Search results for "integrated circuit manufacture"

Found 4 publication records. Showing 4 according to the selection in the facets

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
1	C. H. Tong, Juan C. Meza, C. D. Moen	Simulation of equipment design optimisation in microelectronics manufacturing.	Annual Simulation Symposium	1997	DBLP DOI BibTeX RDF	equipment design optimisation simulation, microelectronics manufacturing, mathematical formulations, object oriented simulation environment, parametric study, short cycle time chemical vapor deposition reactor, numerical optimization problems, heat conduction, species transport simulation codes, modern optimization software, object oriented optimization environment, software architecture, optimization problems, integrated circuit manufacture
1	Prathima Agrawal, B. Narendran, Narayanan Shivakumar	Multi-way partitioning of VLSI circuits.	VLSI Design	1996	DBLP DOI BibTeX RDF	multi-way partitioning, hierarchical design processes, nets cut metric, VLSI, delays, economics, logic CAD, VLSI layout, integrated circuit layout, VLSI circuits, logic partitioning, minimisation of switching nets, average delay, integrated circuit manufacture, cost metric
1	L. F. Fuller, C. Kraaijenvanger	Design and manufacture of a 2K transistor p-well CMOS gate array in a student run factory at RIT.	Great Lakes Symposium on VLSI	1995	DBLP DOI BibTeX RDF	educational aids, p-well CMOS gate array, student run factory, microelectronic engineering program, wafer fabrication, logic design, integrated circuit design, integrated circuit design, CMOS logic circuits, logic arrays, teaching tool, integrated circuit manufacture, integrated circuit manufacturing, electronic engineering education
1	Claude Thibeault, Yvon Savaria, Jean-Louis Houle	A Fast Method to Evaluate the Optimum Number of Spares in Defect-Tolerant Integrated Circuits.	IEEE Trans. Computers	1994	DBLP DOI BibTeX RDF	defect-tolerant integrated circuits, optimum number of spares, reconfiguration strategies, optimum redundancy, VLSI, logic testing, redundancy, defect tolerance, circuit reliability, yield models, integrated circuit manufacture

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