Search results for "testing"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
9	Abdeslam En-Nouaary, Ferhat Khendek, Rachida Dssouli	Testing embedded real-time systems.	RTCSA	2000	DBLP DOI BibTeX RDF	embedded real-time system testing, system correctness, implementation testing, real-time components, communicating timed input-output automata, testing in context, testing in isolation, timed Wp-method, embedded systems, formal specification, formal verification, program testing, conformance testing, conformance testing, timing constraints, safety-critical systems, test case generation, safety-critical software, automata theory, concurrent processes, communicating processes, system quality, partial product
9	J. A. Segura, Miquel Roca, Diego Mateo, Antonio Rubio	An approach to dynamic power consumption current testing of CMOS ICs.	VTS	1995	DBLP DOI BibTeX RDF	dynamic power consumption current testing, logic behavior, parametric defect, quiescent power supply current testing, consumption current testing time, on-chip sensor, static power consumption, fault diagnosis, logic testing, integrated circuit testing, automatic testing, adders, CMOS logic circuits, I/sub DDQ/ testing, CMOS ICs, full adders, open defects, electric current measurement, bridging defects, transient current
8	Koushik Sen	Concolic testing.	ASE	2007	DBLP DOI BibTeX RDF	data structure testing, explicit path model-checking, random testing, unit testing, symbolic execution, testing tools, testing C programs, concolic testing
8	Natalia Juristo Juzgado, Ana María Moreno, Wolfgang Strigel	Guest Editors' Introduction: Software Testing Practices in Industry.	IEEE Software	2006	DBLP DOI BibTeX RDF	SQA, V&V, agile software testing, parameterized unit testing, testing practice, software testing, unit testing, symbolic execution, scripting language, test coverage, testing tools, test automation, test design, test design
8	In Sang Chung, Malcolm Munro, Wan Kwon Lee, Yong Rae Kwon	Applying Conventional Testing Techniques for Class Testing.	COMPSAC	1996	DBLP DOI BibTeX RDF	program testing techniques, class member function testing, code-based testing, formal specification, object-oriented programming, object oriented programming, finite state machines, finite state machines, program testing, symbolic execution, programming theory, specification-based testing, class testing, branch coverage
8	Oum-El-Kheir Benkahla, Chouki Aktouf, Chantal Robach	Distributed off-line testing of parallel systems.	Asian Test Symposium	1995	DBLP DOI BibTeX RDF	distributed off-line testing, off-line testing, distributed self-diagnosis algorithms, adaptive testing assignment strategies, static testing assignment strategies, testing latency, message load, SELF3, HOST BSCT, HOST PATH, ADAPTIVE TREES, performance evaluation, parallel algorithms, fault diagnosis, adaptive systems, parallel systems, queueing network model, computer testing, automatic test software
7	Wishnu Prasetya, Tanya Vos, Arthur I. Baars	Trace-based Reflexive Testing of OO Programs with T2.	ICST	2008	DBLP DOI BibTeX RDF	trace based testing, sequence based testing, unit testing, automated testing
7	Ilinca Ciupa, Andreas Leitner, Manuel Oriol, Bertrand Meyer	Object distance and its application to adaptive random testing of object-oriented programs.	Random Testing	2006	DBLP DOI BibTeX RDF	distanced-based testing, object distance, random testing, adaptive random testing
7	Tsong Yueh Chen, Fei-Ching Kuo	Is adaptive random testing really better than random testing.	Random Testing	2006	DBLP DOI BibTeX RDF	fix-sized-candidate-set ART, software testing, random testing, adaptive random testing
7	Jeremy Gardiner	Delayed Failures in Software Using High Volume Automated Testing.	TAIC PART	2006	DBLP DOI BibTeX RDF	delayed failures, high volume, HVAT, testing techniques, software testing, automated testing, database testing
7	Koushik Sen, Darko Marinov, Gul Agha	CUTE: a concolic unit testing engine for C.	ESEC/SIGSOFT FSE	2005	DBLP DOI BibTeX RDF	data structure testing, explicit path model-checking, random testing, unit testing, testing C programs, concolic testing
7	Naina Mittal, Ira Acharya	An Open Framework for Managed Regression Testing.	TestCom	2003	DBLP DOI BibTeX RDF	managed testing, networking equipment, test bench, hierarchical test case management, test plan tree, framework deployment, test-cycle reduction, testing tool collaboration, regression testing, black-box testing, Test automation, test framework, test planning, test execution, test scripts
7	S. L. Lin, S. Mourad, S. Krishnan	A BIST methodology for at-speed testing of data communications transceivers.	Asian Test Symposium	2000	DBLP DOI BibTeX RDF	data communication equipment, telecommunication equipment testing, BIST methodology, data communications transceivers, data communications chip, 3-port IEEE 1394a system, CMOS implementation, 0.35 micron, 400 Mbit/s, built-in self test, integrated circuit testing, automatic testing, functional testing, CMOS integrated circuits, at-speed testing, transceivers
7	Cheng-Wen Wu	On energy efficiency of VLSI testing.	Asian Test Symposium	1997	DBLP DOI BibTeX RDF	test efficiency models, CMOS power consumption model, high testability, high power dissipation, high-power testing, transition activity factor, fabricated chip, testing energy, VLSI, energy efficiency, fault coverage, design optimization, VLSI testing, testing time, test efficiency, testing power
7	Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken	An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing.	VTS	1997	DBLP DOI BibTeX RDF	semiconductor testing, stuck-fault testing, ASIC device, application specific integrated circuits, functional testing, IDDQ testing, delay-fault testing, scan testing
7	Cecilia Metra, Michele Favalli, Bruno Riccò	Embedded two-rail checkers with on-line testing ability.	VTS	1996	DBLP DOI BibTeX RDF	embedded two-rail checkers, online testing ability, self-testing ability, compact structure, VLSI, logic testing, integrated circuit testing, design for testability, error detection, automatic testing, integrated logic circuits, two-rail code
7	Yuyun Liao, D. M. H. Walker	Optimal voltage testing for physically-based faults.	VTS	1996	DBLP DOI BibTeX RDF	optimal voltage testing, physically-based faults, resistive bridges, gate outputs, pattern sensitive functional faults, transmission gates, fault diagnosis, logic testing, delays, integrated circuit testing, automatic testing, fault coverage, CMOS logic circuits, delay faults, Iddq tests, CMOS circuits, logic gates, test vector, noise margin, selection strategy, low-voltage testing, integrated circuit noise
7	Brian Mitchell, Steven J. Zeil	A Reliability Model Combining Representative and Directed Testing.	ICSE	1996	DBLP BibTeX RDF	fault revelation, interfailure time, post-mortem debugged fault analysis, reliability estimate updating, representative testing, software quality, software reliability, fault detection, program testing, statistics, program debugging, functional testing, program diagnostics, structural testing, random processes, order statistics, reliability model, quantification, random variable, failure rates, directed testing
7	Evelyn Duesterwald, Rajiv Gupta, Mary Lou Soffa	A Demand-Driven Analyzer for Data Flow Testing at the Integration Level.	ICSE	1996	DBLP BibTeX RDF	definition-use pairs, demand-driven analyzer, exhaustive analyzer, incremental analyzer, incremental data-flow updates, large program testing, program procedure interfaces, test case requirements, performance, static analysis, program testing, data flow analysis, unit testing, overhead, integration testing, data flow testing
7	Mukund Sivaraman, Andrzej J. Strojwas	Diagnosis of parametric path delay faults.	VLSI Design	1996	DBLP DOI BibTeX RDF	parametric path delay faults, chip failure, fabrication process parameter values, path sensitization mechanism, path delay conditions, ISCAS'89 benchmark circuits, path segment, circuit failure, fault diagnosis, logic testing, logic testing, delays, probability, probability, statistical analysis, statistical analysis, integrated circuit testing, failure analysis, diagnosability, delay fault testing, IC testing, production testing
7	Jerry Z. Gao, David Chenho Kung, Pei Hsia, Yasufumi Toyoshima, Cris Chen	Object state testing for object-oriented programs.	COMPSAC	1995	DBLP DOI BibTeX RDF	object state testing, class objects, behavior testing, object state diagram, OO features, communicating state machine, object state hierarchy, complex class object, object state test strategy, object-oriented programming, object oriented programs, object-oriented programs, test generation, aggregation, program testing, inheritance, abstract data types, functional testing, structure testing, overloading, dynamic behavior, test criteria, OO programs
7	Peter C. Maxwell	The use of IDDQ testing in low stuck-at coverage situations.	VTS	1995	DBLP DOI BibTeX RDF	stuck-at coverage situations, quality goal, graded coverage, composite metric, fault diagnosis, logic testing, logic tests, integrated circuit testing, automatic testing, application specific integrated circuits, ASIC, CMOS logic circuits, IDDQ testing, IC testing
7	Li-C. Wang, M. Ray Mercer, Sophia W. Kao, Thomas W. Williams	On the decline of testing efficiency as fault coverage approaches 100%.	VTS	1995	DBLP DOI BibTeX RDF	single stuck-at fault model, ISCAS benchmark circuits, nontarget defects, fault diagnosis, logic testing, integrated circuit testing, automatic testing, fault coverage, test pattern generation, manufacturing process, test quality, production testing, testing efficiency, circuit sizes
7	Udo Mahlstedt, Jürgen Alt, Matthias Heinitz	CURRENT: a test generation system for I/sub DDQ/ testing.	VTS	1995	DBLP DOI BibTeX RDF	CURRENT test system, test generation system, scan-based circuits, library-based fault modeling strategy, intra-gate shorts, inter-gate shorts, gate-drain shorts, deterministic test generator, test set compaction technique, fault diagnosis, logic testing, integrated circuit testing, automatic testing, fault simulator, fault coverage, fault location, CMOS logic circuits, bridging faults, boundary scan testing, I/sub DDQ/ testing, test application time reduction, stuck-on faults, leakage faults
7	Phyllis G. Frankl, Elaine J. Weyuker	Provable Improvements on Branch Testing.	IEEE Trans. Software Eng.	1993	DBLP DOI BibTeX RDF	software test data adequacy, independent random selection, condition-coverage techniques, software testing, program testing, programming theory, program debugging, mutation testing, test suite, data flow testing, fault-detecting ability, probabilistic measure, branch testing
6	Xun Yuan, Myra B. Cohen, Atif M. Memon	GUI Interaction Testing: Incorporating Event Context.	IEEE Trans. Software Eng.	2011	DBLP DOI BibTeX RDF	GUITAR testing system, model-based testing, automated testing, GUI testing, combinatorial interaction testing
6	Shaoying Liu	Automatic Specification-Based Testing: Challenges and Possibilities.	TASE	2011	DBLP DOI BibTeX RDF	Automatic testing, model-based testing, functional testing, Specification-based testing, black-box testing
6	Peter M. Kruse, Joachim Wegener, Stefan Wappler	A highly configurable test system for evolutionary black-box testing of embedded systems.	GECCO	2009	DBLP DOI BibTeX RDF	antilock-braking-system, hardware-in-the-loop-testing, testing infrastructure, functional testing, evolutionary testing
6	Tsong Yueh Chen, Robert G. Merkel	An upper bound on software testing effectiveness.	ACM Trans. Softw. Eng. Methodol.	2008	DBLP DOI BibTeX RDF	failure patterns, failure-causing inputs, testing effectiveness metrics, Software testing, random testing, adaptive random testing
6	Sreedevi Sampath, Renée C. Bryce, Gokulanand Viswanath, Vani Kandimalla, Akif Günes Koru	Prioritizing User-Session-Based Test Cases for Web Applications Testing.	ICST	2008	DBLP DOI BibTeX RDF	pair-wise interaction coverage, pair-wise interaction testing, user-session-based testing, test case prioritization, web application testing
6	Eckard Bringmann, Andreas Krämer	Model-Based Testing of Automotive Systems.	ICST	2008	DBLP DOI BibTeX RDF	continuous behavior testing, closed loop testing, Model-based testing, test automation, automotive systems
6	Achim D. Brucker, Lukas Brügger, Burkhart Wolff	Model-Based Firewall Conformance Testing.	TestCom/FATES	2008	DBLP DOI BibTeX RDF	Model-based Testing, Firewall, Conformance Testing, Security Testing
6	Gordon Fraser, Paul Ammann	Reachability and Propagation for LTL Requirements Testing.	QSIC	2008	DBLP DOI BibTeX RDF	requirements testing, software testing, automated testing, test case generation, property testing
6	Yu Liu, Hong Zhu	An Experimental Evaluation of the Reliability of Adaptive Random Testing Methods.	SSIRI	2008	DBLP DOI BibTeX RDF	reliability of test method, evaluation of testing methods, experiments on software testing, Software testing, random testing, adaptive random testing
6	Anthony J. H. Simons	JWalk: a tool for lazy, systematic testing of java classes by design introspection and user interaction.	Autom. Softw. Eng.	2007	DBLP DOI BibTeX RDF	Algebraic testing, Lazy specification, Lazy systematic testing, Operational abstraction, JWalk, Unit testing, Agile methods, JUnit, State-based testing
6	Laisa H. O. do Nascimento, Patrícia D. L. Machado	An experimental evaluation of approaches to feature testing in the mobile phone applications domain.	DOSTA	2007	DBLP DOI BibTeX RDF	GQM paradigm, exploratory testing, feature testing, software testing, model-based testing
6	Johannes Mayer	Adaptive random testing with randomly translated failure region.	Random Testing	2006	DBLP DOI BibTeX RDF	failure region, random testing, adaptive random testing, test case selection
6	Marat Boshernitsan, Roong-Ko Doong, Alberto Savoia	From daikon to agitator: lessons and challenges in building a commercial tool for developer testing.	ISSTA	2006	DBLP DOI BibTeX RDF	automated testing tools, developer testing, software agitation, unit testing, technology transfer, dynamic invariant detection, test-input generation
6	David Owen, Dejan Desovski, Bojan Cukic	Random testing of formal software models and induced coverage.	Random Testing	2006	DBLP DOI BibTeX RDF	formal methods, random testing, model testing
6	Dick Hamlet	When only random testing will do.	Random Testing	2006	DBLP DOI BibTeX RDF	random vs. systematic testing, testing theory
6	James H. Andrews, Susmita Haldar, Yong Lei, Felix Chun Hang Li	Tool support for randomized unit testing.	Random Testing	2006	DBLP DOI BibTeX RDF	randomized testing, unit testing
6	Wei-Tek Tsai, Lian Yu, Feng Zhu, Raymond A. Paul	Rapid Embedded System Testing Using Verification Patterns.	IEEE Software	2005	DBLP DOI BibTeX RDF	embedded systems testing, rapid testing, verification patterns, scenario patterns, Software engineering, testing tools, testing and debugging
6	Lei Xu 0003, Baowen Xu, Jixiang Jiang	Testing web applications focusing on their specialties.	ACM SIGSOFT Software Engineering Notes	2005	DBLP DOI BibTeX RDF	Web Application, Usability Testing, Regression Testing, Performance Testing, Testing Model
6	Carlo Bellettini, Alessandro Marchetto, Andrea Trentini	TestUml: user-metrics driven web applications testing.	SAC	2005	DBLP DOI BibTeX RDF	application design model, stop testing, UML, testing, reverse engineering, metrics, testing coverage, white-box testing
6	Achim D. Brucker, Burkhart Wolff	Interactive Testing with HOL-TestGen.	FATES	2005	DBLP DOI BibTeX RDF	symbolic test case generations, theorem proving, black box testing, white box testing, interactive testing
6	Haeng-Kon Kim, Oh-Hyun Kwon	SCTE: Software Component Testing Environments.	ICCSA	2005	DBLP DOI BibTeX RDF	CBD design, CBD testing Environments, software testing, Component Based Developments, automated testing, CASE, class testing
6	Mikhail Auguston, James Bret Michael, Man-tak Shing	Environment behavior models for scenario generation and testing automation.	A-MOST	2005	DBLP DOI BibTeX RDF	reactive and real time system testing, model-based testing, testing automation
6	Inali Wisniewski Soares, Silvia Regina Vergilio	Mutation Analysis and Constraint-Based Criteria: Results from an Empirical Evaluation in the Context of Software Testing.	J. Electronic Testing	2004	DBLP DOI BibTeX RDF	structural testing criteria, constraint-based testing, mutation testing
6	Sandro Morasca, Stefano Serra Capizzano	On the analytical comparison of testing techniques.	ISSTA	2004	DBLP DOI BibTeX RDF	subdomain-based testing, software testing, random testing, majorization
6	Kwok Ping Chan, Tsong Yueh Chen, Fei-Ching Kuo, Dave Towey	A Revisit of Adaptive Random Testing by Restrictio.	COMPSAC	2004	DBLP DOI BibTeX RDF	Restricted Random Testing, Software Testing, Random Testing, Adaptive Random Testing, Mirroring
6	Jennitta Andrea	Generative Acceptance Testing for Difficult-to-Test Software.	XP	2004	DBLP DOI BibTeX RDF	domain specific testing language, test automation patterns, user acceptance testing, XML, code generation, Automated testing, testing strategy, XSL
6	Tsong Yueh Chen, Fei-Ching Diana Kuo, Robert G. Merkel, Sebastian P. Ng	Mirror Adaptive Random Testing.	QSIC	2003	DBLP DOI BibTeX RDF	Software testing, Random testing, Black box testing, Adaptive Random Testing, Test case selection
6	Simeon C. Ntafos	On Comparisons of Random, Partition, and Proportional Partition Testing.	IEEE Trans. Software Eng.	2001	DBLP DOI BibTeX RDF	proportional partition testing, Program testing, random testing, partition testing
6	Elaine J. Weyuker, Filippos I. Vokolos	Experience with Performance Testing of Software Systems: Issues, an Approach, and Case Study.	IEEE Trans. Software Eng.	2000	DBLP DOI BibTeX RDF	software testing, program testing, performance testing, Software performance testing
6	Chen-Huan Chiang, Sandeep K. Gupta	BIST TPG for SRAM cluster interconnect testing at board level.	Asian Test Symposium	2000	DBLP DOI BibTeX RDF	SRAM cluster interconnect testing, BIST TPG, static random access memory, board-level interconnects, test pattern generation architecture, IEEE 1149.1 boundary scan architecture, prohibited conditions, testable SRAM cluster interconnect fault detection, logic testing, built-in self test, automatic test pattern generation, test pattern generation, boundary scan testing, integrated circuit interconnections, SRAM chips, printed circuit testing
6	Ahmed Khoumsi	A new method for testing real time systems.	RTCSA	2000	DBLP DOI BibTeX RDF	real-time systems testing, test sequence executability, test sequence execution, real-time systems, constraints, automatic test pattern generation, program testing, timed automata, conformance testing, conformance testing, sequences, test case generation, automata theory, state explosion, test architecture, test sequence generation, continuous-time systems
6	Walter J. Gutjahr	Partition Testing vs. Random Testing: The Influence of Uncertainty.	IEEE Trans. Software Eng.	1999	DBLP DOI BibTeX RDF	software testing, fault detection, program testing, random testing, partition testing, Decisions under uncertainty
6	Maneesha Dalmia, André Ivanov, Sassan Tabatabaei	Power supply current monitoring techniques for testing PLLs.	Asian Test Symposium	1997	DBLP DOI BibTeX RDF	power supply current monitoring, PLL testing, digital IC, VCO testing, analogue circuit testing, fault detection, phase locked loops, phase-locked loops, current testing, nonlinear circuits, mixed-signal ICs
6	Jianqiang Zhuo, Paul W. Oman, Ramkumar V. Pichai, Sujay Sahni	Using Relative Complexity To Allocate Resources In Gray-Box Testing Of Object-Oriented Code.	IEEE METRICS	1997	DBLP DOI BibTeX RDF	gray box testing, object oriented code, software testing costs, relative complexity metric, software quality assessments, industrial C++ software subsystem, rank order, minor test areas, relative test complexity, reliability, object-oriented programming, resource allocation, maintainability, black box, white box testing, testing engineers
6	Gilles Bernot, Laurent Bouaziz, Pascale Le Gall	A Theory of Probabilistic Functional Testing.	ICSE	1997	DBLP DOI BibTeX RDF	probabilistic testing, reliability, formal specification, software testing, random testing, functional testing, partition testing
6	Tsong Yueh Chen, Yuen-Tak Yu	On the Expected Number of Failures Detected by Subdomain Testing and Random Testing.	IEEE Trans. Software Eng.	1996	DBLP DOI BibTeX RDF	software testing, random testing, Partition testing, subdomain testing
6	Mark G. Karpovsky, Vyacheslav N. Yarmolik	Transparent random access memory testing for pattern sensitive faults.	J. Electronic Testing	1996	DBLP DOI BibTeX RDF	transparent memory testing, pseudoexhaustive memory testing, built-in self-test, memory testing, signature analysis, random access memory, pattern sensitive faults
6	Tsong Yueh Chen, Yuen-Tak Yu	More on the E-measure of Subdomain Testing Strategies.	Australian Software Engineering Conference	1996	DBLP DOI BibTeX RDF	software testing, random testing, Partition testing, subdomain testing
6	Tsong Yueh Chen, Yuen-Tak Yu	More on the E-measure of Subdomain Testing Strategies.	ASYNC	1996	DBLP DOI BibTeX RDF	software testing, random testing, Partition testing, subdomain testing
6	James F. Leathrum, K. A. Liburdy	A formal approach to requirements based testing in open systems standards. (PDF / PS)	ICRE	1996	DBLP DOI BibTeX RDF	requirements based testing, IEEE POSIX arena, open systems standards, full scale conformance test suite development, executable tests, Clemson Automated Testing System, design taxonomy, IEEE Std 10035-The Ada Language Binding to POSIX, formal specification, testing, systems analysis, open systems, conformance testing, IEEE standards, software standards, automatic translation, test requirements, formal approach
6	Tsong Yueh Chen, Yuen-Tak Yu	On Some Characterisation Problems of Subdomain Testing.	Ada-Europe	1996	DBLP DOI BibTeX RDF	testing of software systems, software engineering, software testing, Software quality, random testing, partition testing
6	Wei-Kang Huang, Fabrizio Lombardi	An approach for testing programmable/configurable field programmable gate arrays.	VTS	1996	DBLP DOI BibTeX RDF	behavioral characterization, single fault detection, disjoint one-dimensional arrays, unilateral horizontal connections, common vertical input lines, array testing, logic blocks, field programmable gate arrays, field programmable gate arrays, VLSI, logic testing, integrated circuit testing, stuck-at fault, FPGA testing, functional fault, hybrid fault model
6	Hari Balachandran, D. M. H. Walker	Improvement of SRAM-based failure analysis using calibrated Iddq testing.	VTS	1996	DBLP DOI BibTeX RDF	defect-bitmap dictionary, voltage testing, microprocessor cache memory, integrated circuit testing, calibration, calibration, SRAM, cache storage, failure analysis, failure analysis, IDDQ testing, current testing, defect classification, SRAM chips, integrated circuit yield, integrated circuit yield
6	Subhrajit Bhattacharya, Sujit Dey	H-SCAN: A high level alternative to full-scan testing with reduced area and test application overheads.	VTS	1996	DBLP DOI BibTeX RDF	H-SCAN, parallel register connectivity, on-chip response, sequential test vectors, combinational test vectors, combinational ATPG program, RT-level design, integrated circuit testing, design for testability, automatic testing, fault simulation, fault coverage, test pattern generation, comparator, boundary scan testing, test application time, high-level design, area overhead, testing methodology
6	S. Cremoux, Christophe Fagot, Patrick Girard, Christian Landrault, Serge Pravossoudovitch	A new test pattern generation method for delay fault testing.	VTS	1996	DBLP DOI BibTeX RDF	test pattern generation method, directed random generation technique, random test vectors, test sequence length, delay fault coverage, learning (artificial intelligence), VLSI, logic testing, delays, built-in self test, integrated circuit testing, BIST, automatic testing, delay fault testing, digital integrated circuits, learning tool, high speed circuits
6	Terry Lee, Ibrahim N. Hajj, Elizabeth M. Rudnick, Janak H. Patel	Genetic-algorithm-based test generation for current testing of bridging faults in CMOS VLSI circuits.	VTS	1996	DBLP DOI BibTeX RDF	GA-based test generators, CMOS VLSI circuits, I/sub DDQ/ current testing, CMOS digital circuits, two-line bridging fault set, compact test set generation, genetic algorithms, VLSI, logic testing, integrated circuit testing, ATPG, automatic test pattern generator, automatic testing, fault location, bridging faults, CMOS digital integrated circuits, adaptive genetic algorithm
6	Janusz Sosnowski, A. Kusmierczyk	Pseudorandom versus Deterministic Testing of Intel 80x86 Processors.	EUROMICRO	1996	DBLP DOI BibTeX RDF	Intel 80/spl times/86 processors, computer testing, pseudorandom testing, microprocessor testing, deterministic testing
6	Karim Arabi, Bozena Kaminska	Oscillation-test strategy for analog and mixed-signal integrated circuits.	VTS	1996	DBLP DOI BibTeX RDF	circuit oscillations, oscillation test strategy, analog ICs, low-cost test method, oscillation frequency deviation, wafer-probe testing, final production testing, ASIC testing, integrated circuit testing, operational amplifiers, analogue integrated circuits, mixed analogue-digital integrated circuits, production testing, analogue-digital conversion, mixed-signal ICs
6	Charles E. Stroud, Srinivasa Konala, Ping Chen, Miron Abramovici	Built-in self-test of logic blocks in FPGAs (Finally, a free lunch: BIST without overhead!).	VTS	1996	DBLP DOI BibTeX RDF	BIST architecture, programmable logic blocks, field programmable gate arrays, VLSI, logic testing, built-in self test, built-in self-test, integrated circuit testing, automatic testing, FPGA testing, field programmable gate array testing
6	Tsong Yueh Chen, Hing Leung, Yuen-Tak Yu	On the Analysis of Subdomain Testing Strategies.	APSEC	1995	DBLP DOI BibTeX RDF	software testing, random testing, Partition testing, subdomain testing
6	Ajay Khoche, Erik Brunvand	A partial scan methodology for testing self-timed circuits.	VTS	1995	DBLP DOI BibTeX RDF	partial scan methodology, control section testing, macromodule based circuits, sequential network, logic testing, integrated circuit testing, design for testability, logic design, asynchronous circuits, fault coverage, stuck-at faults, integrated logic circuits, boundary scan testing, self-timed circuits
6	O. A. Petlin, Stephen B. Furber	Scan testing of micropipelines.	VTS	1995	DBLP DOI BibTeX RDF	asynchronous VLSI circuit design, AMULET1 microprocessor, scan test technique, data processing blocks, combinational processing logic, state holding elements, test generation techniques, VLSI, logic testing, delays, integrated circuit testing, design for testability, logic design, asynchronous circuits, fault location, integrated circuit design, microprocessor chips, delay faults, boundary scan testing, computer testing, test patterns, single stuck-at faults, micropipelines
6	Jeffrey A. Floyd, Matt Perry	Real-time on-board bus testing.	VTS	1995	DBLP DOI BibTeX RDF	on-board bus testing, wide buses, computer buses, board layout, full-fault testing, multiple speeds, pseudo-random pattern generation, characteristic equations, IEEE JTAG protocol, real-time systems, protocols, logic testing, automatic testing, system buses, operating environments, multiple seed, clock speeds
6	Sitaran Yadavalli, Irith Pomeranz, Sudhakar M. Reddy	MUSTC-Testing: Multi-Stage-Combinational Test scheduling at the Register-Transfer Level.	VLSI Design	1995	DBLP DOI BibTeX RDF	MUSTC-testing, multi-stage-combinational test, control paths, signal types, module level pre-computed test sets, scheduling, logic testing, integrated circuit testing, combinational circuits, automatic testing, automatic test, register-transfer level, test scheduling, data-paths
6	Rajiv Gupta, Mary Lou Soffa	Priority based data flow testing. (PDF / PS)	ICSM	1995	DBLP DOI BibTeX RDF	priority based data flow testing, def-use pairs, program change, software testing, software maintenance, software maintenance, software development, statistical analysis, program testing, regression testing, data flow analysis, error, test case generation, program diagnostics
6	Khalil Abdullah, James E. Kimble Jr., Lee J. White	Correcting for unreliable regression integration testing. (PDF / PS)	ICSM	1995	DBLP DOI BibTeX RDF	unreliable regression integration testing, firewall concept, error cases, firewall construction, software maintenance, statistical analysis, program testing, unit testing, control flow, integration testing
6	Meng-Lieh Sheu, Chung-Len Lee	A programmable multiple-sequence generator for BIST applications.	Asian Test Symposium	1995	DBLP DOI BibTeX RDF	programmable multiple-sequence generator, BIST applications, two-dimension-like feedback shift register, deterministic sequence, pseudo-random vectors, sequence segmentation method, stuck-open fault testing, logic testing, delays, built-in self test, sequential circuits, shift registers, delay fault testing, binary sequences, sequential circuit testing, regular structure, MCM testing
6	Tomoo Inoue, Hironori Maeda, Hideo Fujiwara	A scheduling problem in test generation.	VTS	1995	DBLP DOI BibTeX RDF	test generation schedule, testing cost, dominating probability, ISCAS'85 benchmark circuits, combinational logic circuit testing, scheduling, logic testing, probability, integrated circuit testing, combinational circuits, automatic testing, test-pattern generation, processing time, scheduling problem
6	Samvel K. Shoukourian, Armen G. Kostanian, Valery A. Margarian, Ayman A. Ashour	An approach for system tests design and its application.	VTS	1995	DBLP DOI BibTeX RDF	system test design, control testing table, testing processor, correctness problem, polynomial complexity algorithm, software system design, microcode synthesis, CAD system testing, performance evaluation, performance evaluation, program testing, mathematical model, multicomputer systems, computer testing, multi-user systems
6	Tsong Yueh Chen, Yuen-Tak Yu	On the Relationship Between Partition and Random Testing.	IEEE Trans. Software Eng.	1994	DBLP DOI BibTeX RDF	subdomain size, performance, software testing, program testing, random testing, software performance evaluation, test cases, random processes, partition testing, worst case, fault-detecting ability
6	Markos Z. Tsoukalas, Joe W. Duran, Simeon C. Ntafos	On Some Reliability Estimation Problems in Random and Partition Testing.	IEEE Trans. Software Eng.	1993	DBLP DOI BibTeX RDF	effective testing strategy, test outcomes, Thayer-Lipow-Nelson reliability model, upper confidence bounds, cost weighted performance, software reliability, program testing, random testing, partition testing
6	Elaine J. Weyuker	More Experience with Data Flow Testing.	IEEE Trans. Software Eng.	1993	DBLP DOI BibTeX RDF	Rapps-Weyuker data flow testing criteria, tester variability, cost assessment, data adequacy, software testing, fault detection, program testing, software cost estimation, data flow testing, numerical programs
6	Phyllis G. Frankl, Stewart N. Weiss	An Experimental Comparison of the Effectiveness of Branch Testing and Data Flow Testing.	IEEE Trans. Software Eng.	1993	DBLP DOI BibTeX RDF	error exposing ability, all-edges test data adequacy criteria, software testing experiments, executable edges, definition-use associations, all-uses adequate test sets, program testing, errors, regression analysis, data flow testing, branch testing
6	Wojciech Maly, Marek J. Patyra	Design of ICs applying built-in current testing.	J. Electronic Testing	1992	DBLP DOI BibTeX RDF	BIC-testing, Built-in testing, current testing
6	Gregor von Bochmann, Rachida Dssouli, J. R. Zhao	Trace Analysis for Conformance and Arbitration Testing.	IEEE Trans. Software Eng.	1989	DBLP DOI BibTeX RDF	arbitration testing, implementation under test, IUT, communication protocol implementations, distributed test architectures, partial input/output traces, local observers, error-detection power, global knowledge, automated construction, trace analysis modules, reference specification, open systems interconnection, formal specification, protocols, transport protocol, program testing, open systems, conformance testing, conformance testing, OSI
6	Carlos Urias Munoz	An Approach to Software Product Testing.	IEEE Trans. Software Eng.	1988	DBLP DOI BibTeX RDF	software product testing, self-checking test cases, black box test cases, random test cases, correctness measurements, defect circumvention, sampling, program testing, program testing, automatic test case generation, exhaustive testing
5	Xuan-Lun Huang, Ping-Ying Kang, Jiun-Lang Huang, Yung-Fa Chou, Yung-Pin Lee, Ding-Ming Kwai	A Pre- and Post-bond Self-Testing and Calibration Methodology for SAR ADC Array in 3-D CMOS Imager.	European Test Symposium	2011	DBLP DOI BibTeX RDF	3-D IC testing, calibration-oriented testing, pre-, post-bond testing, SAR ADC, mixed-signal testing
5	Mark Harman, Phil McMinn	A Theoretical and Empirical Study of Search-Based Testing: Local, Global, and Hybrid Search.	IEEE Trans. Software Eng.	2010	DBLP DOI BibTeX RDF	Royal Road, control methods and search, Genetic Algorithms, performance, algorithms, artificial intelligence, measurement, theory, experimentation, problem solving, testing tools, Hill Climbing, testing and debugging, Evolutionary Testing, heuristic methods, search-based software engineering, schema theory, Automated test data generation, search-based testing
5	Adnan Causevic, Daniel Sundmark, Sasikumar Punnekkat	An Industrial Survey on Contemporary Aspects of Software Testing.	ICST	2010	DBLP DOI BibTeX RDF	testing practices, agile testing, Software testing
5	Nikolai Tillmann, Jonathan de Halleux, Tao Xie	Parameterized unit testing: theory and practice.	ICSE	2010	DBLP DOI BibTeX RDF	Pex, parameterized unit testing, testing, theories, unit testing, symbolic execution, mock objects
5	Bernhard K. Aichernig, Jifeng He	Mutation testing in UTP.	Formal Asp. Comput.	2009	DBLP DOI BibTeX RDF	Unifying theories of programming, Algebra of programming, Specification-based testing, Mutation testing, Refinement calculus, Fault-based testing
5	Christian Murphy, Kuang Shen, Gail E. Kaiser	Automatic system testing of programs without test oracles.	ISSTA	2009	DBLP DOI BibTeX RDF	software testing, metamorphic testing, oracle problem
5	Jose Pablo Escobedo, Christophe Gaston, Pascale Le Gall, Ana R. Cavalli	Observability and Controllability Issues in Conformance Testing of Web Service Compositions.	TestCom/FATES	2009	DBLP DOI BibTeX RDF	observability and controllability, verdict testing report, Web Service composition, Conformance testing
5	Simi (Kamini) Bajaj, Shyamala Balram	Incorporating Software Testing as a Discipline in Curriculum of Computing Courses.	UNISCON	2009	DBLP DOI BibTeX RDF	Software testing education, testing training, Software Testing, Test management
5	Raul Garcia	Case study: experiences on SQL language fuzz testing.	DBTest	2009	DBLP DOI BibTeX RDF	fuzz testing, security, testing, SQL, case study, SQL server