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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/eurocrypt/RenauldSVKF11>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Denis_Flandre>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Dina_Kamel>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Fran%C3%A7ois-Xavier_Standaert>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Mathieu_Renauld>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Nicolas_Veyrat-Charvillon>
foaf:homepage <http://dx.doi.org/10.1007%2F978-3-642-20465-4%5F8>
foaf:homepage <http://dx.doi.org/10.1007/978-3-642-20465-4_8>
dc:identifier DBLP conf/eurocrypt/RenauldSVKF11 (xsd:string)
dc:identifier DOI 10.1007%2F978-3-642-20465-4%5F8 (xsd:string)
dcterms:issued 2011 (xsd:gYear)
rdfs:label A Formal Study of Power Variability Issues and Side-Channel Attacks for Nanoscale Devices. (xsd:string)
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Denis_Flandre>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Dina_Kamel>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Fran%C3%A7ois-Xavier_Standaert>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Mathieu_Renauld>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Nicolas_Veyrat-Charvillon>
swrc:pages 109-128 (xsd:string)
dcterms:partOf <http://dblp.l3s.de/d2r/resource/publications/conf/eurocrypt/2011>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/eurocrypt/RenauldSVKF11/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/eurocrypt/RenauldSVKF11>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/eurocrypt/eurocrypt2011.html#RenauldSVKF11>
rdfs:seeAlso <http://dx.doi.org/10.1007/978-3-642-20465-4_8>
swrc:series <http://dblp.l3s.de/d2r/resource/conferences/eurocrypt>
dc:title A Formal Study of Power Variability Issues and Side-Channel Attacks for Nanoscale Devices. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document