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Searching for phrase shifting process control (changed automatically) with no syntactic query expansion in all metadata.

Publication years (Num. hits)
2000 (1)
Publication types (Num. hits)
inproceedings(1)
Venues (Conferences, Journals, ...)
Asian Test Symposium(1)
Authors
Abderrahim Doumar(1) Hideo Ito(1)
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Found 1 publication records. Showing 1 according to the selection in the facets
Hits ?▲ Authors Title Venue Year Link Author keywords
2Abderrahim Doumar, Hideo Ito Testing approach within FPGA-based fault tolerant systems. Search on Bibsonomy Asian Test Symposium The full citation details ... 2000 DBLP  DOI  BibTeX  RDF FPGA-based fault-tolerant systems, FPGA test strategy, configurable logic blocks, functional phase, on-chip configuration data shifting, shifting process control, test application, test observation, fault tolerance management logic, fault tolerance cost, chip functionality, delay overhead, Xilinx FPGA, fault tolerance, field programmable gate arrays, delays, integrated circuit testing, integrated logic circuits, testing time, user data, test phase
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