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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vts/YangCDRP08>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Fan_Yang>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Irith_Pomeranz>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Narendra_Devta-Prasanna>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Sreejit_Chakravarty>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Sudhakar_M._Reddy>
foaf:homepage <http://doi.ieeecomputersociety.org/10.1109/VTS.2008.13>
foaf:homepage <http://dx.doi.org/10.1109%2FVTS.2008.13>
dc:identifier DBLP conf/vts/YangCDRP08 (xsd:string)
dc:identifier DOI 10.1109%2FVTS.2008.13 (xsd:string)
dcterms:issued 2008 (xsd:gYear)
rdfs:label On the Detectability of Scan Chain Internal Faults — An Industrial Case Study. (xsd:string)
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Fan_Yang>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Irith_Pomeranz>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Narendra_Devta-Prasanna>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Sreejit_Chakravarty>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Sudhakar_M._Reddy>
swrc:pages 79-84 (xsd:string)
dcterms:partOf <http://dblp.l3s.de/d2r/resource/publications/conf/vts/2008>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vts/YangCDRP08/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vts/YangCDRP08>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vts/vts2008.html#YangCDRP08>
rdfs:seeAlso <http://doi.ieeecomputersociety.org/10.1109/VTS.2008.13>
swrc:series <http://dblp.l3s.de/d2r/resource/conferences/vts>
dc:subject Faults in scan cells, stuck-at and stuck-on faults (xsd:string)
dc:title On the Detectability of Scan Chain Internal Faults — An Industrial Case Study. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document