Search results for "scan-based tests"

Found 12 publication records. Showing 12 according to the selection in the facets

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
1	Irith Pomeranz, Sudhakar M. Reddy	Hazard-Based Detection Conditions for Improved Transition Fault Coverage of Scan-Based Tests.	IEEE Trans. VLSI Syst.	2010	DBLP DOI BibTeX RDF
1	Irith Pomeranz, Sudhakar M. Reddy	Using stuck-at tests to form scan-based tests for transition faults in standard-scan circuits.	ACM Trans. Design Autom. Electr. Syst.	2009	DBLP DOI BibTeX RDF
1	Irith Pomeranz, Sudhakar M. Reddy	State persistence: a property for guiding test generation.	ACM Great Lakes Symposium on VLSI	2009	DBLP DOI BibTeX RDF	broadside tests, test generation, transition faults, scan-based tests
1	Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz	Detectability of internal bridging faults in scan chains.	ASP-DAC	2009	DBLP DOI BibTeX RDF
1	Jia Li, Qiang Xu, Yu Hu, Xiaowei Li	iFill: An Impact-Oriented X-Filling Method for Shift- and Capture-Power Reduction in At-Speed Scan-Based Testing.	DATE	2008	DBLP DOI BibTeX RDF
1	Santiago Remersaro, Xijiang Lin, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski	Scan-Based Tests with Low Switching Activity.	IEEE Design & Test of Computers	2007	DBLP DOI BibTeX RDF	scan shift, test response capture, supply current, power dissipation, switching activity, scan-based test
1	Sandeep Jain, Jais Abraham, Srinivas Kumar Vooka, Sumant Kale, Amit Dutta, Rubin A. Parekhji	Enhancements in Deterministic BIST Implementations for Improving Test of Complex SOCs.	VLSI Design	2007	DBLP DOI BibTeX RDF
1	Dimitris Gizopoulos, Robert C. Aitken, S. Kundu	Guest Editorial: Special Section on "Autonomous Silicon Validation and Testing of Microprocessors and Microprocessor-Based Systems".	IEEE Trans. VLSI Syst.	2007	DBLP DOI BibTeX RDF
1	Peter Wohl, John A. Waicukauski, Sanjay Patel, Cy Hay, Emil Gizdarski, Ben Mathew	Hierarchical Compactor Design for Diagnosis in Deterministic Logic BIST.	VTS	2005	DBLP DOI BibTeX RDF
1	A. J. van de Goor, Said Hamdioui, Zaid Al-Ars	The Effectiveness of the Scan Test and Its New Variants.	MTDT	2004	DBLP DOI BibTeX RDF
1	Irith Pomeranz, Sudhakar M. Reddy	Test compaction for at-speed testing of scan circuits based onnonscan test. sequences and removal of transfer sequences.	IEEE Trans. on CAD of Integrated Circuits and Systems	2002	DBLP DOI BibTeX RDF
1	Irith Pomeranz	On Pass/Fail Dictionaries for Scan Circuits .	Asian Test Symposium	2001	DBLP DOI BibTeX RDF