Search results for "n-detection test sets"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
3	Irith Pomeranz, Sudhakar M. Reddy	Forming N-detection test sets without test generation.	ACM Trans. Design Autom. Electr. Syst.	2007	DBLP DOI BibTeX RDF	test generation, stuck-at faults, Bridging faults, n-detection test sets
2	Irith Pomeranz, Sudhakar M. Reddy	The Cut Delay Fault Model for Guiding the Generation of n-Detection Test Sets for Transition Faults.	VLSI Design	2006	DBLP DOI BibTeX RDF
2	Irith Pomeranz, Sudhakar M. Reddy	Worst-Case and Average-Case Analysis of n-Detection Test Sets.	DATE	2005	DBLP DOI BibTeX RDF
2	Irith Pomeranz, Sudhakar M. Reddy	A Measure of Quality for n-Detection Test Sets.	IEEE Trans. Computers	2004	DBLP DOI BibTeX RDF	n-detection tests, test set ordering, unmodeled faults
2	Irith Pomeranz, Sudhakar M. Reddy	On test data compression and n-detection test sets.	DAC	2003	DBLP DOI BibTeX RDF	test generation, test data compression, n-detection test sets
2	Irith Pomeranz, Sudhakar M. Reddy	On n-detection test sets and variable n-detection test sets fortransition faults.	IEEE Trans. on CAD of Integrated Circuits and Systems	2000	DBLP DOI BibTeX RDF
2	Irith Pomeranz, Sudhakar M. Reddy	On n-Detection Test Sets and Variable n-Detection Test Sets for Transition Faults.	VTS	1999	DBLP DOI BibTeX RDF
1	Irith Pomeranz, Sudhakar M. Reddy	Forward-Looking Reverse Order Fault Simulation for n -Detection Test Sets.	IEEE Trans. on CAD of Integrated Circuits and Systems	2009	DBLP DOI BibTeX RDF
1	Irith Pomeranz, Sudhakar M. Reddy	Partitioned n-detection test generation.	ACM Great Lakes Symposium on VLSI	2009	DBLP DOI BibTeX RDF	fault partitioning, test generation, stuck-at faults, bridging faults, n-detection test sets
1	Stefan Spinner, Ilia Polian, Piet Engelke, Bernd Becker, Martin Keim, Wu-Tung Cheng	Automatic Test Pattern Generation for Interconnect Open Defects.	VTS	2008	DBLP DOI BibTeX RDF	Interconnect opens, Open-via defects, ATPG
1	Zhanglei Wang, Krishnendu Chakrabarty	Test-Quality/Cost Optimization Using Output-Deviation-Based Reordering of Test Patterns.	IEEE Trans. on CAD of Integrated Circuits and Systems	2008	DBLP DOI BibTeX RDF
1	Irith Pomeranz, Sudhakar M. Reddy	Worst-Case and Average-Case Analysis of n-Detection Test Sets	CoRR	2007	DBLP BibTeX RDF
1	Irith Pomeranz, Sudhakar M. Reddy	Worst-case and average-case analysis of n-detection test sets and test generation strategies.	IET Computers & Digital Techniques	2007	DBLP DOI BibTeX RDF
1	Irith Pomeranz, Sudhakar M. Reddy	On the saturation of n-detection test sets with increased n.	ITC	2007	DBLP DOI BibTeX RDF
1	Irith Pomeranz, Sudhakar M. Reddy	Generation of Broadside Transition-Fault Test Sets That Detect Four-Way Bridging Faults.	IEEE Trans. on CAD of Integrated Circuits and Systems	2007	DBLP DOI BibTeX RDF
1	Irith Pomeranz, Sudhakar M. Reddy	Generation of broadside transition fault test sets that detect four-way bridging faults.	DATE	2006	DBLP DOI BibTeX RDF
1	Irith Pomeranz, Sudhakar M. Reddy	Forming N-detection test sets from one-detection test sets without test generation.	ITC	2005	DBLP DOI BibTeX RDF
1	Irith Pomeranz	N-detection under transparent-scan.	DAC	2005	DBLP DOI BibTeX RDF	test generation, scan design, n-detection test sets
1	Hiroshi Takahashi, Kewal K. Saluja, Yuzo Takamatsu	An Alternative Method of Generating Tests for Path Delay Faults Using N -Detection Test Sets.	PRDC	2002	DBLP DOI BibTeX RDF
1	Ilia Polian, Irith Pomeranz, Bernd Becker	Exact Computation of Maximally Dominating Faults and Its Application to n-Detection Tests.	Asian Test Symposium	2002	DBLP DOI BibTeX RDF	n-detection, BDDs, formal techniques, Fault dominance
1	Irith Pomeranz, Sudhakar M. Reddy	On the Use of Fault Dominance in n-Detection Test Generation.	VTS	2001	DBLP DOI BibTeX RDF
1	Irith Pomeranz, Sudhakar M. Reddy	On the Compaction of Test Sets Produced by Genetic Optimization.	Asian Test Symposium	1997	DBLP DOI BibTeX RDF	test generation, test compaction, genetic optimization, n-detection test sets
1	Irith Pomeranz, Sudhakar M. Reddy	On n-detection test sequences for synchronous sequential circuits343.	VTS	1997	DBLP DOI BibTeX RDF	n-detection test sequences, stuck-at fault detection, test generation procedures, logic testing, fault simulation, synchronous sequential circuits, defect coverages