Search results for "testability parameters"

Searching for phrase testability parameters (changed automatically) with no syntactic query expansion in all metadata.

Found 5 publication records. Showing 5 according to the selection in the facets

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
2	Shiyi Xu, Wei Cen	Forecasting the efficiency of test generation algorithms for digital circuits.	Asian Test Symposium	2000	DBLP DOI BibTeX RDF	efficiency forecasting, testability parameters, genetic algorithms, genetic algorithms, VLSI, logic testing, integrated circuit testing, sequential circuits, sequential circuits, automatic test pattern generation, ATPG, combinational circuits, combinational circuits, digital circuits, VLSI circuits, digital integrated circuits, test generation algorithms
2	Hiroaki Ueda, Kozo Kinoshita	Low power design and its testability.	Asian Test Symposium	1995	DBLP DOI BibTeX RDF	power reduction tool, power dissipation factor, testability parameters, fault diagnosis, logic testing, delays, probability, design for testability, low power design, logic CAD, testability, fault location, stuck-at faults, CMOS logic circuits, delay faults, CMOS circuit, PORT, automatic test software, redundant faults, transition probability
1	Smita Krishnaswamy, Stephen Plaza, Igor L. Markov, John P. Hayes	Signature-Based SER Analysis and Design of Logic Circuits.	IEEE Trans. on CAD of Integrated Circuits and Systems	2009	DBLP DOI BibTeX RDF
1	Saeed Safari, Hadi Esmaeilzadeh, Amir-Hossein Jahangir	A novel improvement technique for high-level test synthesis.	ISCAS	2003	DBLP DOI BibTeX RDF
1	Shiyi Xu, Peter Waignjo, Percy G. Dias, Bole Shi	Testability Prediction for Sequential Circuits Using Neural Network.	Asian Test Symposium	1997	DBLP DOI BibTeX RDF

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