Search results for "test coverage"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
4	Martina Marré, Antonia Bertolino	Reducing and Estimating the Cost of Test Coverage Criteria.	ICSE	1996	DBLP BibTeX RDF	generalised algorithm, minimum entity set, program flowgraph entities, spanning set, test coverage criteria cost estimation, test coverage criteria cost reduction, test paths, program testing, software cost estimation, flowcharting
3	Jinxia An, Jihong Zhu	Software Reliability Modeling with Integrated Test Coverage.	SSIRI	2010	DBLP DOI BibTeX RDF	integrated test coverage, modeling, classification, software reliability, test coverage, test effectiveness
3	Gregory M. Kapfhammer, Mary Lou Soffa	Database-aware test coverage monitoring.	ISEC	2008	DBLP DOI BibTeX RDF	test coverage monitoring, database application
3	Jerry Gao, Raquel Espinoza, Jingsha He	Testing Coverage Analysis for Software Component Validation.	COMPSAC	2005	DBLP DOI BibTeX RDF	component test coverage, test coverage analysis, component testing
2	E. S. F. Najumudheen, Rajib Mall, Debasis Samanta	A dependence graph-based representation for test coverage analysis of object-oriented programs.	ACM SIGSOFT Software Engineering Notes	2009	DBLP DOI BibTeX RDF	object-oriented program, inheritance, polymorphism, dependence graph, coverage analysis
2	Tiago L. Alves, Joost Visser	Static Estimation of Test Coverage.	SCAM	2009	DBLP DOI BibTeX RDF	metrics, static analysis, estimation, slicing, test coverage
2	E. S. F. Najumudheen, Rajib Mall, Debasis Samanta	A Dependence Graph-Based Test Coverage Analysis Technique for Object-Oriented Programs.	ITNG	2009	DBLP DOI BibTeX RDF	Test coverage analysis, software testing, object-oriented program, dependence graph
2	Audris Mockus, Nachiappan Nagappan, Trung T. Dinh-Trong	Test coverage and post-verification defects: A multiple case study.	ESEM	2009	DBLP DOI BibTeX RDF
2	Thao Dang, Tarik Nahhal	Coverage-guided test generation for continuous and hybrid systems.	Formal Methods in System Design	2009	DBLP DOI BibTeX RDF	Test generation, Hybrid systems, Model-based testing, Conformance testing, Test coverage
2	Haifeng Li, Qiuying Li, Minyan Lu	Software Reliability Modeling with Logistic Test Coverage Function.	ISSRE	2008	DBLP DOI BibTeX RDF
2	Hassan Reza, Kirk Ogaard, Amarnath Malge	A Model Based Testing Technique to Test Web Applications Using Statecharts.	ITNG	2008	DBLP DOI BibTeX RDF	Web applications, model-based testing, Statecharts, test coverage, GUI testing
2	Raúl A. Santelices, Mary Jean Harrold	Efficiently monitoring data-flow test coverage.	ASE	2007	DBLP DOI BibTeX RDF	definition-use association, inference, instrumentation, test coverage, data-flow testing
2	Tarik Nahhal, Thao Dang	Test Coverage for Continuous and Hybrid Systems.	CAV	2007	DBLP DOI BibTeX RDF
2	Nor Laily Hashim, Sita Ramakrishnan, Heinz W. Schmidt	Architectural Test Coverage for Component-Based Integration Testing.	QSIC	2007	DBLP DOI BibTeX RDF
2	Maria Siniaalto, Pekka Abrahamsson	A Comparative Case Study on the Impact of Test-Driven Development on Program Design and Test Coverage.	ESEM	2007	DBLP DOI BibTeX RDF
2	Xia Cai, Michael R. Lyu	Software Reliability Modeling with Test Coverage: Experimentation and Measurement with A Fault-Tolerant Software Project.	ISSRE	2007	DBLP DOI BibTeX RDF	software testing, test coverage, software reliability modeling, fault-tolerant software
2	Duminda Wijesekera, Paul Ammann, Lingya Sun, Gordon Fraser	Relating counterexamples to test cases in CTL model checking specifications.	A-MOST	2007	DBLP DOI BibTeX RDF	test coverage criteria, model checking, formal methods, software testing, state machines, counterexamples
2	James H. Andrews, Felix Chun Hang Li, Tim Menzies	Nighthawk: a two-level genetic-random unit test data generator.	ASE	2007	DBLP DOI BibTeX RDF	genetic algorithms, randomized testing, test coverage
2	Monalisa Sarma, Rajib Mall	Synthesis of system state models.	SIGPLAN Notices	2007	DBLP DOI BibTeX RDF	system state model, test coverage analysis, transition coverage, UML, UML, automatic test case generation, state coverage
2	Yuji Sakata, Kazutoshi Yokoyama, Hironori Washizaki, Yoshiaki Fukazawa	A precise estimation technique for test coverage of components in object-oriented frameworks.	APSEC	2006	DBLP DOI BibTeX RDF
2	Laura Brandán Briones, Ed Brinksma, Mariëlle Stoelinga	A Semantic Framework for Test Coverage.	ATVA	2006	DBLP DOI BibTeX RDF
2	Hongmei Chi, Edward L. Jones, Deidre W. Evans, Martin Brown	Generating Test Data for Specification-Based Tests Via Quasirandom Sequences.	International Conference on Computational Science	2006	DBLP DOI BibTeX RDF	specification-driven test, functional test coverage, quasirandom numbers, well-distributed sequences, automatic test case generation
2	W. Eric Wong, Yu Qi, Kendra Cooper	Source code-based software risk assessing.	SAC	2005	DBLP DOI BibTeX RDF	dynamic test coverage, static code complexity, software quality, risk assess, risk model
2	Chen Fu, Ana Milanova, Barbara G. Ryder, David Wonnacott	Robustness Testing of Java Server Applications.	IEEE Trans. Software Eng.	2005	DBLP DOI BibTeX RDF	def-use testing, test coverage metrics, Java, Reliability, exceptions
2	Kenneth P. Parker	Board Test Coverage Needs to be Standardized.	ITC	2004	DBLP DOI BibTeX RDF
2	Jay J. Nejedlo	Functional Test Coverage Effectiveness on the Decline.	ITC	2004	DBLP DOI BibTeX RDF
2	Chen Fu, Barbara G. Ryder, Ana Milanova, David Wonnacott	Testing of java web services for robustness.	ISSTA	2004	DBLP DOI BibTeX RDF	def-use testing, test coverage metrics, java, exceptions
2	Bernhard K. Aichernig	Mutation Testing in the Refinement Calculus.	Formal Asp. Comput.	2003	DBLP DOI BibTeX RDF	Formal specifications, Formal methods, Refinement, Abstraction, Test case generation, Mutation testing, Test coverage
2	Kathy Hird, Kenneth P. Parker, Bill Follis	Test Coverage: What Does It Mean When a Board Test Passes?.	ITC	2002	DBLP DOI BibTeX RDF
2	Hyoung Seok Hong, Insup Lee, Oleg Sokolsky, Hasan Ural	A Temporal Logic Based Theory of Test Coverage and Generation.	TACAS	2002	DBLP DOI BibTeX RDF
2	Sahra Sedigh-Ali, Arif Ghafoor, Raymond A. Paul	Temporal Modeling of Software Test Coverage.	COMPSAC	2002	DBLP DOI BibTeX RDF
2	Nandu Tendolkar, Rajesh Raina, Rick Woltenberg, Xijiang Lin, Bruce Swanson, Greg Aldrich	Novel Techniques for Achieving High At-Speed Transition Fault Test Coverage for Motorola's Microprocessors Based on PowerPC(tm) Instruction Set Architecture.	VTS	2002	DBLP DOI BibTeX RDF	Microprocessor, Delay Testing
2	Alan W. Williams, Robert L. Probert	A Measure for Component Interaction Test Coverage.	AICCSA	2001	DBLP DOI BibTeX RDF	Software engineering, interactions, test coverage, system testing
2	Premkumar T. Devanbu, Stuart G. Stubblebine	Cryptographic Verification of Test Coverage Claims.	IEEE Trans. Software Eng.	2000	DBLP DOI BibTeX RDF	verification, Testing, cryptography, trust, components, safety-critical systems
2	Sukalyan Mukherjee	Design for Testability to Achieve High Test Coverage - A Case Study. (PDF / PS)	DFT	2000	DBLP DOI BibTeX RDF
2	Der-Cheng Huang, Wen-Ben Jone	An efficient parallel transparent diagnostic BIST.	Asian Test Symposium	2000	DBLP DOI BibTeX RDF	parallel transparent diagnostic BIST, built-in self-diagnosis method, multiple embedded memory arrays, transparent diagnostic interface, redundant read/write/shift operations, march algorithm, TDiagRSMarch algorithm, low hardware overhead, test time reduction, diagnostic efficiency, parallel algorithms, VLSI, fault diagnosis, logic testing, built-in self test, integrated circuit testing, automatic testing, test coverage, integrated memory circuits
2	Hong Zhu, Patrick A. V. Hall, John H. R. May	Software Unit Test Coverage and Adequacy.	ACM Comput. Surv.	1997	DBLP DOI BibTeX RDF	comparing testing effectiveness, software unit test, fault detection, test coverage, test adequacy criteria, testing methods
2	V. Kim, T. Chen	Assessing SRAM test coverage for sub-micron CMOS technologies.	VTS	1997	DBLP DOI BibTeX RDF	submicron CMOS technologies, SRAM test coverage assessment, memory fault probability model, memory array, data retention faults, memory fault coverages, memory test algorithms, functional fault class coverages, 0.5 to 1 mum, stuck-at faults, transition faults, stuck-open faults, coupling faults, physical defects, CMOS memory circuits
2	Ananta K. Majhi, James Jacob, Lalit M. Patnaik, Vishwani D. Agrawal	On test coverage of path delay faults.	VLSI Design	1996	DBLP DOI BibTeX RDF	two-pass test generation method, falling transition, line delay test, longest sensitizable path, decreasing length, redundant stuck-at fault, computational complexity, fault diagnosis, logic testing, delays, redundancy, combinational circuits, fault simulation, circuit analysis computing, test coverage, path delay faults, benchmark circuits, coverage metric, combinational logic circuits, longest paths
2	Henryk Krawczyk, Bogdan Wiszniewski	Object-Oriented Model of Parallel Programs .	PDP	1996	DBLP DOI BibTeX RDF	distributed memory environment, parallel software, program control flow, multiflow graph, complexity, parallel programming, parallel programs, object-oriented programming, software quality, software quality, distributed memory systems, object-oriented model, test coverage, data flow graphs, program control structures
2	Peter Wohl, John A. Waicukauski, Matthew Graf	Testing "untestable" faults in three-state circuits.	VTS	1996	DBLP DOI BibTeX RDF	three-state circuits, complex CMOS designs, nonconventional circuits, test generation techniques, circuit particularities, fault diagnosis, logic testing, integrated circuit testing, automatic testing, CMOS logic circuits, test coverage, multivalued logic circuits, computer testing, CPU time, test vector generation, untestable faults, automatic learning
2	Steven D. Millman	Improving quality: Yield versus test coverage.	J. Electronic Testing	1994	DBLP DOI BibTeX RDF	quality, Fault modeling, yield, test economics, physical defects
1	Serdar Tasiran, M. Erkan Keremoglu, Kivanç Muslu	Location pairs: a test coverage metric for shared-memory concurrent programs.	Empirical Software Engineering	2012	DBLP DOI BibTeX RDF
1	Ying-Dar Lin, Chi-Heng Chou, Yuan-Cheng Lai, Tse-Yau Huang, Simon Chung, Jui-Tsun Hung, Frank C. Lin	Test coverage optimization for large code problems.	Journal of Systems and Software	2012	DBLP DOI BibTeX RDF
1	Lingyi Liu, David Sheridan, William Tuohy, Shobha Vasudevan	A Technique for Test Coverage Closure Using GoldMine.	IEEE Trans. on CAD of Integrated Circuits and Systems	2012	DBLP DOI BibTeX RDF
1	Ying-Dar Lin, Chi-Heng Chou, Yuan-Cheng Lai, Tse-Yau Huang, Simon Chung, Jui-Tsun Hung, Frank C. Lin	Test Coverage Optimization for Large Code Problems.	AINA Workshops	2012	DBLP DOI BibTeX RDF
1	Reiko Heckel, Tamim Ahmed Khan, Rodrigo Machado	Towards Test Coverage Criteria for Visual Contracts.	ECEASST	2011	DBLP BibTeX RDF
1	Kazunori Sakamoto, Fuyuki Ishikawa, Hironori Washizaki, Yoshiaki Fukazawa	Open Code Coverage Framework: A Framework for Consistent, Flexible and Complete Measurement of Test Coverage Supporting Multiple Programming Languages.	IEICE Transactions	2011	DBLP BibTeX RDF
1	E. S. F. Najumudheen, Rajib Mall, Debasis Samanta	Test coverage analysis based on an object-oriented program model.	Journal of Software Maintenance	2011	DBLP DOI BibTeX RDF
1	Waldemar Hummer, Orna Raz, Onn Shehory, Philipp Leitner, Schahram Dustdar	Test Coverage of Data-Centric Dynamic Compositions in Service-Based Systems.	ICST	2011	DBLP DOI BibTeX RDF
1	Balakrishnan Ramadoss, P. Prema, S. R. Balasundaram	Improving test coverage using merged classification tree.	ICWET	2011	DBLP DOI BibTeX RDF
1	Virginia Papailiopoulou, Ajitha Rajan, Ioannis Parissis	Structural Test Coverage Criteria for Integration Testing of LUSTRE/SCADE Programs.	FMICS	2011	DBLP DOI BibTeX RDF
1	Laurent Fribourg, Ulrich Kühne	Parametric Verification and Test Coverage for Hybrid Automata Using the Inverse Method.	RP	2011	DBLP DOI BibTeX RDF
1	Vanessa Peña Araya	Test blueprint: an effective visual support for test coverage.	ICSE	2011	DBLP DOI BibTeX RDF
1	Ricardo D. F. Ferreira, João C. P. Faria, Ana C. R. Paiva	Test Coverage Analysis of UML State Machines.	ICST Workshops	2010	DBLP DOI BibTeX RDF
1	Ankush Srivastava, Ajay Prajapati, Vinay Soni	A novel approach to improve test coverage of BSR cells.	ITC	2010	DBLP DOI BibTeX RDF
1	Abdul Rauf, Sajid Anwar, M. Arfan Jaffer, Arshad Ali Shahid	Automated GUI Test Coverage Analysis Using GA.	ITNG	2010	DBLP DOI BibTeX RDF	Coverage Criterion, Test Path, Genetic Algorithm, Automation Testing, Test Data Generation, GUI Testing, Coverage Analysis, Event Flow
1	Zhenyu Liu, Tiejiang Liu, Lizhi Cai, Genxing Yang	Test coverage for collaborative workflow application based on Petri Net.	CSCWD	2010	DBLP DOI BibTeX RDF
1	Abdul Rauf, Naveed Kazim, Sajid Anwar, Shafiq-Ur Rehman, Arshad Ali Shahid	Maximizing GUI Test Coverage Through Particle Swarm Optimization.	SEDE	2010	DBLP BibTeX RDF
1	Katharina Tschumitschew, Frank Klawonn, Nils Obermöller, Wolfhard Lawrenz	Visualisation of Test Coverage for Conformance Tests of Low Level Communication Protocols.	KES	2010	DBLP DOI BibTeX RDF
1	Alastair F. Donaldson, Nannan He, Daniel Kroening, Philipp Rümmer	Tightening Test Coverage Metrics: A Case Study in Equivalence Checking Using k-Induction.	FMCO	2010	DBLP DOI BibTeX RDF
1	Eunkyoung Jee, Suin Kim, Sung Deok Cha, Insup Lee	Automated Test Coverage Measurement for Reactor Protection System Software Implemented in Function Block Diagram.	SAFECOMP	2010	DBLP DOI BibTeX RDF
1	Ricardo D. F. Ferreira, João C. P. Faria, Ana C. R. Paiva	Test Coverage Analysis of UML Activity Diagrams for Interactive Systems.	QUATIC	2010	DBLP DOI BibTeX RDF
1	Negar Koochakzadeh, Vahid Garousi	TeCReVis: A Tool for Test Coverage and Test Redundancy Visualization.	TAIC PART	2010	DBLP DOI BibTeX RDF
1	Vahid Garousi, Negar Koochakzadeh	An Empirical Evaluation to Study Benefits of Visual versus Textual Test Coverage Information.	TAIC PART	2010	DBLP DOI BibTeX RDF
1	Faizah Omar, Suhaimi Ibrahim	Designing Test Coverage for Grey Box Analysis.	QSIC	2010	DBLP DOI BibTeX RDF
1	Kazunori Sakamoto, Hironori Washizaki, Yoshiaki Fukazawa	Open Code Coverage Framework: A Consistent and Flexible Framework for Measuring Test Coverage Supporting Multiple Programming Languages.	QSIC	2010	DBLP DOI BibTeX RDF
1	Tim Miller, Lin Padgham, John Thangarajah	Test Coverage Criteria for Agent Interaction Testing.	AOSE	2010	DBLP DOI BibTeX RDF
1	Klaus Haller	The test data challenge for database-driven applications.	DBTest	2010	DBLP DOI BibTeX RDF	testing, databases, information systems, test coverage, test data
1	Fadi Wedyan, Sudipto Ghosh	A Dataflow Testing Approach for Aspect-Oriented Programs.	HASE	2010	DBLP DOI BibTeX RDF	aspect-oriented programming, dataflow, AspectJ, test coverage, test criteria
1	Emelie Engstrom	Regression Test Selection and Product Line System Testing.	ICST	2010	DBLP DOI BibTeX RDF	software product line testing, regression testing, test coverage, test case selection, literature review, industrial practices
1	Fevzi Belli, Mutlu Beyazit	A Formal Framework for Mutation Testing.	SSIRI	2010	DBLP DOI BibTeX RDF	(model-based) mutation testing, formal/regular grammar, manipulation operator, test generation, directed graph, test coverage
1	Junhua Ding, Tong Wu, Jun Q. Lu, Xin-Hua Hu	Self-Checked Metamorphic Testing of an Image Processing Program.	SSIRI	2010	DBLP DOI BibTeX RDF	test coverage criteria, image processing, structural testing, metamorphic testing
1	Odair Jacinto da Silva, Adalberto Nobiato Crespo, Marcos Lordello Chaim, Mario Jino	Sensitivity of Two Coverage-Based Software Reliability Models to Variations in the Operational Profile.	SSIRI	2010	DBLP DOI BibTeX RDF	software test, software reliability, test coverage, operational profile, testing criteria
1	Jan Wloka, Einar Hoest, Barbara G. Ryder	Tool Support for Change-Centric Test Development.	IEEE Software	2010	DBLP DOI BibTeX RDF	Unit testing, test-driven development, test coverage, change impact analysis
1	Peter Wohl, John A. Waicukauski, Frederic Neuveux, Emil Gizdarski	Fully X-tolerant, very high scan compression.	DAC	2010	DBLP DOI BibTeX RDF	X-tolerant, compression, LFSR, VLSI test, MISR
1	Elvira Albert, Miguel Gómez-Zamalloa, Germán Puebla	PET: a partial evaluation-based test case generation tool for Java bytecode.	PEPM	2010	DBLP DOI BibTeX RDF	testing, partial evaluation, symbolic execution, constraint logic programming, test-case generation
1	Junhua Ding, Peter J. Clarke, Gonzalo Argote-Garcia, Xudong He	A methodology for evaluating test coverage criteria of high levelPetri nets.	Information & Software Technology	2009	DBLP DOI BibTeX RDF
1	Chwee Liong Tee, Tzyy Haw Tan, Chin Chuan Ng	Augmenting board test coverage with new intel powered opens boundary scan instruction.	ITC	2009	DBLP DOI BibTeX RDF
1	Taeksu Kim, Chunwoo Lee, Kiljoo Lee, Soohyun Baik, Chisu Wu, Kwangkeun Yi	Test Coverage Metric for Two-Staged Language with Abstract Interpretation.	APSEC	2009	DBLP DOI BibTeX RDF
1	Daniel Lübke, Leif Singer, Alex Salnikow	Calculating BPEL Test Coverage Through Instrumentation.	AST	2009	DBLP DOI BibTeX RDF
1	Klaus Haller	White-box testing for database-driven applications: a requirements analysis.	DBTest	2009	DBLP DOI BibTeX RDF	testing, databases, information systems, test coverage
1	Gordon Fraser, Franz Wotawa	Increasing Diversity in Coverage Test Suites Using Model Checking.	QSIC	2009	DBLP DOI BibTeX RDF	test redundancy, test diversity, model checking, specification based testing, test case generation, test coverage
1	Bastian Steinert, Michael Perscheid, Martin Beck, Jens Lincke, Robert Hirschfeld	Debugging into Examples.	TestCom/FATES	2009	DBLP DOI BibTeX RDF	Program comprehension, dynamic analysis, test coverage
1	Bassem Elkarablieh, Patrice Godefroid, Michael Y. Levin	Precise pointer reasoning for dynamic test generation.	ISSTA	2009	DBLP DOI BibTeX RDF	pointer reasoning, software testing, program verification, automatic test generation
1	Diogo José Costa Alves, Edna Barros	A logic built-in self-test architecture that reuses manufacturing compressed scan test patterns.	SBCCI	2009	DBLP DOI BibTeX RDF	LBIST, compressed test patterns, test, SoC, self-test
1	Viera K. Proulx	Test-driven design for introductory OO programming.	SIGCSE	2009	DBLP DOI BibTeX RDF	design, pedagogy, programming education, cs1/2, test driven design
1	Tapan P. Bagchi	Models for software defects and testing strategies.	ACM SIGSOFT Software Engineering Notes	2009	DBLP DOI BibTeX RDF	SW testing, imperfect inspection, type I and type II errors, software engineering, defect modeling
1	Arnaud Gotlieb, Matthieu Petit	Towards a Theory for Testing Non-terminating Programs.	COMPSAC	2009	DBLP DOI BibTeX RDF
1	Hojun Jaygarl, Carl K. Chang, Sunghun Kim	Practical Extensions of a Randomized Testing Tool.	COMPSAC	2009	DBLP DOI BibTeX RDF
1	Rozita Dara, Shimin Li, Weining Liu, Angi Smith-Ghorbani, Ladan Tahvildari	Using dynamic execution data to generate test cases.	ICSM	2009	DBLP DOI BibTeX RDF
1	Goutam Debnath, Paul J. Thadikaran	Design for Manufacturability and Reliability in Nano Era.	VLSI Design	2009	DBLP DOI BibTeX RDF
1	Rajat Subhra Chakraborty, Francis G. Wolff, Somnath Paul, Christos A. Papachristou, Swarup Bhunia	MERO: A Statistical Approach for Hardware Trojan Detection.	CHES	2009	DBLP DOI BibTeX RDF
1	Sying-Jyan Wang, Kuo-Lin Peng, Kuang-Cyun Hsiao, Katherine Shu-Min Li	Layout-aware scan chain reorder for launch-off-shift transition test coverage.	ACM Trans. Design Autom. Electr. Syst.	2008	DBLP DOI BibTeX RDF	scan chain ordering, test generation, transition faults, Scan test
1	Raimund Kirner, Susanne Kandl	Test Coverage Analysis and Preservation for Requirements-Based Testing.	ERCIM News	2008	DBLP BibTeX RDF
1	Teemu Kanstrén	Towards a deeper understanding of test coverage.	Journal of Software Maintenance	2008	DBLP DOI BibTeX RDF
1	Myron Schneider, Ayub Shafi	Engineering Test Coverage on Complex Sockets.	ITC	2008	DBLP DOI BibTeX RDF
1	Virginia Papailiopoulou, Laya Madani, Lydie du Bousquet, Ioannis Parissis	Extending Structural Test Coverage Criteria for Lustre Programs with Multi-clock Operators.	FMICS	2008	DBLP DOI BibTeX RDF
1	Mario Friske, Bernd-Holger Schlingloff, Stephan Weißleder	Composition of Model-based Test Coverage Criteria.	MBEES	2008	DBLP BibTeX RDF
1	Leila Naslavsky, Hadar Ziv, Debra J. Richardson	Using Model Transformation to Support Model-Based Test Coverage Measurement.	AST	2008	DBLP DOI BibTeX RDF