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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vlsid/PomeranzR10>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Irith_Pomeranz>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Sudhakar_M._Reddy>
foaf:homepage <http://doi.ieeecomputersociety.org/10.1109/VLSI.Design.2010.13>
foaf:homepage <http://dx.doi.org/10.1109%2FVLSI.Design.2010.13>
dc:identifier DBLP conf/vlsid/PomeranzR10 (xsd:string)
dc:identifier DOI 10.1109%2FVLSI.Design.2010.13 (xsd:string)
dcterms:issued 2010 (xsd:gYear)
rdfs:label Output-Dependent Diagnostic Test Generation. (xsd:string)
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Irith_Pomeranz>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Sudhakar_M._Reddy>
swrc:pages 3-8 (xsd:string)
dcterms:partOf <http://dblp.l3s.de/d2r/resource/publications/conf/vlsid/2010>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vlsid/PomeranzR10/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vlsid/PomeranzR10>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vlsid/vlsid2010.html#PomeranzR10>
rdfs:seeAlso <http://doi.ieeecomputersociety.org/10.1109/VLSI.Design.2010.13>
swrc:series <http://dblp.l3s.de/d2r/resource/conferences/vlsid>
dc:subject diagnostic test generation, full-scan circuits, stuck-at faults (xsd:string)
dc:title Output-Dependent Diagnostic Test Generation. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document