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Results
Found 1 publication records. Showing 1 according to the selection in the facets
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Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 2 | Yuhai Ma, Wanchun Shi |
Intelligent Analysis and Off-Line Debugging of VLSI Device Test Programs.  |
J. Electronic Testing  |
1999 |
DBLP DOI BibTeX RDF |
error type, off-line debugging environment, FCE (Fuzzy Comprehensive Evaluation), reference set, evaluation space, evaluation factor, evaluation remark, test entity, relevance coefficient, fuzzy set, fuzzy relation, test program |
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