Partial secondary electron-yield NEXAFS spectromicroscopy with an energy-filtered X-PEEM.
Resource URI: http://dblp.l3s.de/d2r/resource/publications/journals/ibmrd/ChristensenHLPU11
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Partial secondary electron-yield NEXAFS spectromicroscopy with an energy-filtered X-PEEM.
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Partial secondary electron-yield NEXAFS spectromicroscopy with an energy-filtered X-PEEM.
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