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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 26 occurrences of 23 keywords
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Results
Found 21 publication records. Showing 21 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 2 | Hans-Georg Martin |
Retiming for Circuits with Enable Registers.  |
EUROMICRO  |
1996 |
DBLP DOI BibTeX RDF |
enable registers, circuit retiming, combinational paths, D-Flipflops, retiming algorithm, sequential elements, high level synthesis, high level synthesis, digital circuits |
| 1 | Ning Chen, Bing Li, Ulf Schlichtmann |
Timing Modeling of Flipflops Considering Aging Effects.  |
PATMOS  |
2011 |
DBLP DOI BibTeX RDF |
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| 1 | Hiroki Sunagawa, Hidetoshi Onodera |
Variation-tolerant design of D-flipflops.  |
SoCC  |
2010 |
DBLP DOI BibTeX RDF |
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| 1 | Amir Masoud Gharehbaghi, Bijan Alizadeh, Masahiro Fujita |
Aggressive overclocking support using a novel timing error recovery technique on FPGAs (abstract only).  |
FPGA  |
2010 |
DBLP DOI BibTeX RDF |
overclocking, timing error detection, timing error recovery, fpga |
| 1 | Flavio Carbognani, Luca Henzen |
Cross-over current suppressing latch compared to state-of-the-art for low-power low-frequency applications with resonant clocking.  |
ISLPED  |
2009 |
DBLP DOI BibTeX RDF |
flipflops, low power design, clock, digital circuits, adiabatic |
| 1 | Dong Xiang, Mingjing Chen, Jia-Guang Sun |
Scan BIST with biased scan test signals.  |
Science in China Series F: Information Sciences  |
2008 |
DBLP DOI BibTeX RDF |
random testability, test signal, biased random testing, scan-based BIST |
| 1 | Ganesh Venkataraman, Jiang Hu |
A Placement Methodology for Robust Clocking.  |
VLSI Design  |
2007 |
DBLP DOI BibTeX RDF |
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| 1 | Sanjay Burman, Debdeep Mukhopadhyay, Kamakoti Veezhinathan |
LFSR Based Stream Ciphers Are Vulnerable to Power Attacks.  |
INDOCRYPT  |
2007 |
DBLP DOI BibTeX RDF |
Linear Feed Back Shift Registers, Dynamic Power Dissipation, Side Channel Attacks, Power Analysis, Hamming Distance |
| 1 | Rajeev R. Rao, David Blaauw, Dennis Sylvester |
Soft error reduction in combinational logic using gate resizing and flipflop selection.  |
ICCAD  |
2006 |
DBLP DOI BibTeX RDF |
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| 1 | Kentaroh Katoh, Hideo Ito |
Built-In Self-Test for PEs of Coarse Grained Dynamically Reconfigurable Devices.  |
European Test Symposium  |
2006 |
DBLP DOI BibTeX RDF |
Coarse Grained Dynamically Reconfigurable Devices, DRP, BIST(Built-In Self Test), PE, DFT |
| 1 | Vivek Joshi, Rajeev R. Rao, David Blaauw, Dennis Sylvester |
Logic SER Reduction through Flipflop Redesign.  |
ISQED  |
2006 |
DBLP DOI BibTeX RDF |
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| 1 | Hans-Dieter Wohlmuth, Daniel Kehrer |
A 24 GHz dual-modulus prescaler in 90nm CMOS.  |
ISCAS  |
2005 |
DBLP DOI BibTeX RDF |
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| 1 | Mario R. Casu, Luca Macchiarulo |
Floorplanning for throughput.  |
ISPD  |
2004 |
DBLP DOI BibTeX RDF |
systems-on-chip, throughput, floorplanning, wire pipelining |
| 1 | Gundolf Kiefer, Hans-Joachim Wunderlich |
Deterministic BIST with Partial Scan.  |
J. Electronic Testing  |
2000 |
DBLP DOI BibTeX RDF |
deterministic scan-based BIST, partial scan |
| 1 | Jason Cong, Chang Wu |
FPGA Synthesis with Retiming and Pipelining for Clock Period Minimization of Sequential Circuits.  |
DAC  |
1997 |
DBLP DOI BibTeX RDF |
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| 1 | Sybille Hellebrand, Hans-Joachim Wunderlich |
An efficient procedure for the synthesis of fast self-testable controller structures.  |
ICCAD  |
1994 |
DBLP DOI BibTeX RDF |
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| 1 | Soumitra Bose, Prathima Agrawal, Vishwani D. Agrawal |
The optimistic update theorem for path delay testing in sequential circuits.  |
J. Electronic Testing  |
1993 |
DBLP DOI BibTeX RDF |
test generation, Fault simulation, timing analysis, path delay faults |
| 1 | Hyoung B. Min, William A. Rogers |
A test methodology for finite state machines using partial scan design.  |
J. Electronic Testing  |
1992 |
DBLP DOI BibTeX RDF |
loop-free circuits, test generation, ATPG, fault, partial scan |
| 1 | Arno Kunzmann, Hans-Joachim Wunderlich |
An analytical approach to the partial scan problem.  |
J. Electronic Testing  |
1990 |
DBLP DOI BibTeX RDF |
partial scan path, sequential test generation, design for testability |
| 1 | Winfried Hahn, Kristian Fischer |
MuSiC: an event-flow computer for fast simulation of digital systems.  |
DAC  |
1985 |
DBLP DOI BibTeX RDF |
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| 1 | Klaus Lagemann |
Ein Vorschlag zur Darstellung asynchron betriebener JK-Flipflops.  |
Elektronische Rechenanlagen  |
1968 |
DBLP BibTeX RDF |
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