Search results for "test observation"

Found 7 publication records. Showing 7 according to the selection in the facets

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
2	Abderrahim Doumar, Hideo Ito	Testing approach within FPGA-based fault tolerant systems.	Asian Test Symposium	2000	DBLP DOI BibTeX RDF	FPGA-based fault-tolerant systems, FPGA test strategy, configurable logic blocks, functional phase, on-chip configuration data shifting, shifting process control, test application, test observation, fault tolerance management logic, fault tolerance cost, chip functionality, delay overhead, Xilinx FPGA, fault tolerance, field programmable gate arrays, delays, integrated circuit testing, integrated logic circuits, testing time, user data, test phase
1	Xiao-Lei Xia, Kang Li	A New Score Correlation Analysis Multi-class Support Vector Machine for Microarray.	IJCNN	2007	DBLP DOI BibTeX RDF
1	Soumendu Bhattacharya, Abhijit Chatterjee	A DFT Approach for Testing Embedded Systems Using DC Sensors.	IEEE Design & Test of Computers	2006	DBLP DOI BibTeX RDF	computer-aided design, test generation, built-in tests, reliability and testing
1	Sridha Lucey, Tsuhan Chen, Sridha Sridharan, Vinod Chandran	Integration strategies for audio-visual speech processing: applied to text-dependent speaker recognition.	IEEE Transactions on Multimedia	2005	DBLP DOI BibTeX RDF
1	Simon Lucey, Tsuhan Chen	Improved Audio-Visual Speaker Recognition via the Use of a Hybrid Combination Strategy.	AVBPA	2003	DBLP DOI BibTeX RDF
1	Wen-Ben Jone, Yun-Pan Ho, Sunil R. Das	Delay Fault Coverage Enhancement Using Multiple Test Observation Times.	VLSI Design	1997	DBLP DOI BibTeX RDF
1	Wen-Ben Jone, Yun-Pan Ho, Sunil R. Das	Delay Fault Coverage Enhancement Using Variable Observation Times.	J. Electronic Testing	1997	DBLP DOI BibTeX RDF	statistical delay fault coverage, delay test observation times, delay fault testing

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