Search results for "yield prediction"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
3	Qing Su, Charles Chiang, Jamil Kawa	Hotspot Based Yield Prediction with Consideration of Correlations.	ISQED	2008	DBLP DOI BibTeX RDF	Systematic Yield, DFM (design for manufacturing), correlation, Yield, Hotspot, Yield Prediction
3	Jochen A. G. Jess, K. Kalafala, Srinath R. Naidu, Ralph H. J. M. Otten, Chandramouli Visweswariah	Statistical timing for parametric yield prediction of digital integrated circuits.	DAC	2003	DBLP DOI BibTeX RDF	statistical timing, yield prediction
3	Chaochang Chiu, Jih-Tay Hsu, Chih-Yung Lin	The Application of Genetic Programming in Milk Yield Prediction for Dairy Cows.	Rough Sets and Current Trends in Computing	2000	DBLP DOI BibTeX RDF	dynamic mutation, milk yield prediction, Genetic programming
2	Michal Wegiel, Chandra Krintz	Dynamic prediction of collection yield for managed runtimes.	ASPLOS	2009	DBLP DOI BibTeX RDF	reference bits, clustering, parallel, concurrent, operating system, garbage collection, yield prediction
2	Jin Sun, Jun Li, Dongsheng Ma, Janet Meiling Wang	Chebyshev Affine-Arithmetic-Based Parametric Yield Prediction Under Limited Descriptions of Uncertainty.	IEEE Trans. on CAD of Integrated Circuits and Systems	2008	DBLP DOI BibTeX RDF
2	Georg Ruß, Rudolf Kruse, Martin Schneider, Peter Wagner	Estimation of Neural Network Parameters for Wheat Yield Prediction.	IFIP AI	2008	DBLP DOI BibTeX RDF
2	Jin Sun, Yue Huang, Jun Li, Janet Meiling Wang	Chebyshev Affine Arithmetic based parametric yield prediction under limited descriptions of uncertainty.	ASP-DAC	2008	DBLP DOI BibTeX RDF
2	Rajeev R. Rao, Anirudh Devgan, David Blaauw, Dennis Sylvester	Analytical yield prediction considering leakage/performance correlation.	IEEE Trans. on CAD of Integrated Circuits and Systems	2006	DBLP DOI BibTeX RDF
2	Jochen A. G. Jess, K. Kalafala, Srinath R. Naidu, Ralph H. J. M. Otten, Chandramouli Visweswariah	Statistical Timing for Parametric Yield Prediction of Digital Integrated Circuits.	IEEE Trans. on CAD of Integrated Circuits and Systems	2006	DBLP DOI BibTeX RDF
2	Alberto Fazzi, L. Magagni, Mario de Dominicis, Paolo Zoffoli, Roberto Canegallo, Pier Luigi Rolandi, Alberto L. Sangiovanni-Vincentelli, Roberto Guerrieri	Yield prediction for 3D capacitive interconnections.	ICCAD	2006	DBLP DOI BibTeX RDF
2	Animesh Datta, Saibal Mukhopadhyay, Swarup Bhunia, Kaushik Roy	Yield Prediction of High Performance Pipelined Circuit with Respect to Delay Failures in Sub-100nm Technology.	IOLTS	2005	DBLP DOI BibTeX RDF
2	Gerard A. Allan	Yield prediction by sampling IC layout.	IEEE Trans. on CAD of Integrated Circuits and Systems	2000	DBLP DOI BibTeX RDF
1	Tao Yuan, Saleem Z. Ramadan, Suk Joo Bae	Yield Prediction for Integrated Circuits Manufacturing Through Hierarchical Bayesian Modeling of Spatial Defects.	IEEE Transactions on Reliability	2011	DBLP DOI BibTeX RDF
1	Mohamed H. Abu-Rahma, Ying Chen, Wing Sy, Wee Ling Ong, Leon Yeow Ting, Sei Seung Yoon, Michael Han, Esin Terzioglu	Characterization of SRAM sense amplifier input offset for yield prediction in 28nm CMOS.	CICC	2011	DBLP DOI BibTeX RDF
1	Xin Pan, Helmut Graeb	Reliability analysis of analog circuits by lifetime yield prediction using worst-case distance degradation rate.	ISQED	2010	DBLP DOI BibTeX RDF
1	Tishampati Dhar, Carl Menges, Doug Gray, John Douglas, Leighton Wilksch	Supporting precision agriculture with dual-polarimetric TerraSAR-X - yield prediction and identification of in-field variations to generate fertilizer prescription maps.	IGARSS	2010	DBLP DOI BibTeX RDF
1	Georg Ruß, Alexander Brenning	Spatial Variable Importance Assessment for Yield Prediction in Precision Agriculture.	IDA	2010	DBLP DOI BibTeX RDF
1	Paul Zuber, Petr Dobrovolný, Miguel Miranda	A holistic approach for statistical SRAM analysis.	DAC	2010	DBLP DOI BibTeX RDF	statistical SRAM analysis, process variability, yield prediction
1	Georg Ruß, Rudolf Kruse	Feature Selection for Wheat Yield Prediction.	SGAI Conf.	2009	DBLP DOI BibTeX RDF
1	Jianqiang Ren, Zhongxin Chen, Xiaomei Yang, Xingren Liu, Qingbo Zhou	Regional Yield Prediction of Winter Wheat based on Retrieval of Leaf Area Index by Remote Sensing Technology.	IGARSS	2009	DBLP DOI BibTeX RDF
1	Tishampati Dhar, Doug Gray, Carl Menges	Multiple Crop Yield Prediction using Dual-polarimetric TerraSAR-X Stripmap Imagery.	IGARSS	2009	DBLP DOI BibTeX RDF
1	Lihui Wu, Jie Zhang, Gong Zhang	A Fuzzy Neural Network Approach for Die Yield Prediction of Wafer Fabrication Line.	FSKD	2009	DBLP DOI BibTeX RDF
1	Rani S. Ghaida, Payman Zarkesh-Ha	A Layout Sensitivity Model for Estimating Electromigration-vulnerable Narrow Interconnects.	J. Electronic Testing	2009	DBLP DOI BibTeX RDF	Layout sensitivity, Narrow defects, Electromigration, Critical area, Yield prediction, Yield modeling, Spot defects
1	Georg Ruß	Data Mining of Agricultural Yield Data: A Comparison of Regression Models.	ICDM	2009	DBLP DOI BibTeX RDF	Data Mining, Modeling, Regression, Precision Agriculture
1	Sridhar Varadan, Janet Meiling Wang, Jiang Hu	Handling partial correlations in yield prediction.	ASP-DAC	2008	DBLP DOI BibTeX RDF
1	Georg Ruß, Rudolf Kruse, Martin Schneider, Peter Wagner	Data Mining with Neural Networks for Wheat Yield Prediction.	ICDM	2008	DBLP DOI BibTeX RDF	Data Mining, Neural Networks, Prediction, Precision Agriculture
1	Sawal Ali, Reuben Wilcock, Peter R. Wilson, Andrew D. Brown	A New Approach for Combining Yield and Performance in Behavioural Models for Analogue Integrated Circuits.	DATE	2008	DBLP DOI BibTeX RDF
1	Kiri L. Wagstaff, Terran Lane, Alex Roper	Multiple-Instance Regression with Structured Data.	ICDM Workshops	2008	DBLP DOI BibTeX RDF
1	Jianqiang Ren, Su Li, Zhongxin Chen, Qingbo Zhou, Huajun Tang	Regional yield prediction for winter wheat based on crop biomass estimation using multi-source data.	IGARSS	2007	DBLP DOI BibTeX RDF
1	Gang Pan, Feng-Min Li, Guo-Jun Sun	Digital camera based measurement of crop cover for wheat yield prediction.	IGARSS	2007	DBLP DOI BibTeX RDF
1	Chuan Jin, Qiming Qin, Lin Zhu, Peng Nan, Abduwasit Ghulam	TVDI based crop yield prediction model for stressed surfaces.	IGARSS	2007	DBLP DOI BibTeX RDF
1	M. Balakrishnan, N. Ravisankar, K. Meena, R. Elanchezhian, S. K. Zamir Ahmed	Yield Prediction Through Feed Forward Neural Network Approach for Direct Seeded Rice (Oryza sativa) in Bay Islands.	IICAI	2007	DBLP BibTeX RDF
1	Héctor F. Satizábal, Daniel R. Jiménez R., Andrés Pérez-Uribe	Consequences of Data Uncertainty and Data Precision in Artificial Neural Network Sugar Cane Yield Prediction.	IWANN	2007	DBLP DOI BibTeX RDF
1	C. Fernández, Emilio Soria-Olivas, P. Sánchez-Seiquer, Luis Gómez-Chova, Rafael Magdalena, José David Martín-Guerrero, M. J. Navarro, Antonio J. Serrano-López	Weekly milk prediction on dairy goats using neural networks.	Neural Computing and Applications	2007	DBLP DOI BibTeX RDF	Dairy goat, Milk yield prediction, Neural network
1	Evanthia Papadopoulou	Higher Order Voronoi Diagrams of Segments for VLSI Critical Area Extraction.	ISAAC	2007	DBLP DOI BibTeX RDF
1	Francesco Centurelli, Luca Giancane, Mauro Olivieri, Giuseppe Scotti, Alessandro Trifiletti	A Statistical Model of Logic Gates for Monte Carlo Simulation Including On-Chip Variations.	PATMOS	2007	DBLP DOI BibTeX RDF
1	A. Majid Awan, Mohd. Noor Md. Sap	An Intelligent System Based on Kernel Methods for Crop Yield Prediction.	PAKDD	2006	DBLP DOI BibTeX RDF
1	Antonis Papanikolaou, T. Grabner, Miguel Miranda, Philippe Roussel, Francky Catthoor	Yield prediction for architecture exploration in nanometer technology nodes: : a model and case study for memory organizations.	CODES+ISSS	2006	DBLP DOI BibTeX RDF	system exploration, process variability, parametric yield
1	Rouwaida Kanj, Rajiv V. Joshi, Sani R. Nassif	Mixture importance sampling and its application to the analysis of SRAM designs in the presence of rare failure events.	DAC	2006	DBLP DOI BibTeX RDF	statistical performance analysis, SRAM, yield prediction
1	Nicola Campregher, Peter Y. K. Cheung, George A. Constantinides, Milan Vasilko	Yield enhancements of design-specific FPGAs.	FPGA	2006	DBLP DOI BibTeX RDF	design-specific FPGA, interconnect faults, interconnect utilization, yield enhancement, yield prediction, structured ASIC, FPGA interconnect
1	Akhil Garg, Prashant Dubey	Fuse Area Reduction based on Quantitative Yield Analysis and Effective Chip Cost.	DFT	2006	DBLP DOI BibTeX RDF	Compression and Yield, Memory, Repair, Fuse
1	Nicola Campregher, Peter Y. K. Cheung, George A. Constantinides, Milan Vasilko	Analysis of yield loss due to random photolithographic defects in the interconnect structure of FPGAs.	FPGA	2005	DBLP DOI BibTeX RDF	FPGA redundancy, interconnect faults, fault tolerance, yield enhancement, interconnect model, yield prediction, catastrophic faults, FPGA interconnect
1	Rajeev R. Rao, David Blaauw, Dennis Sylvester, Anirudh Devgan	Modeling and Analysis of Parametric Yield under Power and Performance Constraints.	IEEE Design & Test of Computers	2005	DBLP DOI BibTeX RDF	G.4.g Reliability and robustness, B.7 Integrated Circuits, Fault-Tolerance
1	Saibal Mukhopadhyay, Hamid Mahmoodi-Meimand, Kaushik Roy	Modeling of failure probability and statistical design of SRAM array for yield enhancement in nanoscaled CMOS.	IEEE Trans. on CAD of Integrated Circuits and Systems	2005	DBLP DOI BibTeX RDF
1	Tae-Seon Kim	Chip Speed Prediction Model for Optimization of Semiconductor Manufacturing Process Using Neural Networks and Statistical Methods.	ISNN	2005	DBLP DOI BibTeX RDF
1	Evanthia Papadopoulou	The Hausdorff Voronoi Diagram of Point Clusters in the Plane.	Algorithmica	2004	DBLP DOI BibTeX RDF	VLSI yield prediction, VLSI Critical Area, Via-blocks, Voronoi diagram, Hausdorff distance, Plane sweep, Manufacturing defects
1	Rajeev R. Rao, Anirudh Devgan, David Blaauw, Dennis Sylvester	Parametric yield estimation considering leakage variability.	DAC	2004	DBLP DOI BibTeX RDF	variability, leakage, parametric yield
1	Payman Zarkesh-Ha, Ken Doniger, William Loh, Peter Bendix	Prediction of interconnect adjacency distribution: derivation, validation, and applications.	SLIP	2004	DBLP DOI BibTeX RDF	interconnect adjacency, interconnect pattern density, prediction, stochastic model, probability density function
1	Yu-Tsao Hsing, Chih-Wea Wang, Ching-Wei Wu, Chih-Tsun Huang, Cheng-Wen Wu	Failure Factor Based Yield Enhancement for SRAM Designs.	DFT	2004	DBLP DOI BibTeX RDF
1	Vassilis G. Kaburlasos	FINs: lattice theoretic tools for improving prediction of sugar production from populations of measurements.	IEEE Transactions on Systems, Man, and Cybernetics, Part B	2004	DBLP DOI BibTeX RDF
1	David B. Lobell, Gregory Asner	Comparison of Earth Observing-1 ALI and Landsat ETM+ for crop identification and yield prediction in Mexico.	IEEE T. Geoscience and Remote Sensing	2003	DBLP DOI BibTeX RDF
1	Phillip Christie, José Pineda de Gyvez	Prelayout interconnect yield prediction.	IEEE Trans. VLSI Syst.	2003	DBLP DOI BibTeX RDF
1	Chandu Visweswariah	Death, taxes and failing chips.	DAC	2003	DBLP DOI BibTeX RDF	parametric yield prediction, design methodology, Statistical timing
1	Juin J. Liou, Qiang Zhang, John McMacken, J. Ross Thomson, Kevin Stiles, Paul Layman	Statistical modeling of MOS devices for parametric yield prediction.	Microelectronics Reliability	2002	DBLP DOI BibTeX RDF
1	Evanthia Papadopoulou	Critical area computation for missing material defects in VLSIcircuits.	IEEE Trans. on CAD of Integrated Circuits and Systems	2001	DBLP DOI BibTeX RDF
1	Hans G. Kerkhoff, Hans P. A. Hendriks	Fault Modeling and Fault Simulation in Mixed Micro-Fluidic Microelectronic Systems.	J. Electronic Testing	2001	DBLP DOI BibTeX RDF	microsystem testing, analogue fault modeling, analogue fault simulation, fluidic FEM simulation, defect-oriented testing
1	L. Ludwig, Elena P. Sapozhnikova, V. P. Lunin, Wolfgang Rosenstiel	Error Classification and Yield Prediction of Chips in Semiconductor Industry Applications.	Neural Computing and Applications	2000	DBLP DOI BibTeX RDF
1	Kees Veelenturf	The Road to Better Reliability and Yield Embedded DfM Tools.	DATE	2000	DBLP DOI BibTeX RDF	wire spreading, yield prediction, yield improvement, DfM
1	Xiaohong Jiang, Susumu Horiguchi, Yue Hao	Predicting the Yield Efficacy of a Defect-Tolerant Embedded Core. (PDF / PS)	DFT	2000	DBLP DOI BibTeX RDF
1	Stuart L. Riley	Limitations to Estimating Yield Based on In-Line Defect Measurements. (PDF / PS)	DFT	1999	DBLP DOI BibTeX RDF	Defect-limited yield, Yield estimation, In-line defect measurements, Kill ratio estimation, Defect review sampling, Defect classification, Yield prediction
1	Evanthia Papadopoulou, D. T. Lee	Critical area computation via Voronoi diagrams.	IEEE Trans. on CAD of Integrated Circuits and Systems	1999	DBLP DOI BibTeX RDF
1	Evanthia Papadopoulou, D. T. Lee	Critical area computation - a new approach.	ISPD	1998	DBLP DOI BibTeX RDF
1	Gerard A. Allan	A Comparison of Efficient Dot Throwing and Shape Shifting Extra Material Critical Area Estimation. (PDF / PS)	DFT	1998	DBLP DOI BibTeX RDF
1	Evanthia Papadopoulou	Linfinity Voronoi Diagrams and Applications to VLSI Layout and Manufacturing.	ISAAC	1998	DBLP DOI BibTeX RDF
1	Sang-Hoon Lee, Chang-hoon Choi, Jeong-Taek Kong, Wong-Seong Lee, Jei-Hwan Yoo	An efficient statistical analysis methodology and its application to high-density DRAMs.	ICCAD	1997	DBLP DOI BibTeX RDF	statistical SPICE modeling, High-Density DRAMs, Principal Component Analysis, Design for Manufacturing, Gradient Method
1	Anil Gandhi, Stacy Hall, Ron Harris	An examination of empirically derived within-die local probabilities of failure. (PDF / PS)	DFT	1997	DBLP DOI BibTeX RDF	empirically derived within-die local probabilities, circuit densities, yield sensitivity, in-line defect inspection equipment, back-end sort data, model free approach, defect review sampling, failure, failure analysis
1	Yung-Yuan Chen, Ching-Hwa Cheng, Yung-Ci Chou	An Effective Reconfiguration Process for Fault-Tolerant VLSI/WSI Array Processors.	EDCC	1994	DBLP DOI BibTeX RDF
1	Adit D. Singh, C. Mani Krishna	On optimizing VLSI testing for product quality using die-yield prediction.	IEEE Trans. on CAD of Integrated Circuits and Systems	1993	DBLP DOI BibTeX RDF
1	Adit D. Singh, C. Mani Krishna	On Optimizing Wafer-Probe Testing for Product Quality Using Die-Yield Prediction.	ITC	1991	DBLP DOI BibTeX RDF
1	Wojciech Maly, Andrzej J. Strojwas, Stephen W. Director	VLSI Yield Prediction and Estimation: A Unified Framework.	IEEE Trans. on CAD of Integrated Circuits and Systems	1986	DBLP DOI BibTeX RDF