Mutation Testing, Testing Effectiveness, Fault Equivalence, Fault Dominance
2	Irith Pomeranz, Sudhakar M. Reddy	On Generating Tests that Avoid the Detection of Redundant Faults in Synchronous Sequential Circuits with Full Scan.	IEEE Trans. Computers	2006	DBLP DOI BibTeX RDF	overtesting, test generation, Design-for-testability, synchronous sequential circuits, redundant faults, full-scan, fault dominance
2	Irith Pomeranz, Sudhakar M. Reddy	On fault equivalence, fault dominance, and incompletely specified test sets.	IEEE Trans. on CAD of Integrated Circuits and Systems	2005	DBLP DOI BibTeX RDF
2	Ilia Polian, Irith Pomeranz, Bernd Becker	Exact Computation of Maximally Dominating Faults and Its Application to n-Detection Tests.	Asian Test Symposium	2002	DBLP DOI BibTeX RDF	n-detection, BDDs, formal techniques, Fault dominance
2	Irith Pomeranz, Sudhakar M. Reddy	On the Use of Fault Dominance in n-Detection Test Generation.	VTS	2001	DBLP DOI BibTeX RDF
1	Rajsekhar Adapa, Spyros Tragoudas, Maria K. Michael	Improved diagnosis using enhanced fault dominance.	Integration	2011	DBLP DOI BibTeX RDF
1	Irith Pomeranz, Sudhakar M. Reddy	Equivalence, Dominance, and Similarity Relations between Fault Pairs and a Fault Pair Collapsing Process for Fault Diagnosis.	IEEE Trans. Computers	2010	DBLP DOI BibTeX RDF	Diagnostic fault simulation, diagnostic test generation, fault diagnosis, fault collapsing, fault equivalence, fault dominance
1	Irith Pomeranz, Sudhakar M. Reddy	Fault Collapsing for Transition Faults Using Extended Transition Faults.	European Test Symposium	2006	DBLP DOI BibTeX RDF
1	Bharath Seshadri, Irith Pomeranz, Srikanth Venkataraman, Enamul Amyeen, Sudhakar M. Reddy	Dominance Based Analysis for Large Volume Production Fail Diagnosis.	VTS	2006	DBLP DOI BibTeX RDF
1	Raja K. K. R. Sandireddy, Vishwani D. Agrawal	Diagnostic and Detection Fault Collapsing for Multiple Output Circuits.	DATE	2005	DBLP DOI BibTeX RDF
1	Irith Pomeranz, Sudhakar M. Reddy	Level of Similarity: A Metric for Fault Collapsing.	DATE	2004	DBLP DOI BibTeX RDF
1	Daniel P. Siewiorek	Reliability Modeling of Compensating Module Failures in Majority Voted Redundancy.	IEEE Trans. Computers	1975	DBLP DOI BibTeX RDF	Compensating module failures, mission time improvement, triple modular redundancy (TMR), fault equivalence, fault dominance
1	David T. Wang	Properties of Faults and Criticalities of Values under Tests for Combinational Networks.	IEEE Trans. Computers	1975	DBLP DOI BibTeX RDF	Criticality of values under test, test generation, fault detection, fault location, fault masking, fault equivalence, fault dominance