|
|
|
|
Venues (Conferences, Journals, ...)
|
|
|
GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
The graphs summarize 7 occurrences of 7 keywords
|
|
|
|
|
Results
Found 2 publication records. Showing 2 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 2 | Juan Antonio Maestro, Pedro Reviriego |
Study of the effects of MBUs on the reliability of a 150 nm SRAM device.  |
DAC  |
2008 |
DBLP DOI BibTeX RDF |
multiple bit upsets (MBUs), reliability, memory, radiation |
| 1 | Pilar Reyes, Pedro Reviriego, Juan Antonio Maestro, Oscar Ruano |
Fault Tolerance Analysis of Communication System Interleavers: the 802.11a Case Study.  |
Signal Processing Systems  |
2008 |
DBLP DOI BibTeX RDF |
single event upsets (SEUs), multiple bit upsets (MBUs), fault tolerance, redundancy, soft errors, interleaving |
Displaying result #1 - #2 of 2 (100 per page; Change: )
|
|