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Searching for flipflops with no syntactic query expansion in all metadata.

Publication years (Num. hits)
1968-2007 (16) 2008-2011 (5)
Publication types (Num. hits)
article(6) inproceedings(15)
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The graphs summarize 26 occurrences of 23 keywords

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Found 21 publication records. Showing 21 according to the selection in the facets
Hits ? Authors Title Venue Year Link Author keywords
2Hans-Georg Martin Retiming for Circuits with Enable Registers. Search on Bibsonomy EUROMICRO The full citation details ... 1996 DBLP  DOI  BibTeX  RDF enable registers, circuit retiming, combinational paths, D-Flipflops, retiming algorithm, sequential elements, high level synthesis, high level synthesis, digital circuits
1Ning Chen, Bing Li, Ulf Schlichtmann Timing Modeling of Flipflops Considering Aging Effects. Search on Bibsonomy PATMOS The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
1Hiroki Sunagawa, Hidetoshi Onodera Variation-tolerant design of D-flipflops. Search on Bibsonomy SoCC The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
1Amir Masoud Gharehbaghi, Bijan Alizadeh, Masahiro Fujita Aggressive overclocking support using a novel timing error recovery technique on FPGAs (abstract only). Search on Bibsonomy FPGA The full citation details ... 2010 DBLP  DOI  BibTeX  RDF overclocking, timing error detection, timing error recovery, fpga
1Flavio Carbognani, Luca Henzen Cross-over current suppressing latch compared to state-of-the-art for low-power low-frequency applications with resonant clocking. Search on Bibsonomy ISLPED The full citation details ... 2009 DBLP  DOI  BibTeX  RDF flipflops, low power design, clock, digital circuits, adiabatic
1Dong Xiang, Mingjing Chen, Jia-Guang Sun Scan BIST with biased scan test signals. Search on Bibsonomy Science in China Series F: Information Sciences The full citation details ... 2008 DBLP  DOI  BibTeX  RDF random testability, test signal, biased random testing, scan-based BIST
1Ganesh Venkataraman, Jiang Hu A Placement Methodology for Robust Clocking. Search on Bibsonomy VLSI Design The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
1Sanjay Burman, Debdeep Mukhopadhyay, Kamakoti Veezhinathan LFSR Based Stream Ciphers Are Vulnerable to Power Attacks. Search on Bibsonomy INDOCRYPT The full citation details ... 2007 DBLP  DOI  BibTeX  RDF Linear Feed Back Shift Registers, Dynamic Power Dissipation, Side Channel Attacks, Power Analysis, Hamming Distance
1Rajeev R. Rao, David Blaauw, Dennis Sylvester Soft error reduction in combinational logic using gate resizing and flipflop selection. Search on Bibsonomy ICCAD The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
1Kentaroh Katoh, Hideo Ito Built-In Self-Test for PEs of Coarse Grained Dynamically Reconfigurable Devices. Search on Bibsonomy European Test Symposium The full citation details ... 2006 DBLP  DOI  BibTeX  RDF Coarse Grained Dynamically Reconfigurable Devices, DRP, BIST(Built-In Self Test), PE, DFT
1Vivek Joshi, Rajeev R. Rao, David Blaauw, Dennis Sylvester Logic SER Reduction through Flipflop Redesign. Search on Bibsonomy ISQED The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
1Hans-Dieter Wohlmuth, Daniel Kehrer A 24 GHz dual-modulus prescaler in 90nm CMOS. Search on Bibsonomy ISCAS The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
1Mario R. Casu, Luca Macchiarulo Floorplanning for throughput. Search on Bibsonomy ISPD The full citation details ... 2004 DBLP  DOI  BibTeX  RDF systems-on-chip, throughput, floorplanning, wire pipelining
1Gundolf Kiefer, Hans-Joachim Wunderlich Deterministic BIST with Partial Scan. Search on Bibsonomy J. Electronic Testing The full citation details ... 2000 DBLP  DOI  BibTeX  RDF deterministic scan-based BIST, partial scan
1Jason Cong, Chang Wu FPGA Synthesis with Retiming and Pipelining for Clock Period Minimization of Sequential Circuits. Search on Bibsonomy DAC The full citation details ... 1997 DBLP  DOI  BibTeX  RDF
1Sybille Hellebrand, Hans-Joachim Wunderlich An efficient procedure for the synthesis of fast self-testable controller structures. Search on Bibsonomy ICCAD The full citation details ... 1994 DBLP  DOI  BibTeX  RDF
1Soumitra Bose, Prathima Agrawal, Vishwani D. Agrawal The optimistic update theorem for path delay testing in sequential circuits. Search on Bibsonomy J. Electronic Testing The full citation details ... 1993 DBLP  DOI  BibTeX  RDF test generation, Fault simulation, timing analysis, path delay faults
1Hyoung B. Min, William A. Rogers A test methodology for finite state machines using partial scan design. Search on Bibsonomy J. Electronic Testing The full citation details ... 1992 DBLP  DOI  BibTeX  RDF loop-free circuits, test generation, ATPG, fault, partial scan
1Arno Kunzmann, Hans-Joachim Wunderlich An analytical approach to the partial scan problem. Search on Bibsonomy J. Electronic Testing The full citation details ... 1990 DBLP  DOI  BibTeX  RDF partial scan path, sequential test generation, design for testability
1Winfried Hahn, Kristian Fischer MuSiC: an event-flow computer for fast simulation of digital systems. Search on Bibsonomy DAC The full citation details ... 1985 DBLP  DOI  BibTeX  RDF
1Klaus Lagemann Ein Vorschlag zur Darstellung asynchron betriebener JK-Flipflops. Search on Bibsonomy Elektronische Rechenanlagen The full citation details ... 1968 DBLP  BibTeX  RDF
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