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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/asplos/YoonE10>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Doe_Hyun_Yoon>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Mattan_Erez>
foaf:homepage <http://doi.acm.org/10.1145/1736020.1736064>
foaf:homepage <http://dx.doi.org/10.1145%2F1736020.1736064>
dc:identifier DBLP conf/asplos/YoonE10 (xsd:string)
dc:identifier DOI 10.1145%2F1736020.1736064 (xsd:string)
dcterms:issued 2010 (xsd:gYear)
rdfs:label Virtualized and flexible ECC for main memory. (xsd:string)
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Doe_Hyun_Yoon>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Mattan_Erez>
swrc:pages 397-408 (xsd:string)
dcterms:partOf <http://dblp.l3s.de/d2r/resource/publications/conf/asplos/2010>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/asplos/YoonE10/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/asplos/YoonE10>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/asplos/asplos2010.html#YoonE10>
rdfs:seeAlso <http://doi.acm.org/10.1145/1736020.1736064>
swrc:series <http://dblp.l3s.de/d2r/resource/conferences/asplos>
dc:subject error correction, fault tolerance, memory systems, reliability (xsd:string)
dc:title Virtualized and flexible ECC for main memory. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document