Search results for "fault equivalence"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
3	Marie-Lise Flottes, Christian Landrault, Serge Pravossoudovitch	Fault modeling and fault equivalence in CMOS technology.	J. Electronic Testing	1991	DBLP DOI BibTeX RDF	test generation, Fault modeling, fault collapsing, fault equivalence
2	Irith Pomeranz, Sudhakar M. Reddy	On fault equivalence, fault dominance, and incompletely specified test sets.	IEEE Trans. on CAD of Integrated Circuits and Systems	2005	DBLP DOI BibTeX RDF
2	Andreas G. Veneris, Robert Chang, Magdy S. Abadir, Sep Seyedi	Functional Fault Equivalence and Diagnostic Test Generation in Combinational Logic Circuits Using Conventional ATPG.	J. Electronic Testing	2005	DBLP DOI BibTeX RDF	diagnostic test generation, VLSI, test generation, fault
2	Enamul Amyeen, W. Kent Fuchs, Irith Pomeranz, Vamsi Boppana	Fault equivalence identification in combinational circuits using implication and evaluation techniques.	IEEE Trans. on CAD of Integrated Circuits and Systems	2003	DBLP DOI BibTeX RDF
2	Enamul Amyeen, W. Kent Fuchs, Irith Pomeranz, Vamsi Boppana	Implication and Evaluation Techniques for Proving Fault Equivalence.	VTS	1999	DBLP DOI BibTeX RDF
1	Siva Kumar Sastry Hari, Sarita V. Adve, Helia Naeimi, Pradeep Ramachandran	Relyzer: exploiting application-level fault equivalence to analyze application resiliency to transient faults.	ASPLOS	2012	DBLP DOI BibTeX RDF
1	Nuno Guerreiro, Marcelino Santos	Mixed-Signal Fault Equivalence: Search and Evaluation.	Asian Test Symposium	2011	DBLP DOI BibTeX RDF
1	Irith Pomeranz, Sudhakar M. Reddy	Equivalence, Dominance, and Similarity Relations between Fault Pairs and a Fault Pair Collapsing Process for Fault Diagnosis.	IEEE Trans. Computers	2010	DBLP DOI BibTeX RDF	Diagnostic fault simulation, diagnostic test generation, fault diagnosis, fault collapsing, fault equivalence, fault dominance
1	Shiyi Xu	A New Approach to Improving the Test Effectiveness in Software Testing Using Fault Collapsing.	PRDC	2006	DBLP DOI BibTeX RDF	Software Testing, Mutation Testing, Testing Effectiveness, Fault Equivalence, Fault Dominance
1	Raja K. K. R. Sandireddy, Vishwani D. Agrawal	Diagnostic and Detection Fault Collapsing for Multiple Output Circuits.	DATE	2005	DBLP DOI BibTeX RDF
1	Andreas G. Veneris, Robert Chang, Magdy S. Abadir, Mandana Amiri	Fault equivalence and diagnostic test generation using ATPG.	ISCAS	2004	DBLP BibTeX RDF
1	Irith Pomeranz, Sudhakar M. Reddy	Level of Similarity: A Metric for Fault Collapsing.	DATE	2004	DBLP DOI BibTeX RDF
1	Enamul Amyeen, W. Kent Fuchs, Irith Pomeranz, Vamsi Boppana	Fault Equivalence Identification Using Redundancy Information and Static and Dynamic Extraction.	VTS	2001	DBLP DOI BibTeX RDF
1	Matthew Worsman, Mike W. T. Wong, Y. S. Lee	A Pre-Simulation Measure of D.C. Design-for-Testability Fault Diagnosis Quality.	ISQED	2000	DBLP DOI BibTeX RDF	Equivalent faults, One-port circuits, Fault diagnosis, Design for testability, Fault collapsing
1	Ismed Hartanto, Vamsi Boppana, W. Kent Fuchs	Diagnostic Fault Equivalence Identification Using Redundancy Information and Structural Analysis.	ITC	1996	DBLP DOI BibTeX RDF
1	Antonio Lloy	Advanced Fault Collapsing (Logic Circuits Testing).	IEEE Design & Test of Computers	1992	DBLP DOI BibTeX RDF
1	Antonio Lioy	Looking for Functional Fault Equivalence.	ITC	1991	DBLP DOI BibTeX RDF
1	Marie-Lise Flottes, Christian Landrault, Serge Pravossoudovitch	Fault modelling and fault equivalence in CMOS technology.	EURO-DAC	1990	DBLP DOI BibTeX RDF	Fault modelling, Test pattern generation, Fault collapsing
1	Frantisek Kremla	General Criterion for Essential Nonfault Locatability of Logical Functions.	IEEE Trans. Computers	1987	DBLP DOI BibTeX RDF	two-element Boolean algebra, Boolean combinational circuit (CC), congruence relation, essential nonfault locatability, fault equivalence class, finite Boolean construct, tolerance relation, stuck faults
1	Ayee Goundan, John P. Hayes	Identification of Equivalent Faults in Logic Networks.	IEEE Trans. Computers	1980	DBLP DOI BibTeX RDF	two-level networks, fault diagnosis, logic design, Combinational networks, fault equivalence
1	Ayee Goundan, John P. Hayes	Design of Totally Fault Locatable Combinational Networks.	IEEE Trans. Computers	1980	DBLP DOI BibTeX RDF	totally fault locatable networks, easily testable networks, fault diagnosis, logic design, Combinational networks, fault equivalence
1	Daniel P. Siewiorek	Reliability Modeling of Compensating Module Failures in Majority Voted Redundancy.	IEEE Trans. Computers	1975	DBLP DOI BibTeX RDF	Compensating module failures, mission time improvement, triple modular redundancy (TMR), fault equivalence, fault dominance
1	David T. Wang	Properties of Faults and Criticalities of Values under Tests for Combinational Networks.	IEEE Trans. Computers	1975	DBLP DOI BibTeX RDF	Criticality of values under test, test generation, fault detection, fault location, fault masking, fault equivalence, fault dominance