Search results for "radiation effects"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
1	Pierre-Étienne Druet, Olaf Klein, Jürgen Sprekels, Fredi Tröltzsch, Irwin Yousept	Optimal Control of Three-Dimensional State-Constrained Induction Heating Problems with Nonlocal Radiation Effects.	SIAM J. Control and Optimization	2011	DBLP DOI BibTeX RDF
1	Azizah Ahmad, Rusnani Ariffin, Norhayati Mohamad Noor, Meor Adzmey Sagiruddin	1.8 GHz Radio Frequency signal radiation effects on human health.	ICCSCE	2011	DBLP DOI BibTeX RDF
1	S. Libertino, D. Corso, G. Murè, A. Marino, F. Palumbo, F. Principato, G. Cannella, T. Schillaci, S. Giarusso, F. Celi, M. Lisiansky, Y. Roizin, Salvatore Lombardo	Radiation effects in nitride read-only memories.	Microelectronics Reliability	2010	DBLP DOI BibTeX RDF
1	Jian Wang, Wenhua Wang, Ru Huang, Yunpeng Pei, Shoubin Xue, Xin'an Wang, Chunhui Fan, Yangyuan Wang	Deteriorated radiation effects impact on the characteristics of MOS transistors with multi-finger configuration.	Microelectronics Reliability	2010	DBLP DOI BibTeX RDF
1	A. Mahdy, A. J. Chamkha, Yousef Baba	Double-diffusive convection with variable viscosity from a vertical truncated cone in porous media in the presence of magnetic field and radiation effects.	Computers & Mathematics with Applications	2010	DBLP DOI BibTeX RDF
1	Tiago R. Balen, Marcelo Lubaszewski	Radiation effects on programmable analog devices and mitigation techniques.	IOLTS	2010	DBLP DOI BibTeX RDF
1	Hugh J. Barnaby, Michael L. McLain, Ivan S. Esqueda, Xiao J. Chen	Modeling Ionizing Radiation Effects in Solid State Materials and CMOS Devices.	IEEE Trans. on Circuits and Systems	2009	DBLP DOI BibTeX RDF
1	Pedro Reviriego, Juan Antonio Maestro	Efficient error detection codes for multiple-bit upset correction in SRAMs with BICS.	ACM Trans. Design Autom. Electr. Syst.	2009	DBLP DOI BibTeX RDF	high-level protection technique, protection against radiation, error correcting codes, Fault tolerant memory
1	Tobias Koal, Daniel Scheit, Heinrich Theodor Vierhaus	A scheme of logic self repair including local interconnects.	DDECS	2009	DBLP DOI BibTeX RDF
1	Luca Sterpone	Timing Driven Placement for Fault Tolerant Circuits Implemented on SRAM-Based FPGAs.	ARC	2009	DBLP DOI BibTeX RDF	fault tolerance, FPGA, Single Event Upset, Triple Modular Redundancy, Timing-driven Placement
1	Jinyu Ruan, E. Papandreou, M. Lamhamdi, M. Koutsoureli, Fabio Coccetti, Patrick Pons, George Papaioannou, Robert Plana	Alpha particle radiation effects in RF MEMS capacitive switches.	Microelectronics Reliability	2008	DBLP DOI BibTeX RDF
1	Rafael Cortell Bataller	Radiation effects for the Blasius and Sakiadis flows with a convective surface boundary condition.	Applied Mathematics and Computation	2008	DBLP DOI BibTeX RDF
1	Rafael Cortell Bataller	Radiation effects in the Blasius flow.	Applied Mathematics and Computation	2008	DBLP DOI BibTeX RDF
1	Carlos Arthur Lang Lisbôa, Costas Argyrides, Dhiraj K. Pradhan, Luigi Carro	Algorithm Level Fault Tolerance: A Technique to Cope with Long Duration Transient Faults in Matrix Multiplication Algorithms.	VTS	2008	DBLP DOI BibTeX RDF	radiation effects, long transients, recomputation granularity, fault tolerance
1	Alexander I. Fedoseyev, Marek Turowski, Ashok Raman, Michael L. Alles, Robert A. Weller	Multiscale Numerical Models for Simulation of Radiation Events in Semiconductor Devices.	ICCS	2008	DBLP DOI BibTeX RDF	Nanoscale device, radiation event, nuclear reaction, 3D transient simulation, 3D adaptive mesh generation, drift-diffusion, computer-aided-design, multiscale, finite volume method, hydrodynamics
1	Pilar Reyes, Pedro Reviriego, Juan Antonio Maestro, Oscar Ruano	Fault Tolerance Analysis of Communication System Interleavers: the 802.11a Case Study.	Signal Processing Systems	2008	DBLP DOI BibTeX RDF	single event upsets (SEUs), multiple bit upsets (MBUs), fault tolerance, redundancy, soft errors, interleaving
1	Noriyuki B. Ouchi	Computer Modeling of Radiation Effects.	Data Science Journal	2007	DBLP BibTeX RDF
1	Sanjay Gupta, Taranjit Kukal, Alok Tripathi, Raja Mitra, Ashish Patni, Siddarth Shetty	Tutorial T7B: RF Analysis and Simulation with Focus on RF SiP Methodology.	VLSI Design	2007	DBLP DOI BibTeX RDF
1	A. Crunteanu, Arnaud Pothier, Pierre Blondy, F. Dumas-Bouchiat, C. Champeaux, A. Catherinot, P. Tristant, O. Vendier, Claude Drevon, Jean Louis Cazaux	Gamma radiation effects on RF MEMS capacitive switches.	Microelectronics Reliability	2006	DBLP DOI BibTeX RDF
1	Gilson I. Wirth, Ivandro Ribeiro, Michele G. Vieira, Fernanda Gusmão de Lima Kastensmidt	Single event transients in dynamic logic.	SBCCI	2006	DBLP DOI BibTeX RDF	integrated circuits, dynamic logic, single event transients
1	Alain Tran, Mustapha Chérif-Eddine Yagoub	Effects of Dipole Length on Dosimetric Probe Sensitivity.	CCECE	2006	DBLP DOI BibTeX RDF
1	William Heidergott	SEU tolerant device, circuit and processor design.	DAC	2005	DBLP DOI BibTeX RDF	error detection and correction coding, radiation effects, soft error rate, fault tolerant systems, single event upset, fault masking, temporal redundancy, modular redundancy, fault avoidance
1	G. Robert Redinbo, Cung Nguyen	Concurrent Error Detection in Wavelet Lifting Transforms.	IEEE Trans. Computers	2004	DBLP DOI BibTeX RDF
1	S. Cimino, A. Cester, Alessandro Paccagnella, G. Ghidini	Ionising radiation effects on MOSFET drain current.	Microelectronics Reliability	2003	DBLP DOI BibTeX RDF
1	Christian Galke, Marcus Grabow, Heinrich Theodor Vierhaus	Perspectives of Combining on-line and off-line Test Technology for Dependable Systems on a Chip.	IOLTS	2003	DBLP DOI BibTeX RDF
1	Ari Virtanen	Radiation Effects Facility RADEF.	IOLTW	2002	DBLP DOI BibTeX RDF
1	Érika F. Cota, Fernanda Lima, Sana Rezgui, Luigi Carro, Raoul Velazco, Marcelo Lubaszewski, Ricardo Reis	Synthesis of an 8051-Like Micro-Controller Tolerant to Transient Faults.	J. Electronic Testing	2001	DBLP DOI BibTeX RDF	integrated circuits radiation effects, aerospace testing, built-in-testing, microprocessor testing
1	Douglas W. Caldwell, David A. Rennels	A Minimalist Fault-Tolerant Microcontroller Design for Embedded Spacecraft Computing.	The Journal of Supercomputing	2000	DBLP DOI BibTeX RDF	fault-insertion testing, space radiation, single-event effects (SEE), fault-tolerance, microcontroller, embedded computing, real-time computing
1	Eugeni García-Moreno, Benjamín Iñíguez, Miquel Roca, Jaume Segura, Eugeni Isern	Clocked Dosimeter Compatible with Digital CMOS Technology.	J. Electronic Testing	1998	DBLP DOI BibTeX RDF	radiation dosimeter, radiation effects, digital circuits, CMOS technology
1	A. Reisman	Ionizing radiation effects on ULSI device yield and reliability.	The Journal of Supercomputing	1990	DBLP DOI BibTeX RDF
1	Bharat L. Bhuva, John J. Paulos, Ronald S. Gyurcsik, Sherra E. Kerns	Switch-level simulation of total dose effects on CMOS VLSI circuits.	IEEE Trans. on CAD of Integrated Circuits and Systems	1989	DBLP DOI BibTeX RDF