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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/dft/KhanHHC11>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Francky_Catthoor>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Nor_Zaidi_Haron>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Said_Hamdioui>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Seyab_Khan>
foaf:homepage <http://doi.ieeecomputersociety.org/10.1109/DFT.2011.49>
foaf:homepage <http://dx.doi.org/10.1109%2FDFT.2011.49>
dc:identifier DBLP conf/dft/KhanHHC11 (xsd:string)
dc:identifier DOI 10.1109%2FDFT.2011.49 (xsd:string)
dcterms:issued 2011 (xsd:gYear)
rdfs:label NBTI Monitoring and Design for Reliability in Nanoscale Circuits. (xsd:string)
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Francky_Catthoor>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Nor_Zaidi_Haron>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Said_Hamdioui>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Seyab_Khan>
swrc:pages 68-76 (xsd:string)
dcterms:partOf <http://dblp.l3s.de/d2r/resource/publications/conf/dft/2011>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/dft/KhanHHC11/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/dft/KhanHHC11>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/dft/dft2011.html#KhanHHC11>
rdfs:seeAlso <http://doi.ieeecomputersociety.org/10.1109/DFT.2011.49>
swrc:series <http://dblp.l3s.de/d2r/resource/conferences/dft>
dc:title NBTI Monitoring and Design for Reliability in Nanoscale Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document