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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/integration/ShenTMC10>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Ning_Mi>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Ruijing_Shen>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Sheldon_X.-D._Tan>
dc:creator <http://dblp.l3s.de/d2r/resource/authors/Yici_Cai>
foaf:homepage <http://dx.doi.org/10.1016%2Fj.vlsi.2009.09.003>
foaf:homepage <http://dx.doi.org/10.1016/j.vlsi.2009.09.003>
dc:identifier DBLP journals/integration/ShenTMC10 (xsd:string)
dc:identifier DOI 10.1016%2Fj.vlsi.2009.09.003 (xsd:string)
dcterms:issued 2010 (xsd:gYear)
swrc:journal <http://dblp.l3s.de/d2r/resource/journals/integration>
rdfs:label Statistical modeling and analysis of chip-level leakage power by spectral stochastic method. (xsd:string)
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Ning_Mi>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Ruijing_Shen>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Sheldon_X.-D._Tan>
foaf:maker <http://dblp.l3s.de/d2r/resource/authors/Yici_Cai>
swrc:number 1 (xsd:string)
swrc:pages 156-165 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/integration/ShenTMC10/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/integration/ShenTMC10>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/integration/integration43.html#ShenTMC10>
rdfs:seeAlso <http://dx.doi.org/10.1016/j.vlsi.2009.09.003>
dc:title Statistical modeling and analysis of chip-level leakage power by spectral stochastic method. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 43 (xsd:string)